SurgX
®
41206 Four Element Array
Polymer ESD Suppressor
Features:
• Exceeds testing requirements outlined in IEC 61000-4-2
• Extremely low capacitance
• Very low leakage current
• Fast response time
• Bi-directional
• Surface mount
• Nickel & Tin/Lead plated
Description:
The SurgX product family is specifically designed to
protect sensitive electronic circuits from the threat of
electrostatic discharge (ESD). SurgX products react
almost instantly to the transient voltage and effectively
clamp it below 60 V, meaning less voltage stress during
the clamp period and greater IC protection. The design
of SurgX products inherently produces a low capaci-
tance part. In the off-state SurgX is virtually invisible to
the circuit. Installed from signal line to ground, the
SurgX device exhibits a high impedance and low
capacitance that makes it transparent to high speed
digital circuits. Signals are not distorted or disrupted.
With SurgX devices, waveform definition stays true and
high-speed signals do not suffer. SurgX products uti-
lize a unique polymer-based material. The nature of
the material creates a bi-directional part, which means
that only one device is required to provide complete
ESD protection regardless of the surge polarity. The
combination of this material with proven thick film on
ceramic technology produces a reliable, surface mount
product that will help protect mobile communications,
computers, data processing, test equipment, and many
other electronic applications from ESD.
Part Ratings and Characteristics:
Performance Characteristics
Continuous operating voltage
Clamping voltage
1
Trigger voltage
2
ESD voltage capability
4
Capacitance (@ 1 MHz)
Leakage current (@ 6 VDC)
Peak current
1,4
Units
VDC
V
V
kV
pF
nA
A
°C
# pulses
Min
-
-
-
-
-
-
-40
20
Typ
-
35
150
8
0.25
<10
30
+25
-
Max
6
60
300
15
1
<100
45
+85
-
Notes:
1. Per IEC 61000-4-2, 30A @ 8kV,
level 4, clamp measurement made
30 ns after initiation of pulse, all
tests in contact discharge mode.
2. Trigger measurement made using
TLP method (see page 5).
3. Parts will remain within the specifica-
tions listed in the above table after a
minimum of 20 ESD pulses.
4. SurgX devices are capable of with-
standing up to a 15 kV, 45 A ESD
pulse. Device ratings are given at 8
kV per Note 1, unless otherwise
specified.
Operating temperature
ESD pulse withstand
1,3
Environmental Specifications:
• Humidity, steady state: MIL-STD-202F, Method 103B, 90-95% RH, 40°C, 96 hrs.
• Thermal shock: MIL-STD-202, Method 107G, -65°C to 125°C, 30 min. cycle, 5 cycles
• Vibration: MIL-STD-202F, Method 201A,(10 to 55 to 10 Hz, 1 min. cycle, 2 hrs each in X-Y-Z)
• Chemical resistance: ASTM D-543, 24 hrs @ 50°C, 3 solutions (H
2
O, detergent solution, defluxer)
• Full load voltage: 24 VDC, 1000 hrs, 25°C
• Solder leach resistance and terminal adhesion: Per EIA-576
• Solderability: MIL-STD-202, Method 208 (95% coverage)
SurgX
®
41206 Four Element Array
Polymer ESD Suppressor
Definition of Terms
Clamping Voltage -
The voltage at which the SurgX device stabilizes
during the transition from high to low impedance. This is the voltage
experienced by the circuit, after stabilizing, for the duration of the ESD
transient.
Trigger Voltage -
The voltage at which the SurgX device begins to
function. When the ESD threat voltage reaches this level, the SurgX
device begins the transition from high impedance to low impedance,
shunting the ESD energy to ground.
Threat Voltage -
The voltage that the test equipment is set to operate
(i.e. the voltage across the discharge capacitor).
Generalized IV Curve
(150 ns pulse, see tables and graphs for numbers)
Product Dimension
mm (inches)
W
V
c
= Clamping Voltage
V
T
= Trigger Voltage
L
Recommended Solder
Pad Outline
(per IPC-SM-782)
A
C
D
0.7
(.028)
H
0.5
(.020)
0.8
(.031)
B
L
3.2±0.2
(.126±.008)
W
1.6±0.2
(.063±.008)
H
0.8 max
(.032 max)
A
0.4±0.05
(.016±.002)
B
0.8 Typ.
(.031 Typ.)
C
0.4 Typ.
(.016 Typ.)
D
0.2±0.1
(.008±.004)
0.8
(.031)
Tape-and-Reel Specification
4.0±0.1
(.157±.004)
B
2.0±0.05
(.079±.002)
3.5±0.05
(.138±.002)
8.0±0.2
(.315±.008)
1.0±0.2
(.040±.008)
mm (inches)
A
4.0±0.1
(.157±.004)
1.5+0.1/-0
(.056+.004/-0)
1.75±0.1
(.059±.004)
20.5
(.807)
2.0
(.080)
60.0±1.0
(2.362±.040)
178.0±2.0
(7.008±.080)
Dimension
A
B
3.5+0.2
(.138+.008)
1.9+0.2
(.075+.008)
13.0±0.5
(.512±.020)
10.0±1.5
(.394±.059)
2
SurgX
®
41206 Four Element Array
Polymer ESD Suppressor
Test Methodology
Full product characterization requires testing in a variety of scenarios. Different test methods reveal unique information
about the device response. Evaluating the results for all of the tests is crucial to fully understanding the device operation.
Two different test methods have been employed to understand the SurgX device response to an overvoltage event.
Electrostatic Discharge (ESD) Pulse
The ESD pulse is the defining test for an ESD protective device. The ESD pulse is an extremely fast rising
transient event. The pulse, as characterized in IEC 61000-4-2, has a rise time of less than 1 ns, peak currents up
to 45 A, and voltage levels to 15 kV. Characteristics determined by this test are those such as voltage overshoot,
peak voltage, clamping voltage, and peak current.
Due to the extremely fast rate of rise of the ESD pulse, the test setup can have a definite impact on the above
factors. Variables such as wiring inductance and probe capacitance can produce inaccurate readings on an
otherwise capable oscilloscope.
Transmission Line Pulse (TLP)
The transmission line tester implements a controlled impedance cable to deliver a square wave current pulse. The
advantage of this technique is that the constant current of the square wave allows the behavior of the protection
structure to be more accurately studied.
The actual implementation of this technique produces a waveform that has a slightly slower rise time than the ESD
pulse but can be correlated to deliver approximately the same surge current and energy. This controlled
impedance pulse provides a more accurate depiction of the trigger voltage of the device because of the reduced
voltage overshoot caused by a fast rising transient and the reactive components of the test fixture.
Device Application
SurgX devices are applicable to most signal line circuits. It is applied in a shunt-connected manner. SurgX devices are not
applicable on lines where lightning or load switching transients are present. SurgX devices are ideal for use in computers
and computer-related equipment, such as modems, keyboards, and printers. SurgX devices are also well suited for
portable electronic equipment such as mobile telephones, test equipment, and card scanners.
Typical Applications
Data Bus
In From
Peripheral
Device
41206ESDA
SurgX
Device (2)
Out to
Peripheral
Device
To
Logic
Circuitry
Driver/
Receiver
IC
Normal
Current
Signal Line In
From
Logic
Circuitry
IC
Chip
ESD
TVS
ESD
TVS
Supply Voltage
Normal
Current
Signal Line Out
Current Flow Under
Surge Conditions
5
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