25AA160A/B, 25LC160A/B
16K SPI Bus Serial EEPROM
Device Selection Table
Part Number
25LC160A
25AA160A
25LC160B
25AA160B
V
CC
Range
2.5-5.5V
1.8-5.5V
2.5-5.5V
1.8-5.5V
Page Size
16 Byte
16 Byte
32 Byte
32 Byte
Temp. Ranges
I,E
I
I,E
I
Packages
P, SN, ST, MS
P, SN, ST, MS
P, SN, ST, MS
P, SN, ST, MS
Features:
•
•
•
•
•
•
•
•
•
Max. clock 10 MHz
Low-power CMOS technology
2048 x 8-bit organization
16 byte page (‘A’ version devices)
32 byte page (‘B’ version devices)
Write cycle time: 5 ms max.
Self-timed erase and write cycles
Block write protection:
- Protect none, 1/4, 1/2 or all of array
Built-in write protection:
- Power-on/off data protection circuitry
- Write enable latch
- Write-protect pin
Sequential read
High reliability:
- Endurance: 1,000,000 erase/write cycles
- Data retention: > 200 years
- ESD protection: > 4000V
Temperature ranges supported:
- Industrial (I):
-40°C to +85°C
- Automotive (E):
-40°C to +125°C
Description:
The Microchip Technology Inc. 25AA160A/B,
25LC160A/B (25XX160A/B
*
) are 16 Kbit Serial
Electrically Erasable PROMs. The memory is accessed
via a simple Serial Peripheral Interface (SPI)
compatible serial bus. The bus signals required are a
clock input (SCK) plus separate data in (SI) and data
out (SO) lines. Access to the device is controlled
through a Chip Select (CS) input.
Communication to the device can be paused via the
hold pin (HOLD). While the device is paused, transi-
tions on its inputs will be ignored, with the exception of
Chip Select, allowing the host to service higher priority
interrupts.
The 25XX160A/B is available in standard Pb-free pack-
ages including 8-lead PDIP and SOIC, and advanced
packaging including 8-lead MSOP, and 8-lead TSSOP.
•
•
Package Types (not to scale)
TSSOP/MSOP
(ST, MS)
CS
SO
WP
V
SS
1
2
3
4
8
7
6
5
V
CC
HOLD
SCK
SI
PDIP/SOIC
(P, SN)
CS
SO
WP
V
SS
1
2
3
4
8
7
6
5
V
CC
HOLD
SCK
SI
•
Pin Function Table
Name
CS
SO
WP
V
SS
SI
SCK
HOLD
V
CC
Function
Chip Select Input
Serial Data Output
Write-Protect
Ground
Serial Data Input
Serial Clock Input
Hold Input
Supply Voltage
*25XX160A/B is used in this document as a generic part
number for the 25AA160A/B, 25LC160A/B devices.
©
2006 Microchip Technology Inc.
DS21807C-page 1
25XX160A/B
1.0
ELECTRICAL CHARACTERISTICS
Absolute Maximum Ratings
(†)
V
CC
.............................................................................................................................................................................7.0V
All inputs and outputs w.r.t. V
SS
......................................................................................................... -0.6V to V
CC
+1.0V
Storage temperature .................................................................................................................................-65°C to 150°C
Ambient temperature under bias ...............................................................................................................-65°C to 125°C
ESD protection on all pins ..........................................................................................................................................4 kV
†
NOTICE: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the
device. This is a stress rating only and functional operation of the device at those or any other conditions above those
indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for an
extended period of time may affect device reliability.
TABLE 1-1:
DC CHARACTERISTICS
Industrial (I):
Automotive (E):
Min.
2.0
0.7 V
CC
-0.3
-0.3
—
—
V
CC
-0.5
—
—
—
T
AMB
= -40°C to +85°C
T
AMB
= -40°C to +125°C
Max.
