Chip Monolithic Ceramic Capacitor meet AEC-Q200 for Infotainment
GRT31CC81A106KE01_ (1206, X6S, 10uF, DC10V)
_: packaging code
1.Scope
Reference Sheet
This product specification is applied to Chip Monolithic Ceramic Capacitor used for Car Multimedia, Car Interior, Car Comfort application and General Electronic
equipment.
Please contact us when using this product for any other applications than described in the above.
Do not use these products in applications critical to passenger safety and car driving function (e.g. ABS, AIRBAG, etc.).
2.MURATA Part NO. System
(Ex.)
GRT
31
(1)L/W
Dimensions
C
(2)T
Dimensions
C8
(3)Temperature
Characteristics
1A
(4)Rated
Voltage
106
K
E01
L
(5)Nominal (6)Capacitance
Tolerance
Capacitance
(7)Murata’s (8)Packaging
Control Code
Code
3. Type & Dimensions
(1)-1 L
3.2±0.2
(1)-2 W
1.6±0.2
(2) T
1.6±0.2
e
0.3 to 0.8
(Unit:mm)
g
1.5 min.
4.Rated value
(3) Temperature Characteristics
(Public STD Code):X6S(EIA)
Temp. coeff
Temp. Range
or Cap. Change
(Ref.Temp.)
(4)
Rated
Voltage
(6)
(5) Nominal
Capacitance
Capacitance
Tolerance
Specifications and Test
Methods
(Operating
Temp. Range)
-22 to 22 %
-55 to 105 °C
(25 °C)
DC 10 V
10 uF
±10 %
-55 to 105 °C
5.Package
mark
L
K
(8) Packaging
f180mm
Reel
EMBOSSED W8P4
f330mm
Reel
EMBOSSED W8P4
Packaging Unit
2000 pcs./Reel
6000 pcs./Reel
Product specifications in this catalog are as of Apr.17,2015,and are subject to change or obsolescence without notice.
Please consult the approval sheet before ordering.
Please read rating and !Cautions first.
GRT31CC81A106KE01-01
1
■AEC-Q200
Murata Standard Specification and Test Methods
No
AEC-Q200 Test Item
Specifications.
AEC-Q200 Test Method
1 Pre-and Post-Stress
Electrical Test
2 High Temperature
Exposure (Storage)
Appearance
Capacitance
Change
Dissipation
Factor
R6, C8: 0.2 max.
The measured and observed characteristics should satisfy the
specifications in the following table.
No marking defects
R6, C8: Within ±12.5%
-
Set the capacitor for 1000±12 hours at maximum operating
temperature ±3℃.
Set for 24±2 hours at room temperature, then measure.
Insulation
Resistance
3 Temperature Cycling
Appearance
Capacitance
Change
Dissipation
Factor
25Ω・F min.
The measured and observed characteristics should satisfy the
specifications in the following table.
No marking defects
R6, C8: Within ±7.5%
R6, C8: 0.2 max.
Fix the capacitor to the supporting jig in the same manner and under
the same conditions as (18). Perform the 1000 cycles test according
to the four heat treatments in the following table.
Set for 24±2 hours at room temperature, then measure.
Step
Temp.
(C)
Time
(min.)
1
-55+0/-3
2
Room
Temp.
1
3
85 +3/-0 (For R6)
105+3/-0 (For C8)
153
4
Room
Temp.
1
153
Insulation
Resistance
50Ω・F min.
・Initial
measurement for high dielectric constant type
Perform a heat treatment at 150+0/-10
℃
for one hour and then set
for 24±2 hours at room temperature.
Perform the initial measurement.
4 Destructive
Physical Analysis
5 Biased Humidity
Appearance
Capacitance
Change
Dissipation
Factor
Insulation
Resistance
No defects or abnormalities
The measured and observed characteristics should satisfy the
specifications in the following table.
No marking defects
R6,C8: Within ±12.5%
R6,C8: 0.2 max
Per EIA-469
Apply the rated voltage and 1.3+0.2/-0vdc (add 6.8kΩ resister)
at 85±3℃ and 80 to 85% humidity for 1000±12 hours.
Remove and set for 24±2 hours at room temperature, then measure.
The charge/discharge current is less than 50mA.
・Measurement
after test for high dielectric constant type
Perform a heat treatment at 150+0/–10°C for one hour and then let
sit for 24±2 hours at room temperature, then measure.
5Ω
・F
min.
JEMCGS-01744J
2
■AEC-Q200
Murata Standard Specification and Test Methods
No
AEC-Q200 Test Item
Specifications.
The measured and observed characteristics should satisfy the
AEC-Q200 Test Method
Apply 100% of the rated voltage for 1000±12 hours at maximum operating
temperature ±3℃. Set for 24±2 hours at room temperature, then measure.
The charge/discharge current is less than 50mA.
