SN54AC00-SP
www.ti.com
.............................................................................................................................................................................................
SCHS367 – OCTOBER 2008
RAD-TOLERANT CLASS V, QUADRUPLE 2-INPUT POSITIVE-NAND GATE
1
FEATURES
2-V to 6-V V
CC
Operation
Inputs Accept Voltages to 6 V
Max t
pd
of 7 ns at 5 V
Rad-Tolerant: 50 KRad(Si) TID
(1)
– TID Dose Rate < 2 mRad/sec
QML-V Qualified, SMD 5962-87549
Radiation tolerance is a typical value based upon initial device qualification. Radiation Lot Acceptance Testing is available - contact
factory for details.
J OR W PACKAGE
(TOP VIEW)
•
•
•
•
•
(1)
1A
1B
1Y
2A
2B
2Y
GND
1
2
3
4
5
6
7
14
13
12
11
10
9
8
V
CC
4B
4A
4Y
3B
3A
3Y
DESCRIPTION/ORDERING INFORMATION
The SN54AC00 device contains four independent 2-input NAND gates. Each gate performs the Boolean function
of Y = A • B or Y = A + B in positive logic.
ORDERING INFORMATION
T
A
–55°C to 125°C
(1)
(2)
CDIP – J
CFP – W
PACKAGE
(1) (2)
Tube
Tube
ORDERABLE PART NUMBER
5962-8754903VCA
5962-8754903VDA
TOP-SIDE MARKING
5962-8754903VCA
5962-8754903VDA
Package drawings, thermal data, and symbolization are available at
www.ti.com/packaging.
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at
www.ti.com.
FUNCTION TABLE
(Each Gate)
INPUTS
A
H
L
X
B
H
X
L
OUTPUT
Y
L
H
H
LOGIC DIAGRAM (POSITIVE LOGIC)
A
B
1
Y
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2008, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are
tested unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
SN54AC00-SP
SCHS367 – OCTOBER 2008
.............................................................................................................................................................................................
www.ti.com
ABSOLUTE MAXIMUM RATINGS
(1)
over operating free-air temperature range (unless otherwise noted)
MIN
V
CC
V
I
V
O
I
IK
I
OK
I
O
Supply voltage range
Input voltage range
(2)
Output voltage range
Input clamp current
Output clamp current
Continuous output current
Continuous current through V
CC
or GND
θ
JA
T
stg
(1)
(2)
(3)
Package thermal impedance
(3)
Storage temperature range
J package
W package
–65
150
(2)
MAX
7
V
CC
+ 0.5
V
CC
+ 0.5
±20
±20
±50
±200
UNIT
V
V
V
mA
mA
mA
mA
°C/W
°C
–0.5
–0.5
–0.5
V
I
< 0 or V
I
> V
CC
V
O
< 0 or V
O
> V
CC
V
O
= 0 to V
CC
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating
conditions” is not implied. Exposure to absolute–maximum–rated conditions for extended periods may affect device reliability.
The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
The package thermal impedance is calculated in accordance with JESD 51-7.
RECOMMENDED OPERATING CONDITIONS
MIN
V
CC
V
IH
Supply voltage
V
CC
= 3 V
High-level input voltage
V
CC
= 4.5 V
V
CC
= 5.5 V
V
CC
= 3 V
V
IL
V
I
V
O
I
OH
Low-level input voltage
Input voltage
Output voltage
V
CC
= 3 V
High-level output current
V
CC
= 4.5 V
V
CC
= 5.5 V
V
CC
= 3 V
I
OL
Δt/Δv
T
A
Low-level output current
Input transition rise or fall rate
Operating free-air temperature
–55
V
CC
= 4.5 V
V
CC
= 5.5 V
V
CC
= 4.5 V
V
CC
= 5.5 V
0
0
2
2.1
3.15
3.85
0.9
1.35
1.65
V
CC
V
CC
12
24
24
12
24
24
8
125
ns/V
°C
mA
mA
V
V
V
V
MAX
6
UNIT
V
2
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SN54AC00-SP
Copyright © 2008, Texas Instruments Incorporated
SN54AC00-SP
www.ti.com
.............................................................................................................................................................................................
