REI Datasheet
SN5474, SN54H74, SN54L74, SN54LS74A, SN54S74
SN7474, SN74H74, SN74LS74A, SN74S74
Dual D-Type Positive-Edge-Triggered Flip-Flops with Preset and Clear
These devices contain two independent D-type positive-edge-triggered flip-flops. A low level at the
preset or clear inputs sets or resets the outputs regardless of the levels of the other inputs. When
preset and clear are inactive (high), data at the D input meeting the setup time requirements are
transferred to the outputs on the positive-going edge of the clock pulse. Clock triggering occurs at
a voltage level and is not directly related to the rise time of the clock pulse. Following the hold time
interval, data at the D input may be changed without affecting the levels at the outputs.
Rochester Electronics
Manufactured Components
Rochester branded components are
manufactured using either die/wafers
purchased from the original suppliers
or Rochester wafers recreated from the
original IP. All recreations are done with
the approval of the OCM.
Parts are tested using original factory
test programs or Rochester developed
test solutions to guarantee product
meets or exceeds the OCM data sheet.
Quality Overview
•
ISO-9001
• AS9120 certification
• Qualified Manufacturers List (QML) MIL-PRF-38535
• Class Q Military
• Class V Space Level
• Qualified Suppliers List of Distributors (QSLD)
• Rochester is a critical supplier to DLA and
meets all industry and DLA standards.
Rochester Electronics, LLC is committed to supplying
products that satisfy customer expectations for
quality and are equal to those originally supplied by
industry manufacturers.
The original manufacturer’s datasheet accompanying this document reflects the performance
and specifications of the Rochester manufactured version of this device. Rochester Electronics
guarantees the performance of its semiconductor products to the original OEM specifications.
‘Typical’ values are for reference purposes only. Certain minimum or maximum ratings may be
based on product characterization, design, simulation, or sample testing.
© 2013 Rochester Electronics, LLC. All Rights Reserved 11072013
To learn more, please visit
www.rocelec.com
聊聊、笑笑、闹闹
京公网安备 11010802033920号
Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved
电子工程世界
