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GS4576C18GL-33T

产品描述DDR DRAM, 32MX18, CMOS, PBGA144, ROHS COMPLIANT, UBGA-144
产品类别存储    存储   
文件大小2MB,共62页
制造商GSI Technology
官网地址http://www.gsitechnology.com/
下载文档 详细参数 全文预览

GS4576C18GL-33T概述

DDR DRAM, 32MX18, CMOS, PBGA144, ROHS COMPLIANT, UBGA-144

GS4576C18GL-33T规格参数

参数名称属性值
零件包装代码BGA
包装说明TFBGA,
针数144
Reach Compliance Codecompliant
ECCN代码3A991.B.2.B
访问模式MULTI BANK PAGE BURST
其他特性AUTO/SELF REFRESH
JESD-30 代码R-PBGA-B144
长度18.5 mm
内存密度603979776 bit
内存集成电路类型DDR DRAM
内存宽度18
功能数量1
端口数量1
端子数量144
字数33554432 words
字数代码32000000
工作模式SYNCHRONOUS
最高工作温度70 °C
最低工作温度
组织32MX18
封装主体材料PLASTIC/EPOXY
封装代码TFBGA
封装形状RECTANGULAR
封装形式GRID ARRAY, THIN PROFILE, FINE PITCH
认证状态Not Qualified
座面最大高度1.2 mm
自我刷新YES
最大供电电压 (Vsup)1.9 V
最小供电电压 (Vsup)1.7 V
标称供电电压 (Vsup)1.8 V
表面贴装YES
技术CMOS
温度等级COMMERCIAL
端子形式BALL
端子节距0.8 mm
端子位置BOTTOM
宽度11 mm
Base Number Matches1

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GS4576C09/18/36L
144-Ball
BGA
Commercial Temp
Industrial Temp
Features
• Pin- and function-compatible with Micron RLDRAM® II
• 533 MHz DDR operation (1.067Gb/s/pin data rate)
• 38.4 Gb/s peak bandwidth (x36 at 533 MHz clock frequency)
• 16M x 36, 32M x 18, and 64M x 9 organizations available
• 8 banks
• Reduced cycle time (15 ns at 533 MHz)
• Address Multiplexing (Nonmultiplexed address option
available)
• SRAM-type interface
• Programmable Read Latency (RL), row cycle time, and burst
sequence length
• Balanced Read and Write Latencies in order to optimize data
bus utilization
• Data mask for Write commands
• Differential input clocks (CK, CK)
• Differential input data clocks (DKx, DKx)
• On-chip DLL generates CK edge-aligned data and output
data clock signals
• Data valid signal (QVLD)
• 32 ms refresh (16K refresh for each bank; 128K refresh
command must be issued in total each 32 ms)
• 144-ball
BGA
package
• HSTL I/O (1.5 V or 1.8 V nominal)
• 25–60 matched impedance outputs
• 2.5 V V
EXT
, 1.8 V V
DD
, 1.5 V or 1.8 V V
DDQ
I/O
• On-die termination (ODT) R
TT
• Commerical and Industrial Temperature
Commercial (+0°
T
C
+95°C)
Industrial (–40°
T
C
+95°C)
64M x 9, 32M x 18, 16M x 36
576Mb CIO Low Latency DRAM (LLDRAM II)
Introduction
533 MHz–300 MHz
2.5 V V
EXT
1.8 V V
DD
1.5 V or 1.8 V V
DDQ
The GSI Technology 576Mb Low Latency DRAM
(LLDRAM II) is a high speed memory device designed for
high address rate data processing typically found in networking
and telecommunications applications. The 8-bank architecture
and low tRC allows access rates formerly only found in
SRAMs.
The Double Data Rate (DDR) I/O interface provides high
bandwidth data transfers, clocking out two beats of data per
clock cycle at the I/O balls. Source-synchronous clocking can
be implemented on the host device with the provided free-
running data output clock.
Commands, addresses, and control signals are single data rate
signals clocked in by the True differential input clock
transition, while input data is clocked in on both crossings of
the input data clock(s).
Read and Write data transfers always in short bursts. The burst
length is programmable to 2, 4 or 8 by setting the Mode
Register.
The device is supplied with 2.5 V V
EXT
and 1.8 V V
DD
for the
core, and 1.5 V or 1.8 V for the HSTL output drivers.
Internally generated row addresses facilitate bank-scheduled
refresh.
The device is delivered in an efficent
BGA
144-ball package.
Rev: 1.04 11/2013
1/62
© 2011, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.

 
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