SN74LVTH182512-EP: 产品描述SN74LVTH182512-EP Enhanced Product 3.3-V Abt Scan Test Devices With 18-Bit Universal Bus Transceivers; 产品类别半导体逻辑; 文件大小678KB，共38页; 制造商Texas Instruments(德州仪器); 官网地址http://www.ti.com.cn/; 标准

敬请期待详细参数选型对比

SN74LVTH182512-EP概述

SN74LVTH182512-EP Enhanced Product 3.3-V Abt Scan Test Devices With 18-Bit Universal Bus Transceivers

SN74LVTH182512-EP规格参数

参数名称	属性值
Technology Family	LVT
IOH(Max)(mA)	-32
Rating	HiRel Enhanced Product
VCC(Min)(V)	2.7
Operating temperature range(C)	-40 to 85
Approx. price(US$)	9.43 \| 1ku
ICC @ nom voltage(Max)(mA)	24
Voltage(Nom)(V)	3.3
tpd @ nom Voltage(Max)(ns)	5.7
IOL(Max)(mA)	64
Package Group	TSSOP\|64
VCC(Max)(V)	3.6
Bits(#)	18
F @ nom voltage(Max)(Mhz)	160

	SN74LVTH182512-EP	V62-04730-01XE	V62/04730-01XE
描述	SN74LVTH182512-EP Enhanced Product 3.3-V Abt Scan Test Devices With 18-Bit Universal Bus Transceivers	Specialty Function Logic Mil Enhanced 3.3V ABT Scan Test Device	Enhanced Product 3.3-V Abt Scan Test Devices With 18-Bit Universal Bus Transceivers 64-TSSOP -40 to 85

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