without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to
obtain the latest version of this device specification before relying on any published information and before placing orders for products.
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. A
09/12/05
1
IS45LV44002B
FUNCTIONAL BLOCK DIAGRAM
OE
WE
CAS
CONTROL
LOGIC
WE
CONTROL
LOGICS
OE
CONTROL
LOGIC
ISSI
®
CAS
CAS
WE
OE
RAS
RAS
CLOCK
GENERATOR
DATA I/O BUS
REFRESH
COUNTER
DATA I/O BUFFERS
ROW DECODER
RAS
COLUMN DECODERS
SENSE AMPLIFIERS
I/O0-I/O3
MEMORY ARRAY
4,194,304 x 4
ADDRESS
BUFFERS
A0-A10
TRUTH TABLE
Function
Standby
Read
Write: Word (Early Write)
Read-Write
EDO Page-Mode Read
1st Cycle:
2nd Cycle:
EDO Page-Mode Write
1st Cycle:
2nd Cycle:
EDO Page-Mode
1st Cycle:
Read-Write
2nd Cycle:
Hidden Refresh
Read
Write
(1)
RAS-Only
Refresh
CBR Refresh
Note:
1. EARLY WRITE only.
RAS
H
L
L
L
L
L
L
L
L
L
L→H→L
L→H→L
L
H→L
CAS
H
L
L
L
H→L
H→L
H→L
H→L
H→L
H→L
L
L
H
L
WE
X
H
L
H→L
H
H
L
L
H→L
H→L
H
L
X
X
OE
X
L
X
L→H
L
L
X
X
L→H
L→H
L
X
X
X
Address t
R
/t
C
X
ROW/COL
ROW/COL
ROW/COL
ROW/COL
NA/COL
ROW/COL
NA/COL
ROW/COL
NA/COL
ROW/COL
ROW/COL
ROW/NA
X
I/O
High-Z
D
OUT
D
IN
D
OUT
, D
IN
D
OUT
D
OUT
D
IN
D
IN
D
OUT
, D
IN
D
OUT
, D
IN
D
OUT
D
OUT
High-Z
High-Z
2
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. A
09/12/05
IS45LV44002B
Functional Description
The IS45LV44002B is a CMOS DRAMs optimized for
high-speed bandwidth, low power applications. During
READ or WRITE cycles, each bit is uniquely addressed
through the 11 address bits. These are entered 11 bits
(A0-A10) at a time for the 2K refresh device. The row
address is latched by the Row Address Strobe (RAS). The
column address is latched by the Column Address Strobe
(CAS).
RAS
is used to latch the first nine bits and
CAS
is
used the latter ten bits.
ISSI
Auto Refresh Cycle
®
To retain data, 2,048 refresh cycles are required in each
32 ms period. There are two ways to refresh the memory:
1. By clocking each of the 2,048 row addresses (A0
through A10) with RAS at least once every 32 ms. Any
read, write, read-modify-write or RAS-only cycle re-
freshes the addressed row.
2. Using a
CAS-before-RAS
refresh cycle.
CAS-before-RAS
refresh is activated by the falling edge of
RAS,
while
holding
CAS
LOW. In
CAS-before-RAS
refresh cycle,
an internal 9-bit counter provides the row addresses
and the external address inputs are ignored.
CAS-before-RAS
is a refresh-only mode and no data
access or device selection is allowed. Thus, the output
remains in the High-Z state during the cycle.
Memory Cycle
A memory cycle is initiated by bringing
RAS
LOW and it is
terminated by returning both
RAS
and
CAS
HIGH. To
ensures proper device operation and data integrity any
memory cycle, once initiated, must not be ended or
aborted before the minimum t
RAS
time has expired. A new
cycle must not be initiated until the minimum precharge
time t
RP
, t
CP
has elapsed.
Power-On
After application of the V
DD
supply, an initial pause of 200
µs is required followed by a minimum of eight initialization
cycles (any combination of cycles containing a
RAS
signal).
During power-on, it is recommended that
RAS
track with
V
DD
or be held at a valid V
IH
to avoid current surges.
Read Cycle
A read cycle is initiated by the falling edge of
CAS
or
OE,
whichever occurs last, while holding
WE
HIGH. The
column address must be held for a minimum time
specified by t
AR
. Data Out becomes valid only when t
RAC
,
t
AA
, t
CAC
and t
OEA
are all satisfied. As a result, the access
time is dependent on the timing relationships between
these parameters.
Write Cycle
A write cycle is initiated by the falling edge of
CAS
and
WE,
whichever occurs last. The input data must be valid
at or before the falling edge of
CAS
or
WE,
whichever
occurs last.
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. A
09/12/05
3
IS45LV44002B
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol
V
T
V
DD
I
OUT
P
D
T
A
T
STG
Parameters
Voltage on Any Pin Relative to GND
Supply Voltage
Output Current
Power Dissipation
Operating Temperature
Storage Temperature
Rating
–0.5 to +4.6
–0.5 to +4.6
50
1
-40 to +85
–55 to +125
Unit
V
V
mA
W
°C
°C
ISSI
®
Note:
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device.
This is a stress rating only and functional operation of the device at these or any other conditions above those indicated
in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended
periods may affect reliability.
RECOMMENDED OPERATING CONDITIONS
(Voltages are referenced to GND.)
Symbol
V
DD
V
IH
V
IL
T
A
Parameter
Supply Voltage
Input High Voltage
Input Low Voltage
Automotive Ambient Temperature (A1)
Min.
3.0
2.0
–0.3
-40
Typ.
3.3
—
—
—
Max.
3.6
V
DD
+ 0.3
0.8
+85
Unit
V
V
V
°C
CAPACITANCE
(1,2)
Symbol
C
IN
1
C
IN
2
C
IO
Parameter
Input Capacitance: A0-A10
Input Capacitance:
RAS, CAS, WE, OE
Data Input/Output Capacitance: I/O0-I/O3
Max.
5
7
7
Unit
pF
pF
pF
Notes:
1. Tested initially and after any design or process changes that may affect these parameters.
2. Test conditions: T
A
= 25°C, f = 1 MHz.
4
Integrated Silicon Solution, Inc. — 1-800-379-4774
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