・Initial
measurement for high dielectric constant type
6 Operational Life
Appearance
Capacitance
Change
Dissipation
Factor
specifications in the following table.
No marking defects
R6,C8: Within ±12.5%
R6,C8: 0.2max
Perform a heat treatment at 150+0/-10℃ for one hour and then set
for 24±2 hours at room temperature.
Perform the initial measurement.
・Measurement
after test for high dielectric constant type
Insulation
Resistance
7 External Visual
5Ω
・F
min.
Perform a heat treatment at 150+0/–10°C for one hour and then let
sit for 24±2 hours at room temperature, then measure.
No defects or abnormalities
Visual inspection
8 Physical Dimension
Within the specified dimensions
Using calipers
9 Resistance to
Solvents
Appearance
Capacitance
Change
Dissipation
Factor
No marking defects
Within the specified tolerance
Per MIL-STD-202 Method 215
Solvent 1 : 1 part (by volume) of isopropyl alcohol
3 parts (by volume) of mineral spirits
R6,C8: 0.125max
Solvent 2 : Terpene defluxer
Solvent 3 : 42 parts (by volume) of water
1
part (by volume) of propylene glycol monomethyl ether
1 part (by volume) of monoethanolamine
Insulation
Resistance
50Ω
・
F min.
10 Mechanical
Shock
Appearance
Capacitance
Change
Dissipation
Factor
No marking defects
Within the specified tolerance
Three shocks in each direction should be applied along 3 mutually
perpendicular axes of the test specimen (18 shocks).
The specified test pulse should be Half-sine and should have a
R6,C8: 0.125max
duration :0.5ms, peak value:1500g and velocity change: 4.7m/s.
Insulation
Resistance
11 Vibration
Appearance
Capacitance
Change
Dissipation
Factor
50Ω
・F
min.
No defects or abnormalities
Within the specified tolerance
Solder the capacitor to the test jig (glass epoxy board) in the same
manner and under the same conditions as (18). The capacitor
should be subjected to a simple harmonic motion having a total
R6,C8: 0.125max
amplitude of 1.5mm, the frequency being varied uniformly between
the approximate limits of 10 and 2000Hz. The frequency range, from
10 to 2000Hz and return to 10Hz, should be traversed in
approximately 20 minutes. This motion should be applied for 12
Insulation
Resistance
50Ω
・F
min.
items in each 3 mutually perpendicular directions (total of 36 times).
12 Resistance to
Soldering Heat
Appearance
Capacitance
Change
Dissipation
Factor
The measured and observed characteristics should satisfy the
specifications in the following table.
No marking defects
Within the specified tolerance
Immerse the capacitor in a eutectic solder solution at 260±5℃ for
10±1 seconds. Set at room temperature for 24±2 hours, then
measure.
・Initial
measurement for high dielectric constant type
R6,C8: 0.125max
Perform a heat treatment at 150+0/-10
℃
for one hour and then set
for 24±2 hours at room temperature.
Perform the initial measurement.
Insulation
Resistance
50Ω
・F
min.
JEMCGS-01744J
3
■AEC-Q200
Murata Standard Specification and Test Methods
No
AEC-Q200 Test Item
Specifications.
The measured and observed characteristics shall satisfy the
specifications in the following table.
Appearance
Capacitance
Change
AEC-Q200 Test Method
Fix the capacitor to the supporting jig in the same manner and under
the same conditions as (18). Perform the 300 cycles according to
the two heat treatments listed in the following table (Maximum
transfer time is 20 seconds).
Set for 24±2 hours at room temperature, then measure.
Step
1
-55+0/-3
15±3
2
105+3/-0 (For C8)
85+3/-0 (For R6)
15±3
13 Thermal Shock
No marking defects
R6,C8: Within ±10.0%
Dissipation
Factor
Insulation
Resistance
R6,C8: 0.125max
Temp.
(℃)
Time
(min.)
50Ω
・F
min.
・Initial
measurement for high dielectric constant type
Perform a heat treatment at 150+0/-10 for one hour and then set
for 24±2 hours at room temperature.
Perform the initial measurement.
14 ESD
Appearance
Capacitance
Change
Dissipation
Factor
No marking defects
Within the specified tolerance
R6,C8: 0.125max
Per AEC-Q200-002
Voltage setting level : 2kV
Insulation
Resistance
15 Solderability
50Ω
・F
min.
95% of the terminations is to be soldered evenly and continuously.
(a) Preheat at 155℃ for 4 hours. After preheating, immerse the
capacitor
in a solution of ethanol(JIS-K-8101) and rosin (JIS-K-
5902)
(25% rosin in weight proportion). Immerse in
eutectic
solder solution for 5+0/-0.5 seconds at 235±5℃.
(b) Should be placed into steam aging for 8 hours±15 minutes.
