REVISIONS
LTR
A
B
DESCRIPTION
Changes in accordance with NOR 5962-R140-96.
Add device type 02. Add RHA requirements. Add case outlines G, H, and P.
Changes were made to paragraphs 1.3, 1.4, table I, and table IIA.
Update boilerplate. – rrp
Replaced reference to MIL-STD-973 with reference to MIL-PRF-38535.
Add a new footnote to paragraph 1.5 and Table I. - ro
Add a note to case outline G as specified under figure 1. - ro
Add device type 03 tested at low dose rate. Make changes to footnotes 1/
and 2/ as specified under Table I. Make change to the V
OS
test subgroups
from 4 and 6 to 1 and 3 as specified under Table I. Make change to the
E
TCV
OS
test subgroups from 5 and 6 to 2 and 3 as specified under Table I.
Make change to the CMRR and A
VO
test subgroups from 4, 5, 6 to 1, 2, 3 as
specified under Table I. Make change to I
N
and E
N
tests subgroup from 1 to 4
as specified in Table I. Make change to paragraph 4.4.4.1 and Table IIB.
Delete paragraphs 4.4.4.1.1 and 4.4.4.2. - ro
11-03-30
C. SAFFLE
DATE (YR-MO-DA)
96-06-12
98-09-02
APPROVED
M. A. FRYE
R. MONNIN
C
D
05-04-19
08-01-29
R. MONNIN
R. HEBER
REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
PMIC N/A
REV
SHEET
PREPARED BY
RICK OFFICER
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E
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STANDARD
MICROCIRCUIT
DRAWING
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
CHECKED BY
RAJESH PITHADIA
APPROVED BY
MICHAEL FRYE
DRAWING APPROVAL DATE
95-07-17
REVISION LEVEL
E
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
http://www.dscc.dla.mil
MICROCIRCUIT, LINEAR, RADIATION
HARDENED, LOW NOISE, PRECISION,
OPERATIONAL AMPLIFIER, MONOLITHIC
SILICON
SIZE
A
CAGE CODE
AMSC N/A
67268
SHEET
1 OF 13
5962-94680
DSCC FORM 2233
APR 97
5962-E072-11
1. SCOPE
1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and
M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part
or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
1.2 PIN. The PIN is as shown in the following example:
5962
R
94680
01
V
G
A
Federal
stock class
designator
\
RHA
designator
(see 1.2.1)
/
Device
type
(see 1.2.2)
Device
class
designator
(see 1.2.3)
Case
outline
(see 1.2.4)
Lead
finish
(see 1.2.5)
\/
Drawing number
1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are
marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A
specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
1.2.2 Device type(s). The device type(s) identify the circuit function as follows:
Device type
01
02
03
Generic number
OP-27B
OP-27A
OP-27A
Circuit function
Low noise precision operational amplifier
Low noise precision operational amplifier
Low noise precision operational amplifier
1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as
follows:
Device class
M
Q or V
Device requirements documentation
Vendor self-certification to the requirements for MIL-STD-883 compliant, non-
JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A
Certification and qualification to MIL-PRF-38535
1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter
G
H
P
2
Descriptive designator
MACY1-X8
GDFP1-F10 or CDFP2-F10
GDIP1-T8 or CDIP2-T8
CQCC1-N20
Terminals
8
10
8
20
Package style
Can
Flat pack
Dual-in-line
Square leadless chip carrier
1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535,
appendix A for device class M.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
5962-94680
SHEET
E
2
1.3 Absolute maximum ratings. 1/
Supply voltage (V
S
) ......................................................................................
Internal power dissipation ...........................................................................
Input voltage ................................................................................................
Output short-circuit duration ........................................................................
Differential input voltage ..............................................................................
Differential input current ..............................................................................
Storage temperature range .........................................................................
Operating temperature range ......................................................................
Lead temperature (soldering, 60 seconds) ..................................................
