SCOPE:
Serial-Output, 250 ksps 12-Bit ADC with Track/Hold and Reference
Generic Number
MAX176AM(x)/883B
MAX176BM(x)/883B
Device Type
01
02
Case Outline(s).
The case outlines shall be designated in Mil-Std-1835 and as follows:
Outline Letter
Mil-Std-1835
JA
GDIP1-T8 or CDIP2-T8
LP
CQCC1-N20
Case Outline
Package Code
8 LEAD CERDIP
J08
20-Pin LCC
L20
Absolute Maximum Ratings
V
DD
to GND ................................................................................................... -0.3V to +7V
V
SS
to GND .................................................................................................. +0.3V to -17V
AIN to GND ...............................................................................................................
±15V
Digital Input Voltage to GND .......................................................... -0.3V to (V
DD
+0.3V)
Digital Output Voltage to GND ....................................................... -0.3V to (V
DD
+0.3V)
Lead Temperature (soldering, 10 seconds) ................................................................. +300°C
Storage Temperature .................................................................................... -65°C to +160°C
Continuous Power Dissipation .............................................................................. T
A
=+70°C
8 pin CERDIP(derate 8.0mW/°C above +70°C) ......................................................... 640mW
20 pin LCC(derate 9.1mW/°C above +70°C) ............................................................. 727mW
Junction Temperature T
J
......................................................................................…. +150°C
Thermal Resistance, Junction to Case,
ΘJC
8 pin CERDIP..................................................................................................….. 55°C/W
20 pin LCC ......................................................................................................…. 20°C/W
Thermal Resistance, Junction to Ambient,
ΘJA:
8 pin CERDIP.................................................................................................…. 125°C/W
20 pin LCC .....................................................................................................…. 110°C/W
Recommended Operating Conditions
Ambient Operating Range (T
A
) .........................................................……. -55°C to
+125°C
Supply Voltage (V
CC
)........................................................................…….. +4.75V to +5.25V
Supply Voltage (V
EE
).........................................................................……. -11.4V to -15.75V
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
----------------------------
Electrical Characteristics of MAX176/883B
19-0293
Page 2 of
Rev. B
6
TABLE 1. ELECTRICAL TESTS:
CONDITIONS
-55
°C
<=T
A
<= +125°C
TEST
Symbol
V
DD
=+5V±5%, V
SS
=-11.4V to -
15.75V, f
CLK
=3MHz
Unless otherwise specified
ACCURACY
Resolution
RES
Guaranteed Monotonic over temp
Differential Nonlinearity
DNL
NOTE 1
Integral Nonlinearity
Integral Nonlinearity
Offset Error
Full-Scale Error
ANALOG INPUTS
Input Voltage Range
Input Current
Input Capacitance
INTERNAL
REFERENCE
V
REF
Output Voltage
V
REF
Output Tempco
Load Regulation
POWER SUPPLY
REJECTION
Positive Supply Rejection
Negative Supply
Rejection
LOGIC INPUTS
Logic High Voltage
Logic Low Voltage
Input Current
Input Capacitance
LOGIC OUTPUTS
Output High Voltage
Output Low Voltage
POWER
REQUIREMENTS
Positive Supply Current
Negative Supply Current
TIMING
NOTE 7
Clock Pulse Width
CONVST Pulse Width
INL
INL
V
OS
AE
NOTE 1
NOTE 1
NOTE 1, NOTE 2 For JA pkg.
NOTE 1, NOTE 2 For LP pkg.
NOTE 3
Group A
Subgroup
Device
type
Limits
Min
Limits
Max
Units
1,2,3
1,2,3
All
01
02
01
02
All
All
All
All
All
12
±0.75
±1.0
±0.5
±0.75
±1.0
±3.0
±5.0
±8.0
-5
+5
2.5
10
Bits
LSB
LSB
LSB
LSB
LSB
V
mA
pF
1
2,3
1,2,3
1,2,3
1
1,2,3
1,2,3
4
Note 4
NOTE 5
NOTE 6 0mA<I
L
<5mA
1,2,3
1,2,3
1,2,3
All
All
All
-4.98
-5.02
±40
5
±0.5
±0.5
±0.5
V
ppm/°C
mW
V
DD
V
SS
FS change, V
SS
=-15V or -12V,
V
DD
=5V±5%
FS change, V
SS
=-15V or -12V
V
DD
=5V
V
SS
=-15V or -12V
(CLK, CONVST)
1,2,3
1,2,3
All
All
LSB
LSB
V
IH
V
IL
I
IN
C
IN
V
OH
V
OL
V
IN
=0V or V
DD
NOTE 4
Data I
SOURCE
=200µA
Data I
SINK
=1.6mA
1,2,3
1,2,3
1,2,3
4
1,2,3
1,2,3
All
All
All
All
All
All
+2.4
+0.8
±5
10
4.0
0.4
V
V
µA
pF
V
V
I
DD
I
SS
t
CH
t
CL
t
SH
t
SL
t
SC0
t
SC1
t
PD
t
AQ
CONVST=V
DD
, AIN=0V
CONVST=V
DD
, AIN=0V
Clock High
Clock Low
Clock High
Clock Low
Leading clock
Leading clock +1
NOTE 8
FS change at AIN
NOTE 4
NOTE 9
1,2,3
1,2,3
9,10,11
9,10,11
All
All
All
All
8
-11
50
100
50
150
30
mA
mA
ns
ns
CONVST to Clock Skew
Clock to Data Delay
Acquisition Time
CONVST Rise Time
Output Float Delay
9,10,11
9,10,11
NOTE 4
9,10,11
9,10,11
9,10,11
All
All
All
All
All
ns
160
20
170
400
100
120
Rev. B
6
ns
ns
ns
ns
----------------------------
Electrical Characteristics of MAX176 /883B
19-0293
Page 3 of
TEST
Symbol
DYNAMIC TESTS
CONDITIONS
-55
°C
<=T
A
<= +125°C
V
DD
=+5V±5%, V
SS
=-11.4V to -
15.75V, f
CLK
=3MHz
Unless otherwise specified
(AIN=10Vp-p, f
AIN
=50.17kHz,
f
SAMPLING
=200ksps
Group A
Subgroup
Device
type
Limits
Min
Limits
Max
Units
9,10,11
All
Signal -to-Noise Plus
S/(N+D)
70
Distortion
9,10,11
All
Total Harmonic
THD
-80
Distortion
9,10,11
All
Peak Harmonic or
SFDR
-80
Spurious Noise
9,10,11
All
Input Slew Rate
1.5
9,10,11
All
Conversion Time
t
CONV
14 clock cycles
4.7
9,10,11
All
Acquisition Time
t
AQ
NOTE 4
400
9,10,11
All
Clock Frequency
f
CLK
0.1
3.0
NOTE 1: These tests are performed at V
DD
=+5V, V
SS
=-15V. Operation over supply is guaranteed by supply
rejection tests.