V
CC
+1
V
CC
+1
0.8
0.2 V
CC
0.4
0.2
—
±1
±1
7
Units
V
V
V
V
V
V
V
μA
μA
pF
V
CC
= 1.8V to 5.5V
V
CC
= 2.5V to 5.5V
Test Conditions
V
CC
≥
2.7V
(Note)
V
CC
< 2.7V
(Note)
V
CC
≥
2.7V
(Note)
V
CC
< 2.7V
(Note)
I
OL
= 2.1 mA
I
OL
= 1.0 mA, V
CC
< 2.5V
I
OH
= -400
μA
CS = V
CC
, V
IN
= V
SS TO
V
CC
CS = V
CC
, V
OUT
= V
SS TO
V
CC
T
AMB
= 25°C, CLK = 1.0 MHz,
V
CC
= 5.0V
(Note)
V
CC
= 5.5V; F
CLK
= 10.0 MHz;
SO = Open
V
CC
= 2.5V; F
CLK
= 5.0 MHz;
SO = Open
V
CC
= 5.5V
CS = V
CC
= 5.5V, Inputs tied to V
CC
or
V
SS
, T
AMB
= -40°C
TO
+125°C
CS = V
CC
= 2.5V, Inputs tied to V
CC
or
V
SS
, T
AMB
= -40°C
TO
+85°C
DC CHARACTERISTICS
Param.
No.
D001
D002
D003
D004
D005
D006
D007
D008
D009
D010
Sym.
V
IH1
V
IH2
V
IL1
V
IL2
V
OL
V
OL
V
OH
I
LI
I
LO
C
INT
Characteristic
High-level input
voltage
Low-level input
voltage
Low-level output
voltage
High-level output
voltage
Input leakage current
Output leakage
current
Internal Capacitance
(all inputs and
outputs)
D011
I
CC
Read
Operating Current
—
—
—
—
Standby Current
—
6
2.5
3
5
1
mA
mA
mA
μA
μA
D012
D013
I
CC
Write
I
CCS
Note:
This parameter is periodically sampled and not 100% tested.
DS21807C-page 2
©
2006 Microchip Technology Inc.
25XX160A/B
TABLE 1-2:
AC CHARACTERISTICS
Industrial (I):
T
AMB
= -40°C to +85°C V
CC
= 1.8V to 5.5V
Automotive (E): T
AMB
= -40°C to +125°C V
CC
= 2.5V to 5.5V
Min.
—
—
—
50
100
150
100
200
250
50
10
20
30
20
40
50
—
—
50
100
150
50
100
150
50
50
—
—
—
0
—
—
—
20
40
80
Max.
10
5
3
—
—
—
—
—
—
—
—
—
—
—
—
—
500
500
—
—
—
—
—
—
—
—
50
100
160
—
40
80
160
—
—
—
Units
MHz
MHz
MHz
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Test Conditions
4.5V
≤
V
CC
≤
5.5V
2.5V
≤
V
CC
<
4.5V
1.8V
≤
V
CC
<
2.5V
4.5V
≤
V
CC
≤
5.5V
2.5V
≤
V
CC
<
4.5V
1.8V
≤
V
CC
<
2.5V
4.5V
≤
V
CC
≤
5.5V
2.5V
≤
V
CC
<
4.5V
1.8V
≤
V
CC
<
2.5V
—
4.5V
≤
V
CC
≤
5.5V
2.5V
≤
V
CC
<
4.5V
1.8V
≤
V
CC
<
2.5V
4.5V
≤
V
CC
≤
5.5V
2.5V
≤
V
CC
<
4.5V
1.8V
≤
V
CC
<
2.5V
(Note 1)
(Note 1)
4.5V
≤
V
CC
≤
5.5V
2.5V
≤
V
CC
<
4.5V
1.8V
≤
V
CC
<
2.5V
4.5V
≤
V
CC
≤
5.5V
2.5V
≤
V
CC
<
4.5V
1.8V
≤
V
CC
<
2.5V
—
—
4.5V
≤
V
CC
≤
5.5V
2.5V
≤
V
CC
<
4.5V
1.8V
≤
V
CC
<
2.5V
(Note 1)
4.5V
≤
V
CC
≤
5.5V
(Note 1)
2.5V
≤
V
CC
≤
4.5V
(Note 1)
1.8V
≤
V
CC
≤
2.5V
(Note 1)
4.5V
≤
V
CC
≤
5.5V
2.5V
≤
V
CC
<
4.5V
1.8V
≤
V
CC
<
2.5V
AC CHARACTERISTICS
Param.
