1. Contact rating - Product of the switching voltage and current should never exceed the wattage rating. Contact Littelfuse for additional load/life information.
2. When switching inductive and/or capacitive loads, the effects of transient voltages and/or currents should be considered. Refer to Application Notes AN108A and AN107 for details.
3. Breakdown Voltage - per MIL-STD-202, Method 301.
4. Electrical Load Life Expectancy - Contact Littelfuse with voltage, current values along with type of load.
5. This resistance value is for 11.81mm wire length. Resistance changes when wire lengthens.
6. Operate (including bounce)/Release Time - per EIA/NARM RS-421-A, diode suppressed coil (Coil II).
7. Shock and Vibration - per EIA/NARM RS-421-A and MIL-STD-202.
8. For custom modifications to the wire length or size, or adding a special connector, please contact Littelfuse.
Sensitivity Options (Using 57075 Actuator)
Select Option
Switch Type
S
T
Pull-In AT
Range
U
Activate Distance
mm (inch)
Average
Pull-In AT
Range
V
Activate Distance
mm (inch)
Average
Pull-In AT Activate Distance Pull-In AT Activate Distance
mm (inch)
mm (inch)
Range
Range
Average
Average
1
2
3
4
Normally Open
High Voltage
Change Over
Normally Closed
12-18
--
15-20
15-20
25.0 (.984)
--
23.0 (.906)
23.0 (.906)
17-23
17-23
20-25
20-25
21.0 (.827)
21.0 (.827)
20.0 (.787)
20.0 (.787)
22-28
22-28
25-30
25-30
19.0 (.748)
19.0 (.748)
18.0 (.709)
18.0 (.709)
27-33
27-33
--
--
17.5 (.689)
17.5 (.689)
--
--
Note:
1. Pull-In AT Range: These AT values are the bare reed switch AT before modification.
2. The activation distance is average value on the final sensor assembly.
复杂 IC 不仅吸引了更多系统,而且还吞食着设计者用于建立、评估与校准芯片的测试设备。 芯片设计者正开始在自己的复杂 IC上设计测试与测量仪器。在IC中设计测试仪器的潮流开始于CPU核心与总线的数字调试硬件。现在,设计者也在高速I/O块中建立分析仪器。设计者正在高频芯片的内部作业中集成更复杂的模拟与RF测试仪器,如读取通道IC。 这只是尺度问题。随着系统级 IC 越来越大而复杂...[详细]