NOTE 2: Offset measured at 0...00 to 0...01 digital output code.
NOTE 3: FS=+5.000V. Ideal last code transition = FS-3/2 LSB. Adjusted for offset error.
NOTE 4: Guaranteed by design. Not subject to test.
NOTE 5: V
REF
Tempco=∆V
REF
/∆T, where
∆V
REF
is reference voltage change from
25°C to +125°C or -55°C.
NOTE 6: Output current should not change during conversion.
NOTE 7: Timing Specifications are 100% tested. All input control signals are specified with tR=tF=5ns
(10% to 90% of +5V) and timed from a voltage level of +1.6V. Output delays are measured to
0.8V if going low and 2.4V if going high.
NOTE 8: DATA pin is loaded with 50pF to GND.
NOTE 9: DATA pin is loaded with 10pF3kΩ. Defined as the time required for data lines to change 0.5V.
dB
dB
dB
V/µs
µs
ns
MHz
TERMINAL CONNECTIONS:
20 PIN LCC
1
V
DD
2
V
DD
3
NC
4
NC
5
A
IN
6
V
REF
7
NC
8
NC
9
GND
10
GND
11
GND
12
DATA
13
NC
14
NC
15
NC
16
CLOCK
17
CONVST
18
19
20
NC
NC
V
SS
Positive Supply, +5V
Positive Supply, +5V
No Connect
No Connect
Analog Input, 0V to +5V Unipolar
Reference Voltage Output, -5.0V
No Connect
No Connect
Ground
Ground
Ground
Serial Data Output
No Connect
No Connect
No Connect
Clock Input, TTL/+5V CMOS compatible.
Conversion start input for three wire mode.
End-of-conversion output for two wire mode.
No Connect
No Connect
Negative Supply, -12V or -15V.
----------------------------
Electrical Characteristics of MAX176/883B
19-0293
Page 4 of
Rev. B
6
TERMINAL CONNECTIONS:
8 PIN CERDIP
1
V
DD
2
A
IN
3
V
REF
4
GND
5
DATA
6
CLOCK
7
CONVST
8
V
SS
Positive Supply, +5V
Analog Input, 0V to +5V Unipolar
Reference Voltage Output, -5.0V
Ground
Serial Data Output
Clock Input, TTL/+5V CMOS compatible.
Conversion start input for three wire mode.
End-of-conversion output for two wire mode.
Negative Supply, -12V or -15V.
Package
8 pin CERDIP
20 pin LCC
QUALITY ASSURANCE
ORDERING INFORMATION:
MAX176AMJA/883B
MAX176AMLP/883B
MAX176BMJA/883B
MAX176BMLP/883B
Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in Mil-
Std-883.
Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 1015:
1. Test Condition, A, B, C, or D.
2. TA = +125°C minimum.
3. Interim and final electrical test requirements shall be specified in Table 2.
Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std-883, including Groups A, B,
C, and D inspection.
Group A inspection:
1. Tests as specified in Table 2.
2. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted.
Group C and D inspections:
a. End-point electrical parameters shall be specified in Table 1.
b. Steady-state life test, Method 1005 of Mil-Std-883:
1. Test condition A, B, C, D.
2. TA = +125°C, minimum.
3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883.
TABLE 2.
ELECTRICAL TEST REQUIREMENTS
Mil-Std-883 Test Requirements
Interim Electric Parameters
Method 5004
Final Electrical Parameters
Method 5005
Group A Test Requirements
Method 5005
Group C and D End-Point Electrical Parameters
Method 5005
*
**
PDA applies to Subgroup 1 only.
Guaranteed by design.
Electrical Characteristics of MAX176/883B
19-0293
Page 5 of
Rev. B
6
Subgroups
per Method 5005, Table 1
1
1*, 2, 3, 4*, 9, 10, 11
1, 2, 3, 4*, 9, 10, 11
1
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