REVISIONS
LTR
A
DESCRIPTION
Correct dimension to case outline. Change table I I
DD
and I
EE
limits.
Update format. Editorial changes throughout. Change to reflect
MIL-H-38534 processing.
Changes in accordance with NOR 5962-R140-97.
Update drawing to the current requirements of MIL-PRF-38534.
DATE (YR-MO-DA)
90-01-08
APPROVED
W. Heckman
B
C
96-11-25
06-02-16
Kendall A. Cottongim
Raymond Monnin
THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED
REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
PMIC N/A
REV
SHEET
PREPARED BY
Gary Zahn
CHECKED BY
Donald R. Osborne
C
1
C
2
C
3
C
4
C
5
C
6
C
7
C
8
C
9
C
10
C
11
C
12
STANDARD
MICROCIRCUIT
DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
POST OFFICE BOX 3990
COLUMBUS, OHIO 43218-3990
http://www.dscc.dla.mil
THIS DRAWING IS
AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
AMSC N/A
APPROVED BY
William K. Heckman
MICROCIRCUIT, HYBRID, LINEAR, QUAD,
12-BIT, DIGITAL TO ANALOG CONVERTER
DRAWING APPROVAL DATE
89-02-02
REVISION LEVEL
C
SIZE
A
SHEET
CAGE CODE
67268
1 OF
12
5962-88629
5962-E271-06
DSCC FORM 2233
APR 97
1. SCOPE
1.1 Scope. This drawing documents one product assurance class, class H (high reliability) and a choice of case outlines and
lead finishes are available and are reflected in the Part or Identifying Number (PIN).
1.2 PIN. The PIN shall be as shown in the following example:
5962-88629
⏐
⏐
⏐
Drawing number
01
⏐
⏐
⏐
Device type
(see 1.2.1)
X
⏐
⏐
⏐
Case outline
(see 1.2.2)
X
⏐
⏐
⏐
Lead finish
(see 1.2.3)
1.2.1 Device type(s). The device type(s) shall identify the circuit function as follows:
Device type
01
Generic number
HS 9342
Circuit function
Quad, 12-bit, digital to analog converter
1.2.2 Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835 and as follows:
Outline letter
X
Descriptive designator
CDIP2-T28, GDIP1-T28
Terminals
28
Package style
Dual-in-line
1.2.3 Lead finish. The lead finish shall be as specified in MIL-PRF-38534.
1.3 Absolute maximum ratings.
Positive supply voltage range (V
DD
) ...........................................
Negative supply voltage range (V
EE
)..........................................
Input voltage, Bits 1-12, LBE, HBE, and CE
1 - 4
(V
IN
)................
Reference input voltage (V
REF IN
) ...............................................
Power dissipation (P
D
) ...............................................................
Storage temperature range........................................................
Lead temperature (soldering, 10 seconds).................................
Junction temperature (T
J
) ..........................................................
Thermal resistance, junction-to-case (θ
JC
) .................................
Thermal resistance, junction-to-ambient (θ
JA
) ............................
1.4 Recommended operating conditions.
Positive supply voltage range (V
DD
) ...........................................
Negative supply voltage range (V
EE
)..........................................
Logic supply voltage range (V
DD
) ...............................................
Ambient operating temperature range (T
A
) ................................
+14.25
V dc to +15.75 V dc
−14.25
V dc to -15.75 V dc
+4.25
V dc to +5.5 V dc
-55°C to +125°C
-0.3 V dc to
+18
V dc
+0.3 V dc to
−18
V dc
-0.3 V dc to (V
DD
+ 0.3 V dc)
±20
V dc
1.8 W
-65°C to +150°C
+300°C
+150°C
See MIL-STD-1835
30°C/W
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
SIZE
A
REVISION LEVEL
5962-88629
SHEET
C
2
DSCC FORM 2234
APR 97
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38534 - Hybrid Microcircuits, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 - Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 - List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Copies of these documents are available online at
http://assist.daps.dla.mil/quicksearch/
or
http://assist.daps.dla.mil
or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of
this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item performance requirements for device class H shall be in accordance with MIL-
PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device
manufacturer's Quality Management (QM) plan or as designated for applicable device class. The manufacturer may eliminate,
modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall
be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the
device for the applicable device class.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in
MIL-PRF-38534 and herein.
3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.2 herein.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.
3.2.3 Block diagram. The block diagram shall be as specified on figure 2.
3.2.4 Truth table. The truth table shall be as specified on figure 3.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
as specified in table I and shall apply over the full specified operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are defined in table I.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
SIZE
A
REVISION LEVEL
5962-88629
SHEET
C
3
DSCC FORM 2234
APR 97
3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with
the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked.
3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described
herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample,
for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those
which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be
made available to the preparing activity (DSCC-VA) upon request.
3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this
drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturer's product meets
the performance requirements of MIL-PRF-38534 and herein.
3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of
microcircuits delivered to this drawing.
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as
modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form,
fit, or function as described herein.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply:
a.
Burn-in test, method 1015 of MIL-STD-883.
(1)
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit
shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified
in method 1015 of MIL-STD-883.
T
A
as specified in accordance with table I of method 1015 of MIL-STD-883.
(2)
b.
Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
tests prior to burn-in are optional at the discretion of the manufacturer.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
SIZE
A
REVISION LEVEL
5962-88629
SHEET
C
4
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions
-55°C
≤
T
A
≤
+125°C
V
DD
= +15 V, V
EE
= -15 V,
unless otherwise specified
Group A
subgroups
Device
type
Min
---
V
IH
V
IL
I
IN
V
REF IN
Z
IN
V
E
V
ON
1/
1/
0 V
≤
V
IN
≤
V
DD
3/
T
A
= +25°C 3/
T
A
= +25°C 4/
Peak-to-peak wideband
See 4.3.1d 4/
T
A
= +125°C, -55°C 4/
1,2,3
1,2,3
1,2,3
1,2,3
4
1
01
01
01
01
01
01
01
1.2
12
2.4
0.8
4.0
±10
3.8
±10.0
Limits
Max
Bits
V
V
µA
V
kΩ
mV
µV
Unit
Resolution
Input high voltage
Input low voltage
Input current
Reference input voltage
range
Reference input impedance
Reference output voltage
error
Reference output noise
voltage
Reference output voltage
drift
9,10,11
01
200
∆
V
REF
∆
T
2,3
01
8.0
ppm/°C
Total available current
Current available for external
use
Integral linearity error
Integral linearity error drift
I
MAX
I
EXT
LE
∆
LE
∆
T
I
REF
+ I
EXT
3/ 4/
3/
T
A
= +25°C 5/
T
A
= +125°C, -55°C
1,2,3
1,2,3
1
2,3
01
01
01
01
1.0
20
12
±0.5
mA
mA
LSB
ppm/°C
Differential linearity error
DLE
Deviation of an output step
from the theoretical value
of 1 LSB for any two
adjacent digital codes.
T
A
= +25°C
T
A
= +125°C, -55°C
1
01
±1.0
LSB
Differential linearity error drift
∆
DLE
∆
T
2,3
01
1.0
ppm/°C
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
SIZE
A
REVISION LEVEL
5962-88629
SHEET
C
5
DSCC FORM 2234
APR 97
FPGA/CPLD
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