After
preheating, immerse the capacitor in a solution of
ethanol(JIS-K-8101)
and rosin (JIS-K-5902) (25% rosin in weight
proportion).
Immerse in eutectic solder solution for 5+0/-0.5
seconds
at 235±5℃.
(c) Should be placed into steam aging for 8 hours±15 minutes.
After
preheating, immerse the capacitor in a solution of
ethanol(JIS-K-8101)
and rosin (JIS-K-5902) (25% rosin in weight
proportion).
Immerse in eutectic solder solution for 120±5 seconds
at 260±5℃.
16 Electrical
Chatacteri-
zation
Appearance
Capacitance
Change
Dissipation
Factor
No defects or abnormalities
Within the specified tolerance
R6.C8 :0.125max
Visual inspection.
The capacitance/Q/D.F. should be measured at 25℃ at the
frequency and voltage shown in the table.
Char.
Item
Frequency
Voltage
R6,C8
6.3V max.
(C≦10F)
10.1kHz
0.50.1Vrms
R6,C8
10V min.
(C≦10F)
10.1kHz
10.2Vrms
R6,C8
(10F< C)
12024Hz
0.50.1Vrms
Insulation
Resistance
25℃
Insulation
Resistance
85℃(For R6)
105℃(For C8)
Dielectric
Strength
50Ω
・F
min.
The insulation resistance should be measured with a DC voltage not
exceeding the rated voltage at 25℃ and maximum operating temperature
within 1 minute of charging.
※
5Ω
・F
min.
※85+3/-0℃(For
R6), 105+3/-0℃(For C8)
No failure
No failure should be observed when 250% of the rated voltage is
applied between the terminations for 1 to 5 seconds, provided the
charge/ discharge current is less than 50mA.
JEMCGS-01744J
4
■AEC-Q200
Murata Standard Specification and Test Methods
No
AEC-Q200 Test Item
Appearance
No marking defects
Specifications.
AEC-Q200 Test Method
Solder the capacitor on the test jig (glass epoxy board) shown in
Fig1 using a eutectic solder. Then apply a force in the direction
shown in Fig 2 for 5±1sec. The soldering should be done by the
reflow method and should be conducted with care so that the
Capacitance
Change
Dissipation
Factor
R6,C8: 0.125max
Within specified tolerance
soldering is uniform and free of defects such as heat shock.
½ﾝﾃﾞﾝ½
17 Board Flex
Insulation
Resistance
50Ω
・F
min.
Type
GRT03
GRT15
45
GRT18
GRT21
GRT31
a
0.3
0.5
45
0.6
0.8
2.0
b
0.9
1.5
支持台
2.2
3.0
4.4
c
0.3
0.6
0.9
1.3
1.7
(in mm)
b
20
C
*1,2：2.0±0.05
114
4.0±0.1
Pressurizing
＊1
φ1.5
+0.1
-0
speed:1.0mm/sec
Pressurize
Ａ
＊2
3.5± 0.05
40
c
Ｂ
a
100
Fig.1
Capacitance meter
45
45
Fig.2
t : 1.6mm
(GRT03,15:0.8mm)
18 Terminal
Strength
Capacitance
Change
Dissipation
Factor
Within specified tolerance
R6,C8: 0.125max
Appearance
No marking defects
Flexure：≦2
0.05以下
(Chip thickness＞0.85mm rank
High Dielectric Type)
Flexure：≦1
(Chip thickness≦0.85mm rank
High Dielectric Type))
8.0±0.3
R4
1.75±0.1
t
Solder the capacitor to the test jig (glass epoxy board) shown in
Fig.3 using a eutectic solder. Then apply *18N force in parallel with
the test jig for 60sec.
The soldering should be done either with an iron or using the reflow
method and should be conducted with care so that the soldering is
uniform and free of defects such as heat shock
*2N(GRT03,15)
Type
a
0.3
0.4
1.0
1.2
2.2
b
0.9
1.5
3.0
4.0
5.0
c
0.3
0.5
1.2
1.65
2.0
Insulation
Resistance
50Ω
・F
min.
GRT03
GRT15
GRT18
GRT21
GRT31
（in
mm）
c
b
a
ﾗﾝﾄﾞ
b
f4.5
t : 1.6mm
(GRT03,15:0.8mm)
Solder resist
Baked electrode
or copper foil
c
a
19 Beam Load Test
Destruction value should be exceed following one.
< Chip L dimension : 2.5mm max. >
Chip thickness > 0.5mm rank : 20N
Chip thickness
≦0.5mm
rank : 8N
< Chip L dimension : 3.2mm min. >
Chip thickness < 1.25mm rank : 15N
Chip
thickness
≧1.25mm
rank : 54.5N
Apply a force.
Fig.3
Place the capacitor in the beam load fixture as Fig 4.
FPGA/CPLD
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