Sym.
No.
1
F
CLK
Characteristic
Clock Frequency
2
T
CSS
CS Setup Time
3
T
CSH
CS Hold Time
4
5
T
CSD
Tsu
CS Disable Time
Data Setup Time
6
T
HD
Data Hold Time
7
8
9
T
R
T
F
T
HI
CLK Rise Time
CLK Fall Time
Clock High Time
10
T
LO
Clock Low Time
11
12
13
T
CLD
T
CLE
T
V
Clock Delay Time
Clock Enable Time
Output Valid from Clock
Low
Output Hold Time
Output Disable Time
14
15
T
HO
T
DIS
16
T
HS
HOLD Setup Time
Note 1:
This parameter is periodically sampled and not 100% tested.
2:
This parameter is not tested but ensured by characterization. For endurance estimates in a specific
application, please consult the Total Endurance™ Model which can be obtained from our web site:
www.microchip.com.
3:
T
WC
begins on the rising edge of CS after a valid write sequence and ends when the internal write cycle
is complete.
©
2006 Microchip Technology Inc.
DS21807C-page 3
25XX160A/B
TABLE 1-2:
AC CHARACTERISTICS (CONTINUED)
Industrial (I):
T
AMB
= -40°C to +85°C V
CC
= 1.8V to 5.5V
Automotive (E): T
AMB
= -40°C to +125°C V
CC
= 2.5V to 5.5V
Min.
20
40
80
30
60
160
30
60
160
—
1M
Max.
—
—
—
—
—
—
—
—
—
5
—
Units
ns
ns
ns
ns
ns
ns
ns
ns
ns
ms
Test Conditions
4.5V
≤
V
CC
≤
5.5V
2.5V
≤
V
CC
<
4.5V
1.8V
≤
V
CC
<
2.5V
4.5V
≤
V
CC
≤
5.5V
(Note 1)
2.5V
≤
V
CC
<
4.5V
(Note 1)
1.8V
≤
V
CC
<
2.5V
(Note 1)
4.5V
≤
V
CC
≤
5.5V
2.5V
≤
V
CC
<
4.5V
1.8V
≤
V
CC
<
2.5V
(N
OTE
3)
AC CHARACTERISTICS
Param.
Sym.
No.
17
T
HH
Characteristic
HOLD Hold Time
18
T
HZ
HOLD Low to Output
High-Z
HOLD High to Output
Valid
Internal Write Cycle Time
Endurance
19
T
HV
20
21
T
WC
—
E/W
(N
OTE
2)
Cycles
Note 1:
This parameter is periodically sampled and not 100% tested.
2:
This parameter is not tested but ensured by characterization. For endurance estimates in a specific
application, please consult the Total Endurance™ Model which can be obtained from our web site:
www.microchip.com.
3:
T
WC
begins on the rising edge of CS after a valid write sequence and ends when the internal write cycle
is complete.
TABLE 1-3:
AC Waveform:
V
LO
= 0.2V
AC TEST CONDITIONS
—
(Note 1)
(Note 2)
0.5 V
CC
0.5 V
CC
V
HI
= V
CC
- 0.2V
V
HI
= 4.0V
Input
Output
Note 1:
For V
CC
≤
4.0V
2:
For V
CC
> 4.0V
Timing Measurement Reference Level
DS21807C-page 4
©
2006 Microchip Technology Inc.
NXP MCU
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