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Dear Customer,
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Nexperia.
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- © NXP N.V. (year). All rights reserved or © Koninklijke Philips Electronics N.V. (year). All rights
reserved
Should be replaced with:
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© Nexperia B.V. (year). All rights reserved.
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Team Nexperia
BUK9E1R6-30E
11 September 2012
N-channel TrenchMOS logic level FET
Product data sheet
1. Product profile
1.1 General description
Logic level N-channel MOSFET in a SOT226 package using TrenchMOS technology.
This product has been designed and qualified to AEC Q101 standard for use in high
performance automotive applications.
1.2 Features and benefits
•
AEC Q101 compliant
•
Repetitive Avalanche rated
•
Suitable for thermally demanding environments due to 175 °C rating
•
True Logic level gate with VGS(th) rating of greater than 0.5V at 175 °C
1.3 Applications
•
12 V Automotive systems
•
Motors, lamps and solenoid control
•
Start-Stop micro-hybrid applications
•
Transmission control
•
Ultra high performance power switching
1.4 Quick reference data
Table 1.
Symbol
V
DS
I
D
P
tot
R
DSon
Quick reference data
Parameter
drain-source voltage
drain current
total power dissipation
Conditions
T
j
≥ 25 °C; T
j
≤ 175 °C
V
GS
= 5 V; T
mb
= 25 °C;
Fig. 1
T
mb
= 25 °C;
Fig. 2
V
GS
= 5 V; I
D
= 25 A; T
j
= 25 °C;
Fig. 11
[1]
Min
-
-
-
Typ
-
-
-
Max
30
120
349
Unit
V
A
W
Static characteristics
drain-source on-state
resistance
gate-drain charge
-
1.4
1.6
mΩ
Dynamic characteristics
Q
GD
V
GS
= 5 V; I
D
= 25 A; V
DS
= 24 V;
Fig. 13; Fig. 14
[1]
Continuous current is limited by package.
-
39.2
-
nC
Scan or click this QR code to view the latest information for this product
NXP Semiconductors
BUK9E1R6-30E
N-channel TrenchMOS logic level FET
2. Pinning information
Table 2.
Pin
1
2
3
mb
Pinning information
Symbol Description
G
D
S
D
gate
drain
source
mounting base; connected to
drain
1 2 3
Simplified outline
mb
Graphic symbol
D
G
mbb076
S
I2PAK (SOT226)
3. Ordering information
Table 3.
Ordering information
Package
Name
BUK9E1R6-30E
I2PAK
Description
plastic single-ended package (I2PAK); TO-262
Version
SOT226
Type number
4. Marking
Table 4.
Marking codes
Marking code
BUK9E1R6-30E
Type number
BUK9E1R6-30E
5. Limiting values
Table 5.
Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol
V
DS
V
DGR
V
GS
Parameter
drain-source voltage
drain-gate voltage
gate-source voltage
Conditions
T
j
≥ 25 °C; T
j
≤ 175 °C
R
GS
= 20 kΩ
T
j
≤ 175 °C; Pulsed
T
j
≤ 175 °C; DC
I
D
drain current
T
mb
= 25 °C; V
GS
= 5 V;
Fig. 1
T
mb
= 100 °C; V
GS
= 5 V;
Fig. 1
I
DM
P
tot
BUK9E1R6-30E
Min
-
-
[1][2]
Max
30
30
15
10
120
120
1400
349
Unit
V
V
V
V
A
A
A
W
-15
-10
[3]
[3]
-
-
-
-
peak drain current
total power dissipation
T
mb
= 25 °C; pulsed; t
p
≤ 10 µs;
Fig. 4
T
mb
= 25 °C;
Fig. 2
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© NXP B.V. 2012. All rights reserved
Product data sheet
11 September 2012
2 / 13
NXP Semiconductors
BUK9E1R6-30E
N-channel TrenchMOS logic level FET
Symbol
T
stg
T
j
I
S
I
SM
E
DS(AL)S
Parameter
storage temperature
junction temperature
Conditions
Min
-55
-55
Max
175
175
Unit
°C
°C
Source-drain diode
source current
peak source current
T
mb
= 25 °C
pulsed; t
p
≤ 10 µs; T
mb
= 25 °C
I
D
= 120 A; V
sup
≤ 30 V; R
GS
= 50 Ω;
V
GS
= 5 V; T
j(init)
= 25 °C; unclamped;
Fig. 3
[1]
[2]
[3]
[4]
[5]
360
I
D
(A)
240
[3]
-
-
120
1400
A
A
Avalanche ruggedness
non-repetitive drain-source
avalanche energy
[4][5]
-
1405
mJ
Accumulated pulse duration up to 50 hours delivers zero defect ppm
Significantly longer life times are achieved by lowering T
j
and or V
GS
Continuous current is limited by package.
Single-pulse avalanche rating limited by maximum junction temperature of 175 °C.
Refer to application note AN10273 for further information.
003aai050
120
P
der
(%)
80
03aa16
(1)
120
40
0
0
50
100
150 T
200
mb
(° C)
0
0
50
100
150
T
mb
(°C)
200
Fig. 1.
Continuous drain current as a function of
mounting base temperature
Fig. 2.
Normalized total power dissipation as a
function of mounting base temperature
BUK9E1R6-30E
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2012. All rights reserved
Product data sheet
11 September 2012
3 / 13
NXP Semiconductors
BUK9E1R6-30E
N-channel TrenchMOS logic level FET
10
3
I
AL
(A)
10
2
(1)
003aai051
10
(2)
(3)
1
10
-3
10
-2
10
-1
1
t
AL
(ms)
10
Fig. 3.
Single-pulse and repetitive avalanche rating; avalanche current as a function of avalanche time
10
4
I
D
(A)
10
3
Limit R
DSon
= V
DS
/ I
D
t
p
=10 µ s
100 µ s
003aai037
10
2
10
DC
1
1 ms
10 ms
100 ms
10
-1
10
-1
1
10
10
2
V
DS
(V)
10
3
Fig. 4.
Safe operating area; continuous and peak drain currents as a function of drain-source voltage
6. Thermal characteristics
Table 6.
Symbol
R
th(j-mb)
Thermal characteristics
Parameter
thermal resistance
from junction to
mounting base
thermal resistance
from junction to
ambient
Conditions
Fig. 5
Min
-
Typ
-
Max
0.43
Unit
K/W
R
th(j-a)
vertical in still air
-
65
-
K/W
BUK9E1R6-30E
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2012. All rights reserved
Product data sheet
11 September 2012
4 / 13
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