GAL22V10/883
High Performance E
2
CMOS PLD
Generic Array Logic™
Features
• HIGH PERFORMANCE E
2
CMOS
®
TECHNOLOGY
— 10 ns Maximum Propagation Delay
— Fmax = 166 MHz
— 7ns Maximum from Clock Input to Data Output
— TTL Compatible 12 mA Outputs
— UltraMOS
®
Advanced CMOS Technology
• ACTIVE PULL-UPS ON ALL PINS
• COMPATIBLE WITH STANDARD 22V10 DEVICES
— Fully Function/Fuse-Map/Parametric Compatible
with Bipolar and UVCMOS 22V10 Devices
• 50% REDUCTION IN POWER VERSUS BIPOLAR
• E CELL TECHNOLOGY
— Reconfigurable Logic
— Reprogrammable Cells
— 100% Tested/100% Yields
— High Speed Electrical Erasure (<100ms)
— 20 Year Data Retention
• TEN OUTPUT LOGIC MACROCELLS
— Maximum Flexibility for Complex Logic Designs
• PRELOAD AND POWER-ON RESET OF REGISTERS
— 100% Functional Testability
• APPLICATIONS INCLUDE:
— DMA Control
— State Machine Control
— High Speed Graphics Processing
— Standard Logic Speed Upgrade
• ELECTRONIC SIGNATURE FOR IDENTIFICATION
I
PRESET
Functional Block Diagram
I/CLK
RESET
8
OLMC
I/O/Q
I
10
OLMC
I
12
I/O/Q
I
OLMC
I/O/Q
PROGRAMMABLE
AND-ARRAY
(132X44)
14
OLMC
I
I/O/Q
2
16
OLMC
I
I/O/Q
I
16
OLMC
I/O/Q
I
14
OLMC
I/O/Q
I
12
OLMC
I/O/Q
I
10
OLMC
I/O/Q
I
8
OLMC
I/O/Q
Description
The GAL22V10/883 is a high performance E CMOS programmable
logic device processed in full compliance to MIL-STD-883. This
military grade device combines a high performance CMOS process
with Electrically Erasable (E
2
) floating gate technology to provide
the highest speed performance available of any military qualified
22V10 device. CMOS circuitry allows the GAL22V10 to consume
much less power when compared to bipolar 22V10 devices. E
2
technology offers high speed (<100ms) erase times, providing the
ability to reprogram or reconfigure the device quickly and efficiently.
The generic architecture provides maximum design flexibility by
allowing the Output Logic Macrocell (OLMC) to be configured by
the user. The GAL22V10 is fully function/fuse map/parametric com-
patible with standard bipolar and CMOS 22V10 devices.
Unique test circuitry and reprogrammable cells allow complete AC,
DC, and functional testing during manufacture. As a result, Lat-
tice Semiconductor delivers 100% field programmability and func-
tionality of all GAL products. In addition, 100 erase/write cycles and
data retention in excess of 20 years are specified.
2
Pin Configuration
CERDIP
LCC
I/CLK
I/O/Q
I/O/Q
Vcc
NC
I/CLK
I
I
25
I/O/Q
I/O/Q
1
24
Vcc
I/O/Q
I/O/Q
I
4
I
I
I
NC
I
I
I
11
12
9
7
5
I
2
28
26
I
I
I
I
I
I
I
I
GND
12
6
23
I/O/Q
NC
GAL
22V10
18
I/O/Q
I/O/Q
I/O/Q
I/O/Q
I/O/Q
I/O/Q
I/O/Q
I/O/Q
13
I
GAL22V10
Top View
14
16
21
I/O/Q
I/O/Q
19
18
I/O/Q
I/O/Q
Copyright © 1999 Lattice Semiconductor Corp. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject
to change without notice.
I/O/Q
GND
I
I
NC
I
LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A.
