MNA14
Ceramic capacitors
Multi-layer ceramic chip capacitor
networks
MNA14
(1608 (0603)
×
4 size, chip capacitor networks)
!Features
1) Area ratio is approximately 55% smaller than that of
the MCH18, enabling high - density mounting.
2) Mounting costs are reduced.
3) Use of convex electrodes prevents solder bridging
during mounting, and makes it easy to perform
a visual inspection of the mounted piece.
Also facilitates automatic inspection.
4) Barrier layer and end terminations to improve
solderability.
5) Each element is independent to ensure a wide
range of circuit applications.
6) Can be packed on tape.
!External
dimensions
(Units : mm)
0.55±0.1
0.7±0.2
0.15
+
0.09
−
0.12
0.85±0.1
0.8±0.1
3.2±0.2
0.8±0.1
∗
Land pattern in 0.8mm pitch between each electrode is recommended.
!Structure
!Equivalent
circuits
C
1
C
2
C
3
C
4
C
1
=
C
2
=
C
3
=
C
4
External electrode
ΙΙΙ
(coating layer)
Internal electrode
Ceramic element
External electrode
ΙΙ
(barrier layer)
External electrode
Ι
(thick membrane layer)
∗The
design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification.
1.6±0.2
MNA14
Ceramic capacitors
!Product
designation
Code Product thickness Packaging specifications
Reel
K
0.8mm
Paper tape (width 8 mm, pich 4 mm)
φ180mm
(7in.)
Reel (φ180mm) : compatible with EIAJ ET-7200A
Basic ordening unit (pcs.)
4,000
Part No.
Packaging style
M N A
Rated voltage
Code Voltage
2
25V
5
50V
1 4
5
A
1 0 1
K
K
Nominal
Capacitance tolerance
Capacitance-temperature characteristics
tolerace
Code EIA code Operating temperature range (°C) Temp. coefficient or percent change capacitance Code
A
C0G
−55
~
+125
0
±
30ppm /
°C
K
±
10%
3-digit designation
according IEC
±
20%
CN
X7R
−55
~
+125
±
15%
M
!Capacitance
range
Product name
Temperature characteristic
Capacitance (pF)
Rated voltage
Tolerance
10
22
47
100
220
470
1,000
2,200
4,700
10,000
22,000
0.8
±
0.1
MNA 14
A (C0G)
50V
K (
±
10%)
CN (X7R)
25V
M (
±
20%)
Product thickness (mm)
∗The
design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification.
MNA14
Ceramic capacitors
!Characteristics
Class 1 (For thermal compensation)
Temperature characteristics
A (C0G)
Item
Operating temperature
Nominal capacitance (C)
−55°C
~
+125°C
Must be within the specified tolerance range.
100 / (400
+
20C)% or less: Less than 30 pF
0.1% or less : 30 pF or larger
Test methods / conditions
(based on JIS C 5102)
Dissipation factor (tanδ)
Based on paragraph 7.8 and paragraph 9,
Measured at room temperature and standard humidity.
Measurement frequency : 1
±
0.1MHz
Measurement voltage : 1
±
0.1Vrms.
Based on paragraph 7.6.
Measurement is made after rated voltage is
applied for 60
±
5s.
Based on paragraph 7.1.
Apply 300% of the rated voltage for 1 to 5s
then measure.
The temperature coefficients in table 12, paragraph
7.12 are calculated at 20°C and high temperature.
Based on paragraph 8.11.2.
Apply 5N for 10
±
1s
in the direction
indicated by the arrow.
Insulation resistance (IR)
10,000MΩ or 500MΩ⋅µF, whichever is smaller
Withstanding voltage
The insulation must not be damaged.
Temperature characteristics
Within 0
±
30ppm /
°C
Terminal adherence
No detachment or signs of detachment.
Pressure (5N)
Test board
Capacitor
Appearance
Resistance
to vibration
Rate of capacitance change
Dissipation factor (tanδ)
There must be no mechanical damage.
Must be within initial tolerance.
Must satisfy initial specified value.
At least 3/4 of the surface of the two terminals
must be covered with new solder.
Chip is mounted to a board in the manner
shown on the right, subjected to vibration
(type A in paragraph 8.2), and
Board
measured 24
±
2 hours later.
Based on paragraph 8.13,
Soldering temperature : 235
±
5°C
: 2
±
0.5s
Soldering time
Solderability
Appearance
Rate of capacitance change
Resistance
to soldering
heat
Dissipation factor (tanδ)
Insulation resistance
Withstanding voltage
Appearance
Temperature
cycling
Rate of capacitance change
Dissipation factor (Tanδ)
Insulation resistance
Appearance
Rate of capacitance change
Humidity load
test
Dissipation factor (tanδ)
Insulation resistance
Appearance
High-
temperature
load test
Rate of capacitance change
Dissipation factor (tanδ)
Insulation resistance
There must be no mechanical damage.
±
2.5% or
±
0.25 pF, whichever is larger
Must satisfy initial specified value.
10,000MΩ or 500MΩ⋅µF, whichever is smaller
The insulation must not be damaged.
There must be no mechanical damage.
±
2.5% or
±
0.25 pF, whichever is larger
Must satisfy initial specified value.
10,000MΩ or 500MΩ⋅µF, whichever is smaller
There must be no mechanical damage.
±
7.5% or
±
0.75 pF, whichever is larger
0.5% or less
500MΩ or 25MΩ⋅µF, whichever is smaller
There must be no mechanical damage.