Junction temperature range (T
J
) ..................................................................
22
V
500 mW
22
V 2/
Indefinite
0.7
V 3/
25
mA 3/
-65C to +150C
-55C to +125C
+300C
-65C to +150C
Thermal resistance, junction-to-case (
JC
) .................................................. See MIL-STD-1835
Thermal resistance, junction-to-ambient (
JA
):
Cases G and H ......................................................................................... 150C/W
Case P ..................................................................................................... 119C/W
Case 2 ...................................................................................................... 110C/W
1.4 Recommended operating conditions.
Supply voltage (V
S
) .....................................................................................
4.5
V to
18
V
Source resistor (R
S
) .................................................................................... 50
Ambient operating temperature range (T
A
) ................................................. -55C to +125C
1.5 Radiation features:
Device type 02:
Maximum total dose available (dose rate = 50 – 300 rads(Si)/s) ................. 100 krads (Si) 4/
Device type 03:
Maximum total dose available (dose rate
10 m rads(Si)/s) ....................... 50 krads (Si) 5/
_____
1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
2/ For supply voltages less than
22
V, the absolute maximum input voltage is equal to the supply voltages.
3/ The device inputs are protected by back-to-back diodes. Current limiting resistors are not used in order to achieve low
noise. If differential input voltage exceeds
0.7
V, the input current should be limited to 25 mA.
4/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects.
Radiation end point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883,
method 1019, condition A.
5/ For device type 03, radiation end point limits for the noted parameters are guaranteed for the conditions specified in
MIL-STD-883, test method 1019, condition D.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
5962-94680
SHEET
E
3
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 -
MIL-STD-1835 -
Test Method Standard Microcircuits.
Interface Standard Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 -
MIL-HDBK-780 -
List of Standard Microcircuit Drawings.
Standard Microcircuit Drawings.
(Copies of these documents are available online at
https://assist.daps.dla.mil/quicksearch/
or from the Standardization
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with
MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The
modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for
device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified
herein.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.
3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.
3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be as specified on figure 2.
3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the
electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full
ambient operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical
tests for each subgroup are defined in table I.
3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be
marked. For packages where marking of the entire SMD PIN is not feasible due to space limitations, the manufacturer has the
option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be marked.
Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in
accordance with MIL-PRF-38535, appendix A.
3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in
MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
5962-94680
SHEET
E
4
TABLE I. Electrical performance characteristics.
Conditions 1/ 2/ 3/
-55C
T
A
+125C
unless otherwise specified
Test
Symbol
Group A
subgroups
Device
type
Limits 4/
Min
Max
60
200
Unit
Input offset voltage
V
OS
1
2, 3
1
2, 3
M,D,P,L,R
M,D,P,L
1
1
2, 3
01
V
02, 03
-25
-60
25
60
100
100
1.3
V/C
02
03
01
02, 03
-100
-100
Average input offset
voltage
Input offset current
5/
TCV
OS
T
A
= +125C, -55C
-0.6
0.6
50
85
nA
I
OS
1
2, 3
1
2, 3
M,D,P,L,R
M,D,P,L
1
1
1
2, 3
1
2, 3
M,D,P,L,R
M,D,P,L
1
1
1
2, 3
01
02, 03
-35
-50
+35
+50
100
100
+55
+95
+40
+60
1000
1000
+11
+10.3
10
20
V/V
V
nA
02
03
01
-100
-100
-55
-95
Average input bias current
I
IB
02, 03
-40
-60
02
03
01, 02,
03
01
-1000
-1000
-11
-10.3
Input voltage range
IVR
5/ 6/
Power supply rejection 5/
ratio
PSRR
V
S
=
4
V to
18
V
V
S
=
4.5
V to
18
V
V
S
=
4
V to
18
V
V
S
=
4.5
V to
18
V
1
2, 3
1
2, 3
02, 03
10
16
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
5962-94680
SHEET
E
5
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