Tel. (503) 268-8000; 1-800-LATTICE; FAX (503) 268-8556; http://www.latticesemi.com
February 1999
22v10mil_04
1
Specifications
GAL22V10D/883
Absolute Maximum Ratings
(1)
Supply voltage V
CC
....................................... -0.5 to +7V
Input voltage applied ........................... -2.5 to V
CC
+1.0V
Off-state output voltage applied .......... -2.5 to V
CC
+1.0V
Storage Temperature ................................. -65 to 150°C
Case Temperature with
Power Applied ......................................... -55 to 125°C
1. Stresses above those listed under the “Absolute Maximum
Ratings” may cause permanent damage to the device. These
are stress only ratings and functional operation of the device
at these or at any other conditions above those indicated in
the operational sections of this specification is not implied
(while programming, follow the programming specifications).
Recommended Operating Conditions
Case Temperature (T
C
) ............................... -55 to 125°C
Supply Voltage (V
CC
)
with Respect to Ground ..................... +4.50 to +5.50V
DC Electrical Characteristics
Over Recommended Operating Conditions (Unless Otherwise Specified)
SYMBOL
PARAMETER
Input Low Voltage
Input High Voltage
Input or I/O Low Leakage Current
Input or I/O High Leakage Current
Output Low Voltage
Output High Voltage
Low Level Output Current
High Level Output Current
Output Short Circuit Current
Operating Power
Supply Current
V
CC
= 5V
V
OUT
= 0.5V T
A
= 25°C
L -10/-15/-20/-25/-30
0V
≤
V
IN
≤
V
IL
(MAX.)
3.5V
≤
V
IN
≤
V
CC
I
OL
= MAX.
Vin
=
V
IL
or
V
IH
I
OH
= MAX.
Vin
=
V
IL
or
V
IH
CONDITION
MIN.
Vss - 0.5
TYP.
3
—
—
—
—
—
—
—
—
—
90
MAX.
0.8
Vcc+1
-100
10
0.5
—
12
-2.0
-135
150
UNITS
V
V
µA
µA
V
V
mA
mA
mA
mA
V
IL
V
IH
I
IL
1
I
IH
V
OL
V
OH
I
OL
I
OH
I
OS
2
I
CC
2.0
—
—
—
2.4
—
—
-50
—
V
IL
= 0.5V
V
IH
= 3.0V
f
toggle
= 15MHz Outputs Open
1) The leakage current is due to the internal pull-up on all pins. See
Input Buffer
section for more information.
2) One output at a time for a maximum duration of one second. Vout = 0.5V was selected to avoid test problems caused by tester
ground degradation. Characterized but not 100% tested.
3) Typical values are at Vcc = 5V and T
A
= 25
°C.
2
Specifications
GAL22V10D/883
AC Switching Characteristics
Over Recommended Operating Conditions
TEST
COND.
1
A
A
—
—
—
A
-10
-15
UNITS
ns
ns
ns
ns
ns
MHz
PARAMETER
DESCRIPTION
Input or I/O to Combinatorial Output
Clock to Output Delay
Clock to Feedback Delay
Setup Time, Input or Feedback before Clock↑
Hold Time, Input or Feedback after Clock↑
Maximum Clock Frequency with
External Feedback, 1/(tsu + tco)
Maximum Clock Frequency with
Internal Feedback, 1/(tsu + tcf)
Maximum Clock Frequency with
No Feedback
Clock Pulse Duration, High
Clock Pulse Duration, Low
Input or I/O to Output Enabled
Input or I/O to Output Disabled
Input or I/O to Asynchronous Reset of Register
Asynchronous Reset Pulse Duration
Asynchronous Reset to Clock Recovery Time
Synchronous Preset to Clock Recovery Time
—
—
—
6
0
MIN. MAX. MIN. MAX.
10
7
7
—
—
—
—
—
—
12
0
50
15
8
8
—
—
—
t
pd
t
co
t
cf
2
t
su
t
h
76.9
f
max
3
A
A
76.9
166
—
—
50
62.5
—
—
MHz
MHz
t
wh
t
wl
t
en
t
dis
t
ar
t
arw
t
arr
t
spr
—
—
B
C
A
—
—
—
3
3
—
—
—
10
6
10
—
—
10
12
12
—
—
—
8
8
—
—
—
15
15
12
—
—
15
15
20
—
—
—
ns
ns
ns
ns
ns
ns
ns
ns
1) Refer to
Switching Test Conditions
section.
