HS-0508RH, HS-0509RH
Data Sheet
August 1999
File Number
3977.2
Radiation Hardened Single 8/Differential
4-Channel CMOS Analog Multiplexers
These radiation hardened monolithic CMOS multiplexers
each include an array of eight analog switches, a digital
decode circuit for channel selection, a voltage reference for
logic thresholds, and an ENABLE input for device selection
when several multiplexers are present.
The Dielectric Isolation (DI) process used in fabrication of
these devices eliminates the problem of latch-up. Also, DI
offers much lower substrate leakage and parasitic
capacitance than conventional junction-isolated CMOS.
Switches are guaranteed to break-before-make, so that two
channels are never shorted together. The switching
threshold for each digital input is established by an internal
+5V reference, providing a guaranteed minimum 2.4V for
logic “1” and maximum 0.8 for logic “0”. This allows direct
interface without pull-up resistors to signals from most logic
families: CMOS, TTL, DTL and some PMOS. For protection
against transient overvoltage, the digital inputs include a
series 200Ω resistor and a diode clamp to each supply. The
HS-0508RH is an eight channel single-ended multiplexer,
and the HS-0509RH is a four channel differential version. If
input overvoltage protection is needed, the HS-0548RH and
HS-0549RH multiplexers are recommended.
Specifications for Rad Hard QML devices are controlled
by the Defense Supply Center in Columbus (DSCC). The
SMD numbers listed here must be used when ordering.
Detailed Electrical Specifications for these devices are
contained in SMD 5962-95692. A “hot-link” is provided
on our homepage for downloading.
http://www.intersil.com/spacedefense/space.htm
Features
• Electrically Screened to SMD # 5962-95692
• QML Qualified per MIL-PRF-38535 Requirements
• Gamma Dose . . . . . . . . . . . . . . . . . . . . . . 1 x 10
4
RAD(Si)
• No Latch-Up
• No Channel Interaction During Overvoltage
• Low On Resistance . . . . . . . . . . . . . . . . . . . . <200Ω (Typ)
• 44V Maximum Power Supply
• Break-Before-Make Switch
• Analog Signal Range . . . . . . . . . . . . . . . . . . . . . . . .
±15V
• Access Time. . . . . . . . . . . . . . . . . . . . . . . . . <300ns (Typ)
Applications
• Data Acquisition Systems
• Control Systems
• Telemetry
Ordering Information
ORDERING NUMBER
5962D9569201VEA
5962D9569201VEC
5962D9569202VEA
5962D9569202VEC
INTERNAL
MKT. NUMBER
HS1-0508RH-Q
HS1B-0508RH-Q
HS1-0509RH-Q
HS1B-0509RH-Q
TEMP. RANGE
(
o
C)
-55 to 125
-55 to 125
-55 to 125
-55 to 125
Pinouts
HS-0508RH GDIP1-T16 (CERDIP)
OR CDIP2-T16 (SBDIP)
TOP VIEW
HS-0509RH GDIP1-T16 (CERDIP)
OR CDIP2-T16 (SBDIP)
TOP VIEW
A0 1
ENABLE 2
-VSUPPLY 3
IN 1 4
IN 2 5
IN 3 6
IN 4 7
OUT 8
16 A1
15 A2
14 GND
13 +VSUPPLY
12 IN 5
11 IN 6
10 IN 7
9 IN 8
A0 1
ENABLE 2
-VSUPPLY 3
IN 1A 4
IN 2A 5
IN 3A 6
IN 4A 7
OUTA 8
16 A1
15 GND
14 +VSUPPLY
13 IN 1B
12 IN 2B
11 IN 3B
10 IN 4B
9 OUT B
1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
http://www.intersil.com or 407-727-9207
|
Copyright
©
Intersil Corporation 1999
HS-0508RH, HS-0509RH
Burn-In/Life Test Circuits
V1
F0
F3
V1
D1
C1
5
6
R1
7
8
12
D2
11
10
9
R1
C2
6
7
8
11
10
9
1
2
3
4
16
15
14
13
V2
D1
C1
5
12
D2
C2
F1
F2
V2
1
2
3
4
16
15
14
13
V3
HS-0508RH
DYNAMIC BURN-IN AND LIFE TEST CIRCUIT
V1 =
V2 =
R1 =
C1 =
D1 =
F0 =
F1 =
F2 =
F3 =
-15V maximum, -16V minimum
+15V minimum, +16V maximum
10kΩ
±5%
1/4W
C2 = 0.01µF minimum (per socket) or 0.1µF minimum (per row)
D2 = 1N4002 (or equivalent)
100kHz 50% duty cycle; VIL = 0.8V max; VIH = 4.0V min.
F0/2
F1/2
F2/2
V1 =
V2 =
V3 =
R1 =
C1 =
D1 =
HS-0508RH
STATIC BURN-IN TEST CIRCUIT
5V minimum, 6V maximum
-15V maximum, -16V minimum
+15V minimum, +16V maximum
10kΩ
±5%
1/4W
C2 = 0.01µF minimum (per socket) or 0.1µF minimum (per row)
D2 = 1N4002 (or equivalent)
F0
F2
V3
D1
C1
1
2
3
4
5
6
7
8
16
15
14
13
F1
1
2
V2
V3
D1
C1
3
4
16
15
14
13
V1
V2
D1
C1
D1
12
11
10
9
R1
C1
5
6
7
8
12
11
10
9
R1
R1
R1
HS-0509RH
DYNAMIC BURN-IN AND LIFE TEST CIRCUIT
V2 =
V3 =
R1 =
C1 =
D1 =
F0 =
+15.5V,
±.0.5V
-15.5V,
±0.5V
10kΩ,
±5%
0.1µF minimum (per socket)
1N4002 or equivalent (per board)
100kHz,
±10%;
F1 = F0/2; F2 = F1/2, 50% duty cycle,
VIL = 0.8V max.; VIH = 4.0V min.
V1 =
V2 =
V3 =
R1 =
C1 =
D1 =
HS-0509RH
STATIC BURN-IN TEST CIRCUIT
+5.5V,
±0.5V
+15.5V,
±0.5V
-15.5V,
±0.5V
10kΩ,
±10%
0.1µF minimum (per socket)
1N4002 or equivalent (per board)
4
嵌入式系统
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