Product
Specification
108-2375
24 NOV 14 Rev C
STRADA Mesa* High Speed Mezzanine Press-Fit Differential
Connector System
1.
1.1.
SCOPE
Content
This specification covers performance, tests and quality requirements for the STRADA Mesa* High
Speed Mezzanine Press-Fit Differential Connector System which provides for interconnection of
parallel printed wiring boards. These connectors are available with contact configurations for high-
speed differential pairs, high-density, single-ended signals, or power applications.
1.2.
Qualification
When tests are performed on the subject product line, procedures specified in Figure 1 shall be used.
All inspections shall be performed using the applicable inspection plan and product drawing.
1.3
Qualification Test Results
Successful qualification testing on the subject product line was completed on 07Aug2012.
The Qualification Test Report number for this testing is
501-134006
2.
APPLICABLE DOCUMENTS
The following documents form a part of this specification to the extent specified herein. Unless
otherwise specified, the latest edition of the document applies. In the event of conflict between the
requirements of this specification and the product drawing, the product drawing shall take precedence.
In the event of conflict between the requirements of this specification and the referenced documents,
this specification shall take precedence.
2.1.
TE Connectivity (TE) Documents
●
●
114-13249:
Application Specification (STRADA Mesa* Mezzanine Printed Circuit (PC) Board
Connectors)
501-134006:
Qualification Test Report (STRADA Mesa* High Speed Mezzanine Press-Fit
Differential Connector System)
2.2.
Industry Documents
●
●
EIA-364: Electrical Connector/Socket Test Procedures Including Environmental Classifications
Telcordia GR-1217 (Central Office) Generic Requirements for Separable Electrical Connectors
Used in Telecommunications Hardware (Issue 2 - December 2008)
2.3.
Reference Documents
●
●
108-2385:
Design Objectives (EON Compliant Pin For 0.34 mm Diameter Finished Plated Thru
Holes)
109-197:
Test Specification (TE Test Specifications vs EIA and IEC Test Methods)
© 2014 TE Connectivity family of companies
All Rights Reserved
| Indicates Change
For latest revision and Regional Customer Service, visit our website at www.te.com
PRODUCT INFORMATION 1-800-522-6752
*Trademark. TE Connectivity, TE connectivity (logo), and TE (logo) are trademarks. Other logos, product, and/or company names may be trademarks of their respective owners.
This controlled document is subject to change.
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108-2375
3.
3.1.
3.2.
REQUIREMENTS
Product shall be of the design, construction, materials and physical dimensions specified on the
applicable product drawing
Ratings
●
Voltage: 250 volts AC maximum peak (⅓ of minimum withstanding voltage)
●
Temperature: -55 to 85°C
●
Current: 1.5 amperes for signal contacts, see Figure 1 for power contacts, see Figure 5 for contact
energizing patterns
Number of
Contacts Energized
Current (amperes)
Single
Contact
24
2 Adjacent 3 Adjacent 4 Adjacent 5 Adjacent 6 Adjacent
Contacts Contacts Contacts Contacts Contacts
22
20
Figure 1
Power Contact Current Rating Within Single Column of 6 Power Contacts
NOTE
3x4 array (12 power contacts) current rating equals 11 amperes fully energized. See Figure 5
19
19
18
3.3.
Test Requirements and Procedures Summary
Unless otherwise specified, all tests shall be performed at ambient environmental conditions.
Test Description
Requirement
Meets requirements of product
drawing and Application
Specification
114-13249.
Meets visual requirements.
ELECTRICAL
Procedure
EIA-364-18.
Visual and dimensional (C of C)
inspection per product drawing.
EIA-364-18.
Visual inspection.
EIA-364-23.
Subject specimens to 100
milliamperes maximum and 20
millivolts maximum open circuit
voltage.
For test groups 1,2,4,5, and 7,
measure a minimum of 100
contacts on each of 3 specimens
for a total of 300 readings. For test
group 8, measure a minimum of
100 contacts on each of 10
specimens for a total of 1000
readings.
See Figure 4.
Initial examination of product.
Final examination of product.
Low Level Contact Resistance
(LLCR).
Signal contacts:
18 milliohms maximum initial for 8
to 13 mm stack heights;
21 milliohms maximum initial for 14
to 28 mm stack heights;
26 milliohms maximum initial for 29
to 42 mm stack heights;
ΔR 10 milliohms maximum.
Power contacts:
1.5 milliohms maximum initial for 8
to 13 mm stack heights;
2.0 milliohms maximum initial for 14
to 28 mm stack heights;
3.5 milliohms maximum initial for 29
to 42 mm stack heights;
ΔR 4 milliohms maximum.