±
3.0% or
±
0.3 pF, whichever is larger
0.3% or less
10,000MΩ or 50MΩ⋅µF, whichever is smaller
Based on paragraph 9.9,
Test temperature : 40
±
2°C
Relative humidity : 90% to 95%
Applied voltage : rated voltage
Test time
: 500 to 524 hrs.
Capacitance measured after 24
±
2 hrs.
Based on paragraph 9.10,
Test temperature : Max. operating temp.
Applied voltage : rated voltage
×
200%
Test time
: 1,000 to 1,048 hrs.
Capacitance measured after 24
±
2 hrs.
Based on paragraph 9.3,
Number of cycles : 5
Capacitance measured after 24
±
2 hrs.
Based on paragraph 8.14.
Soldering temperature : 260
±
5°C
: 5
±
0.5s
Soldering time
: 150
±
10°C for 1 to 2 min.
Preheating
∗The
design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification.
MNA14
Ceramic capacitors
Class 2 (High dielectric constant)
Temperature characteristics
CN (X7R)
Item
Operating temperature
Nominal capacitance (C)
Dissipation factor (tanδ)
−55°C
~
+125°C
Must be within the specified tolerance range.
2.5% or less
(when rated voltage is 16V : 3.5% or less)
10,000MΩ or 500MΩ⋅µF, whichever is smaller
Based on paragraph 7.8
Measured at room temperature and standard humidity.
Measurement frequency: 1
±
0.1 kHz
Measurement voltage : 0.1
±
0.2 Vrms.
Based on paragraph 7.6
Measurement is made after rated voltage
is applied for 60
±
5s.
Based on paragraph 7.1
Apply 250% of the rated voltage
for 1 to 5s then measure.
The temperature coefficients in paragraph 7.12,
table 8, condition B, are based on measurements
carried out at 20°C, with no voltage applied.
Based on paragraph 8.11.2.
Apply 5N for 10
±
1s
in the direction indicated
by the arrow.
Test methods/conditions
(based on JIS C 5102)
Insulation resistance (IR)
Withstanding voltage
The insulation must not be damaged.
Temperature characteristics
Within
±
15%
Terminal adherence
No peeling or sign of peeling on terminal.
Pressure (5N)
Test board
Capacitor
Appearance
Resistance
to vibration
Rate of capacitance change
Dissipation factor (tanδ)
Solderability
There must be no mechanical damage.
Must be within initial tolerance.
Must satisfy initial specified value.
At least 3/4 of the surface of the two terminals must be covered with new solder.
Chip is mounted to a board in the
manner shown on the right, subjected
to vibration (type A in paragraph 8.2),
and measured 48
±
4 hrs. later.
Board
Based on paragraph 8.13
Soldering temperature: 235
±
5°C
: 2
±
0.5s
Soldering time
Appearance
Rate of capacitance change
Resistance
to soldering
heat
Dissipation factor (tanδ)
Insulation resistance
Withstanding voltage
Appearance
Temperature
cycling
Rate of capacitance change
Dissipation factor (tanδ)
Insulation resistance
Appearance
Humidity load
test
Rate of capacitance change
Dissipation factor (tanδ)
Insulation resistance
Appearance
High-
temperature
load test
Rate of capacitance change
Dissipation factor (tanδ)
Insulation resistance
There must be no mechanical damage.
Within
±
5.0%
Must satisfy initial specified value.
10,000MΩ or 500MΩ⋅µF, whichever is smaller
The insulation must not be damaged.
There must be no mechanical damage.
Within
±
7.5%
Must satisfy initial specified value.
10,000MΩ or 500MΩ⋅µF, whichever is smaller
There must be no mechanical damage.
Within
±
12.5%
5.0% or less
500MΩ or 25MΩ⋅µF, whichever is smaller
There must be no mechanical damage.
Within
±
10.0%
5.0% or less
1,000MΩ or 50MΩ⋅µF, whichever is smaller
Based on paragraph 9.10
Test temperature : Max. operating temp.
Applied voltage : rated voltage
×
200%
Test time
: 1,000 to 1,048 hrs.
Capacitance measured after 48
±
4 hrs.
Based on paragraph 9.9
Test temperature : 40
±
2°C
Relative humidity : 90% to 95%
Applied voltage : rated voltage
Test time
: 500 to 524 hrs.
Capacitance measured after 48
±
4 hrs.
Based on paragraph 9.3
Number of cycles : 5
Capacitance measured after 48
±
4 hrs.
Based on paragraph 8.14.
Soldering temperature: 260
±
5°C
Soldering time
: 5
±
0.5s
Preheating
: 150
±
10°C for
1 to 2 min.
∗The
design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification.
MNA14
Ceramic capacitors
!Packaging
specifications
(Units : mm)
Taping
t
φJ
E
A
D
B
C
Reel
9.0 ± 0.3
11.4 ± 1.0
(Paper taping)
Pulling direction
Symbol
Dimensions
C
D
E
F
G
H
J
t
t1
3.5 1.75 4.0 2.0 4.0
φ1.5
1.05 1.2
8.0
±0.3 ±0.05 ±0.1 ±0.1 ±0.05 ±0.1
+0.1
MAX. MAX.
0
Label position
Size
Symbol
A
B
(φ180mm reel)
1608
×
4
2.0
±0.1
3.5
±0.1
EIAJ ET-7200A compliant
∗The
design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification.
0
φ180
−1.5
t1
F
G
H
φ13
± 0.2
−0
φ
60
+1
单片机
京公网安备 11010802033920号
Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved
电子工程世界