SCHS367 – OCTOBER 2008
ELECTRICAL CHARACTERISTICS
over recommended operating free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
V
CC
3V
I
OH
= –50
µA
V
OH
I
OH
= –12 mA
I
OH
= –24 mA
I
OH
= –50 mA
I
OL
= 50
µA
V
OL
I
OL
= 12 mA
I
OL
= 24 mA
I
OL
= 50 mA
I
I
I
CC
C
i
(1)
(1)
(1)
T
A
= 25°C
MIN
2.9
4.4
5.4
2.56
3.86
4.86
0.1
0.1
0.1
0.36
0.36
0.36
±0.1
4
2.6
TYP
MAX
MIN
2.9
4.4
5.4
2.4
3.7
4.7
3.85
MAX
UNIT
4.5 V
5.5 V
3V
4.5 V
5.5 V
5.5 V
3V
4.5 V
5.5 V
3V
4.5 V
5.5 V
5.5 V
5.5 V
5.5 V
5V
V
0.1
0.1
0.1
0.5
0.5
0.5
1.65
±1
40
µA
µA
pF
V
V
I
= V
CC
or GND
V
I
= V
CC
or GND, I
O
= 0
V
I
= V
CC
or GND
Not more than one output should be tested at a time, and the duration of the test should not exceed 2 ms.
SWITCHING CHARACTERISTICS
over recommended operating free-air temperature range, V
CC
= 3.3 V ± 0.3 V (unless otherwise noted) (see
Figure 1)
PARAMETER
t
PLH
t
PHL
FROM
(INPUT)
A or B
TO
(OUTPUT)
Y
T
A
= 25°C
MIN
2
1.5
TYP
7
5.5
MAX
9.5
8
MIN
1
1
MAX
11
9
UNIT
ns
SWITCHING CHARACTERISTICS
over recommended operating free-air temperature range, V
CC
= 5 V ± 0.5 V (unless otherwise noted) (see
Figure 1)
PARAMETER
t
PLH
t
PHL
FROM
(INPUT)
A or B
TO
(OUTPUT)
Y
T
A
= 25°C
MIN
1.5
1.5
TYP
6
4.5
MAX
8
6.5
MIN
1
1
MAX
8.5
7
UNIT
ns
OPERATING CHARACTERISTICS
V
CC
= 5 V, T
A
= 25°C
PARAMETER
C
pd
Power dissipation capacitance
TEST CONDITIONS
C
L
= 50 pF, f = 1 MHz
TYP
40
UNIT
pF
Copyright © 2008, Texas Instruments Incorporated
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Product Folder Link(s):
SN54AC00-SP
3
SN54AC00-SP
SCHS367 – OCTOBER 2008
.............................................................................................................................................................................................
www.ti.com
PARAMETER MEASUREMENT INFORMATION
TEST
t
PLH
/t
PHL
S1
Open
Input
(see Note B)
t
PLH
In-Phase
Output
t
PHL
Out-of-Phase
Output
LOAD CIRCUIT
50% V
CC
50% V
CC
V
CC
50% V
CC
50% V
CC
0V
t
PHL
V
OH
50% V
CC
V
OL
t
PLH
V
OH
50% V
CC
V
OL
2
×
V
CC
From Output
Under Test
C
L
= 50 pF
(see Note A)
500
Ω
S1
Open
500
Ω
VOLTAGE WAVEFORMS
NOTES: A. C
L
includes probe and jig capacitance.
B. All input pulses are supplied by generators having the following characteristics: PRR
≤
1 MHz, Z
O
= 50
Ω,
t
r
≤
2.5 ns, t
f
≤
2.5 ns.
C. The outputs are measured one at a time with one input transition per measurement.
Figure 1. Load Circuit and Voltage Waveforms
4
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Product Folder Link(s):
SN54AC00-SP
Copyright © 2008, Texas Instruments Incorporated
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