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2SK3637

产品描述Silicon N-channel power MOSFET
产品类别分立半导体    晶体管   
文件大小57KB,共3页
制造商Panasonic(松下)
官网地址http://www.panasonic.co.jp/semicon/e-index.html
下载文档 详细参数 全文预览

2SK3637概述

Silicon N-channel power MOSFET

2SK3637规格参数

参数名称属性值
包装说明FLANGE MOUNT, R-PSFM-T3
针数3
Reach Compliance Codeunknow
ECCN代码EAR99
雪崩能效等级(Eas)2000 mJ
外壳连接ISOLATED
配置SINGLE WITH BUILT-IN DIODE
最小漏源击穿电压200 V
最大漏极电流 (ID)50 A
最大漏源导通电阻0.04 Ω
FET 技术METAL-OXIDE SEMICONDUCTOR
JESD-30 代码R-PSFM-T3
元件数量1
端子数量3
工作模式ENHANCEMENT MODE
封装主体材料PLASTIC/EPOXY
封装形状RECTANGULAR
封装形式FLANGE MOUNT
极性/信道类型N-CHANNEL
最大脉冲漏极电流 (IDM)200 A
认证状态Not Qualified
表面贴装NO
端子形式THROUGH-HOLE
端子位置SINGLE
晶体管应用SWITCHING
晶体管元件材料SILICON
Base Number Matches1

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Power MOSFETs
2SK3637
Silicon N-channel power MOSFET
15.5
±0.5
Unit: mm
φ
3.2
±0.1
3.0
±0.3
For PDP/For high-speed switching
(10.0)
26.5
±0.5
(4.5)
Low on-resistance, low Q
g
High avalanche resistance
(2.0)
(4.0)
2.0
±0.2
1.1
±0.1
0.7
±0.1
5.45
±0.3
10.9
±0.5
Absolute Maximum Ratings
T
C
=
25°C
Parameter
Drain-source surrender voltage
Gate-source surrender voltage
Drain current
Peak drain current
Avalanche energy capability
*
Power
dissipation
T
a
=
25°C
T
ch
T
stg
Channel temperature
Storage temperature
Symbol
V
DSS
V
GSS
I
D
I
DP
EAS
P
D
Rating
200
±30
50
200
2 000
100
3
150
−55
to
+150
°C
°C
Unit
V
3.3
±0.3
A
A
mJ
W
1
2
3
5.5
±0.3
V
18.6
±0.5
(2.0)
Solder Dip
1: Gate
2: Drain
3: Source
TOP-3E-A1 Package
Internal Connection
(2.0)
D
G
S
Note) *: L
=
0.8 mH, I
L
=
50 A, V
DD
=
100 V, 1 pulse, T
a
=
25°C
Electrical Characteristics
T
C
=
25°C
±
3°C
Parameter
Gate-drain surrender voltage
Diode forward voltage
Gate threshold voltage
Drain-source cutoff current
Gate-source cutoff currentt
Drain-source on resistance
Forward transfer admittance
Short-circuit forward transfer capacitance
(Common-source)
Short-circuit output capacitance
(Common-source)
Reverse transfer capacitance
(Common-source)
Turn-on delay time
Rise time
Turn-off delay time
Fall time
Reverse recovery time
Reverse recovery charge
Symbol
V
DSS
V
DSF
V
th
I
DSS
I
GSS
R
DS(on)
Y
fs
C
iss
C
oss
C
rss
t
d(on)
t
r
t
d(off)
t
f
t
rr
Q
rr
L
=
230
µH,
V
DD
=
100 V
I
DR
=
25 A, di /dt
=
100 A/
µs
V
DD
= 100 V, I
D
= 25 A
R
L
= 4
Ω,
V
GS
= 10 V
Conditions
I
D
=
1 mA, V
GS
=
0
I
DR
=
50 A, V
GS
=
0
V
DS
=
25 V, I
D
=
10 mA
V
DS
=
160 V, V
GS
=
0
V
GS
= ±30
V, V
DS
=
0
V
GS
=
10 V, I
D
=
25 A
V
DS
=
25 V, I
D
=
25 A
V
DS
=
25 V, V
GS
=
0, f
=
1 MHz
15
2
Min
200
Typ
Max
−1.5
4
100
±1
Unit
V
V
V
µA
µA
mΩ
S
pF
pF
pF
ns
ns
ns
ns
ns
nC
29
30
4 550
750
75
50
125
390
140
210
820
40
Note) Measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7030 measuring methods for transistors.
Publication date: February 2004
SJG00035AED
22.0
±0.5
(1.2)
Features
(23.4)
1

 
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