Figure 2 (continued)
Rev C
2 of 10
108-2375
Contact resistance at rated current. Power Contacts:
Stack Height
Maximum
(mm)
Resistance End
of Life (mΩ)
8 to 13
2.0
14 to 28
3.0
29 to 42
4.0
Signal Contact:
Stack Height
Maximum
(mm)
Resistance End
of Life (mΩ)
8 to 13
18.0
14 to 28
21.0
29 to 42
26.0
Insulation resistance.
1000 megohms minimum.
EIA-364-6.
At rated DC test current.
EIA-364-21.
500 volts DC, 1 minute hold.
Test mated and unmounted
specimens between 10 signal-
signal differential pairs and between
10 signal-signal adjacent single-
ended positions.
Withstanding voltage.
One minute hold with no
EIA-364-20, Condition I.
breakdown, flashover, or excessive 750 volts AC at sea level.
leakage current > 5 milliamperes.
Test mated and unmounted
specimens between 10 signal-
signal differential pairs and between
10 signal-signal adjacent single-
ended positions.
Figure 2 (continued)
Rev C
3 of 10
108-2375
Current rating.
30°C maximum temperature rise
above ambient (25 ± 5°C) at
specified current.
Signal contacts:
Measure temperature rise on all
contacts in 1 full column of ground
and differential pair signal contacts
of mated and mounted specimens.
Measure temperature rise on all
signal contacts in 2 adjacent
columns of high density signal
contacts of mated and mounted
specimens.
Measure temperature rise at
multiple current levels, including
rated current level, to generate
temperature rise curves showing
30°C temperature rise.
See Figure 5.
Power contacts:
Measure temperature rise on power
contacts for the following energized
configurations: single contact, 2
adjacent, 3 adjacent, 4 adjacent, 5
adjacent, and entire column of 6
adjacent contacts.
Measure temperature rise at
multiple current levels, including
rated current level, to generate
temperature rise curves showing
30°C temperature rise.
See Figure 5.
MECHANICAL
Vibration, sinusoidal.
No discontinuities of 1 microsecond EIA-364-28, Test Condition II.
or longer duration.
Subject mated specimens to 10 to
See Note.
500 to10 Hz traversed in 15
minutes with 1.5 mm maximum total
excursion. Two hours in each of 3
mutually perpendicular planes.
Monitor a minimum of 15 contacts
on a minimum of 3 specimens.
No discontinuities of 1 microsecond EIA-364-27, Method H.
or longer duration.
Subject mated specimens to 30 G's
See Note.
half-sine shock pulses of 11
milliseconds duration. Three shocks
in each direction applied along 3
mutually perpendicular planes, 18
total shocks.
Monitor a minimum of 15 contacts
on a minimum of 3 specimens.
Figure 2 (continued)
Mechanical shock.
Rev C
4 of 10
108-2375
Durability, 25 cycles.
See Note.
EIA-364-9.
Mate and unmate specimens for 25
cycles at a maximum rate of 500
cycles per hour. The first 13 cycles
shall be performed prior to specific
environmental test in the sequence.
The remaining 12 cycles shall be
performed after environmental test.
The test shall be performed with
header and receptacle installed
(press-fit) on test boards.
EIA-364-9.
Mate and unmate specimens for 20
cycles at a maximum rate of 500
cycles per hour.
EIA-364-9.
Mate and unmate specimens for
250 cycles at a maximum rate of
500 cycles per hour.
EIA-364-13.
Measure force necessary to mate
specimens at a rate of 12.7 to 25.4
mm per minute.
EIA-364-13.
Measure force necessary to unmate
specimens at a rate of 12.7 to 25.4
mm per minute.
Interface shall be disturbed so that
contact surfaces move about 0.10
mm or less.
Unmate and remate specimens 3
times.
Telcordia GR-1217 (Central Office).
Subject mated specimens to 50
cycles (500 hours) between 25 and
65°C at 90 to 98% RH.
Temperature ramp shall be 2 hours
per transition with 4 hours dwell at
65°C and 2 hours dwell at 25°C (10
hours total per cycle).
EIA-364-17, Method A, Test
Condition 4.
Subject mated specimens to 105°C
for 120 hours.
EIA-364-17, Method A, Test
Condition 4, Test Time Condition C.
Subject mated specimens to 105°C
for 500 hours.
Durability, 20 cycles.
See Note.
Durability, 250 cycles.
See Note.
Mating force.
45 grams-force maximum for signal
contacts.
1200 grams-force maximum for
power contacts.
5 grams-force minimum for signal
contacts.
120 grams-force minimum for
power contacts.
See Note.
Unmating force
Disturbed interface.
Reseating.
See Note.
ENVIRONMENTAL
Humidity/temperature cycling.
See Note.
High temperature life, 105°C.
See Note.
High temperature life, 105°C.
See Note.
Figure 2 (continued)
Rev C
5 of 10
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