SN54BCT8374A Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops
| SN54BCT8374A | 5962-9172701Q3A | 5962-9172701QLA | SNJ54BCT8374AFK | SNJ54BCT8374AJT | SN74BCT8374A | |
|---|---|---|---|---|---|---|
| 描述 | SN54BCT8374A Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops | Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 28-LCCC -55 to 125 | Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 24-CDIP -55 to 125 | Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 28-LCCC -55 to 125 | Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 24-CDIP -55 to 125 | SN74BCT8374A Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
| Brand Name | - | Texas Instruments | Texas Instruments | Texas Instruments | Texas Instruments | - |
| 零件包装代码 | - | QLCC | DIP | QFN | DIP | - |
| 包装说明 | - | QCCN, LCC28,.45SQ | DIP, DIP24,.3 | QCCN, LCC28,.45SQ | DIP, DIP24,.3 | - |
| 针数 | - | 28 | 24 | 28 | 24 | - |
| Reach Compliance Code | - | not_compliant | not_compliant | not_compliant | not_compliant | - |
| 其他特性 | - | SUPPORTS IEEE STANDARD 1149.1-1990 BOUNDARY SCAN | SUPPORTS IEEE STANDARD 1149.1-1990 BOUNDARY SCAN | SUPPORTS IEEE STANDARD 1149.1-1990 BOUNDARY SCAN | SUPPORTS IEEE STANDARD 1149.1-1990 BOUNDARY SCAN | - |
| 控制类型 | - | INDEPENDENT CONTROL | INDEPENDENT CONTROL | INDEPENDENT CONTROL | INDEPENDENT CONTROL | - |
| 计数方向 | - | UNIDIRECTIONAL | UNIDIRECTIONAL | UNIDIRECTIONAL | UNIDIRECTIONAL | - |
| 系列 | - | BCT/FBT | BCT/FBT | BCT/FBT | BCT/FBT | - |
| JESD-30 代码 | - | S-CQCC-N28 | R-GDIP-T24 | S-CQCC-N28 | R-GDIP-T24 | - |
| 长度 | - | 11.43 mm | 32 mm | 11.43 mm | 32 mm | - |
| 逻辑集成电路类型 | - | BOUNDARY SCAN BUS DRIVER | BOUNDARY SCAN BUS DRIVER | BOUNDARY SCAN BUS DRIVER | BOUNDARY SCAN BUS DRIVER | - |
| 最大频率@ Nom-Sup | - | 20000000 Hz | 20000000 Hz | 70000000 Hz | 70000000 Hz | - |
| 最大I（ol） | - | 0.064 A | 0.064 A | 0.064 A | 0.064 A | - |
| 位数 | - | 8 | 8 | 8 | 8 | - |
| 功能数量 | - | 1 | 1 | 1 | 1 | - |
| 端口数量 | - | 2 | 2 | 2 | 2 | - |
| 端子数量 | - | 28 | 24 | 28 | 24 | - |
| 最高工作温度 | - | 125 °C | 125 °C | 125 °C | 125 °C | - |
| 最低工作温度 | - | -55 °C | -55 °C | -55 °C | -55 °C | - |
| 输出特性 | - | 3-STATE | 3-STATE | 3-STATE | 3-STATE | - |
| 输出极性 | - | TRUE | TRUE | TRUE | TRUE | - |
| 封装主体材料 | - | CERAMIC, METAL-SEALED COFIRED | CERAMIC, GLASS-SEALED | CERAMIC, METAL-SEALED COFIRED | CERAMIC, GLASS-SEALED | - |
| 封装代码 | - | QCCN | DIP | QCCN | DIP | - |
| 封装等效代码 | - | LCC28,.45SQ | DIP24,.3 | LCC28,.45SQ | DIP24,.3 | - |
| 封装形状 | - | SQUARE | RECTANGULAR | SQUARE | RECTANGULAR | - |
| 封装形式 | - | CHIP CARRIER | IN-LINE | CHIP CARRIER | IN-LINE | - |
| 包装方法 | - | TUBE | TUBE | TUBE | TUBE | - |
| 峰值回流温度（摄氏度） | - | NOT SPECIFIED | NOT SPECIFIED | NOT SPECIFIED | NOT SPECIFIED | - |
| 电源 | - | 5 V | 5 V | 5 V | 5 V | - |
| 最大电源电流（ICC） | - | 52 mA | 52 mA | 52 mA | 52 mA | - |
| Prop。Delay @ Nom-Sup | - | 10 ns | 10 ns | 10 ns | 10 ns | - |
| 传播延迟（tpd） | - | 10.5 ns | 10.5 ns | 10 ns | 10 ns | - |
| 认证状态 | - | Qualified | Qualified | Not Qualified | Not Qualified | - |
| 筛选级别 | - | MIL-PRF-38535 Class Q | MIL-PRF-38535 Class Q | MIL-PRF-38535 | MIL-PRF-38535 | - |
| 座面最大高度 | - | 2.03 mm | 5.08 mm | 2.03 mm | 5.08 mm | - |
| 最大供电电压 (Vsup) | - | 5.5 V | 5.5 V | 5.5 V | 5.5 V | - |
| 最小供电电压 (Vsup) | - | 4.5 V | 4.5 V | 4.5 V | 4.5 V | - |
| 标称供电电压 (Vsup) | - | 5 V | 5 V | 5 V | 5 V | - |
| 表面贴装 | - | YES | NO | YES | NO | - |
| 技术 | - | BICMOS | BICMOS | BICMOS | BICMOS | - |
| 温度等级 | - | MILITARY | MILITARY | MILITARY | MILITARY | - |
| 端子形式 | - | NO LEAD | THROUGH-HOLE | NO LEAD | THROUGH-HOLE | - |
| 端子节距 | - | 1.27 mm | 2.54 mm | 1.27 mm | 2.54 mm | - |
| 端子位置 | - | QUAD | DUAL | QUAD | DUAL | - |
| 处于峰值回流温度下的最长时间 | - | NOT SPECIFIED | NOT SPECIFIED | NOT SPECIFIED | NOT SPECIFIED | - |
| 翻译 | - | N/A | N/A | N/A | N/A | - |
| 触发器类型 | - | POSITIVE EDGE | POSITIVE EDGE | POSITIVE EDGE | POSITIVE EDGE | - |
| 宽度 | - | 11.43 mm | 6.92 mm | 11.43 mm | 6.92 mm | - |
微控制器 MCU
stm32/stm8
分立器件
DIY/开源硬件专区
嵌入式系统
嵌入式系统
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