2) Calculated from
fmax
with internal feedback. Refer to
fmax Description
section.
3) Refer to
fmax Description
section.
Capacitance (TA = 25°C, f = 1.0 MHz)
SYMBOL
C
I
C
I/O
PARAMETER
Input Capacitance
I/O Capacitance
MAXIMUM*
10
10
UNITS
pF
pF
TEST CONDITIONS
V
CC
= 5.0V, V
I
= 2.0V
V
CC
= 5.0V, V
I/O
= 2.0V
*Characterized but not 100% tested.
3
Specifications
GAL22V10D/883
Specifications
GAL22V10/883
AC Switching Characteristics
Over Recommended Operating Conditions
TEST
COND.
1
A
A
—
—
—
A
-20
-25
-30
UNITS
ns
ns
ns
ns
ns
MHz
PARAMETER
DESCRIPTION
Input or I/O to Combinatorial Output
Clock to Output Delay
Clock to Feedback Delay
Setup Time, Input or Feedback before Clock↑
Hold Time, Input or Feedback after Clock↑
Maximum Clock Frequency with
External Feedback, 1/(tsu + tco)
Maximum Clock Frequency with
Internal Feedback, 1/(tsu + tcf)
Maximum Clock Frequency with
No Feedback
Clock Pulse Duration, High
Clock Pulse Duration, Low
Input or I/O to Output Enabled
Input or I/O to Output Disabled
Input or I/O to Asynchronous Reset of Register
Asynchronous Reset Pulse Duration
Asynchronous Reset to Clock Recovery Time
Synchronous Preset to Clock Recovery Time
—
—
—
17
0
MIN. MAX. MIN. MAX. MIN. MAX.
20
15
15
—
—
—
—
—
—
20
0
25
25
20
20
—
—
—
—
—
—
25
0
22
30
20
20
—
—
—
t
pd
t
co
t
cf
2
t
su
t
h
31.2
f
max
3
A
A
31.2
33
—
—
25
33
—
—
22
25
—
—
MHz
MHz
t
wh
t
wl
t
en
t
dis
t
ar
t
arw
t
arr
t
spr
—
—
B
C
A
—
—
—
15
15
—
—
—
20
20
17
—
—
20
20
25
—
—
—
15
15
—
—
—
25
25
20
—
—
25
25
30
—
—
—
20
20
—
—
—
30
30
25
—
—
25
25
30
—
—
—
ns
ns
ns
ns
ns
ns
ns
ns
1) Refer to
Switching Test Conditions
section.
2) Calculated from
fmax
with internal feedback. Refer to
fmax Description
section.
3) Refer to
fmax Description
section.
Capacitance (T
A
= 25°C, f = 1/0 MHz)
SYMBOL
C
I
C
I/O
PARAMETER
Input Capacitance
I/O Capacitance
MAXIMUM*
10
10
UNITS
pF
pF
TEST CONDITIONS
V
CC
= 5.0V, V
I
= 2.0V
V
CC
= 5.0V, V
I/O
= 2.0V
*Characterized but not 100% tested.
4
Specifications
GAL22V10/883
Switching Waveforms
INPUT or
I/O FEEDBACK
VALID INPUT
INPUT or
I/O FEEDBACK
VALID INPUT
t
s u
t
h
t
pd
COMBINATORIAL
OUTPUT
CLK
t
c o
Combinatorial Output
REGISTERED
OUTPUT
1 /
f
m a x
(external fdbk)
Registered Output
INPUT or
I/O FEEDBACK
t
dis
OUTPUT
t
en
CLK
1 /
f
m ax (int ern al fd bk )
Input or I/O to Output Enable/Disable
REGISTERED
FEEDBACK
t
c f
t
su
f
max with Feedback
t
wh
CLK
t
wl
1/
f
ma x
(w/o fdbk)
Clock Width
INPUT or
I/O FEEDBACK
DRIVING SP
CLK
INPUT or
I/O FEEDBACK
DRIVING AR
t
su
t
h
t
spr
CLK
t
arw
t
co
REGISTERED
OUTPUT
t
arr
REGISTERED
OUTPUT
t
ar
Synchronous Preset
Asynchronous Reset
5
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