Selectable differential inputs to six LVDS outputs
Power-down mode
2.5V V
DD
Available in VFQFPN package
IDT5T9306
DESCRIPTION:
The IDT5T9306 2.5V differential clock buffer is a user-selectable differential
input to six LVDS outputs. The fanout from a differential input to six LVDS outputs
reduces loading on the preceding driver and provides an efficient clock
distribution network. The IDT5T9306 can act as a translator from a differential
HSTL, eHSTL, LVEPECL (2.5V), LVPECL (3.3V), CML, or LVDS input to
LVDS outputs. A single-ended 3.3V / 2.5V LVTTL input can also be used to
translate to LVDS outputs. The redundant input capability allows for an
asynchronous change-over from a primary clock source to a secondary clock
source. Selectable reference inputs are controlled by SEL.
The IDT5T9306 outputs can be asynchronously enabled/disabled. When
disabled, the outputs will drive to the value selected by the GL pin. Multiple power
and grounds reduce noise.
APPLICATIONS:
• Clock distribution
FUNCTIONAL BLOCK DIAGRAM
GL
G
OUTPUT
CONTROL
Q1
Q1
PD
OUTPUT
CONTROL
Q2
Q2
A1
A1
1
OUTPUT
CONTROL
Q3
Q3
A2
A2
0
OUTPUT
CONTROL
Q4
Q4
SEL
OUTPUT
CONTROL
Q5
Q5
OUTPUT
CONTROL
Q6
Q6
IDT
™
/ ICS
™
LVDS CLOCK BUFFER TERABUFFER™ II
1
IDT5T9306 REV. B
October 21,
2008
IDT5T9306
2.5V LVDS 1:6 CLOCK BUFFER TERABUFFER™ II
PIN CONFIGURATION
SEL
V
DD
28 27 26 25 24 23 22
G
V
DD
Q
1
Q
1
V
DD
A
1
A
1
1
2
3
4
5
6
7
8
9
10 11 12 13 14
GND
21
20
19
18
17
16
15
PD
V
DD
Q
4
Q
4
V
DD
A
2
A
2
V
DD
VFQFPN
TOP VIEW
V
DD
GL
Q
2
Q
2
Q
3
Q
3
NC
Q
6
Q
6
Q
5
Q
5
IDT
™
/ ICS
™
LVDS CLOCK BUFFER TERABUFFER™ II
2
IDT5T9306 REV. B
October 21,
2008
IDT5T9306
2.5V LVDS 1:6 CLOCK BUFFER TERABUFFER™ II
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol
V
DD
V
I
V
O
T
STG
T
J
Input Voltage
Output Voltage
(2)
Storage Temperature
Junction Temperature
Description
Power Supply Voltage
Max
–0.5 to +3.6
–0.5 to +3.6
–0.5 to V
DD
+0.5
–65 to +150
150
Unit
V
V
V
°C
°C
CAPACITANCE
(1)
(T
A
= +25°C, F = 1.0MHz)
Symbol
C
IN
Parameter
Input Capacitance
Min
Typ.
Max.
3
Unit
pF
—
—
NOTE:
1. This parameter is measured at characterization but not tested
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
2. Not to exceed 3.6V.
RECOMMENDED OPERATING RANGE
Symbol
T
A
V
DD
Description
Ambient Operating Temperature
Internal Power Supply Voltage
Min.
–40
2.3
Typ.
+25
2.5
Max.
+85
2.7
Unit
°C
V
PIN DESCRIPTION
Symbol
A
[1:2]
A
[1:2]
I/O
I
I
Type
Adjustable
(1,4)
Adjustable
(1,4)
Description
Clock input. A
[1:2]
is the "true" side of the differential clock input.
Complementary clock inputs. A
[1:2]
is the complementary side of A
[1:2].
For LVTTL single-ended operation, A
[1:2]
should be set to the
desired toggle voltage for A
[1:2]
:
3.3V LVTTL V
REF
= 1650mV
2.5V LVTTL V
REF
= 1250mV
Gate control for differential outputs Q
1
and Q
1
through Q
6
and Q
6
. When G is LOW, the differential outputs are active. When G is
HIGH, the differential outputs are asynchronously driven to the level designated by GL
(2)
.
Specifies output disable level. If HIGH, "true" outputs disable HIGH and "complementary" outputs disable LOW. If LOW, "true"
outputs disable LOW and "complementary" outputs disable HIGH.
Clock outputs
Complementary clock outputs
Reference clock select. When LOW, selects A
2
and A
2
. When HIGH, selects A
1
and A
1
.
Power-down control. Shuts off entire chip. If LOW, the device goes into low power mode. Inputs and outputs are disabled. Both
"true" and "complementary" outputs will pull to V
DD
. Set HIGH for normal operation.
(3)
Power supply for the device core and inputs
Power supply return for all power
No connect; recommended to connect to GND
G
GL
Qn
Q
n
SEL
P
D
V
DD
GND
NC
I
I
O
O
I
I
LVTTL
LVTTL
LVDS
LVDS
LVTTL
LVTTL
PWR
PWR
NOTES:
1. Inputs are capable of translating the following interface standards:
Single-ended 3.3V and 2.5V LVTTL levels
Differential HSTL and eHSTL levels
Differential LVEPECL (2.5V) and LVPECL (3.3V) levels
Differential LVDS levels
Differential CML levels
2. Because the gate controls are asynchronous, runt pulses are possible. It is the user's responsibility to either time the gate control signals to minimize the possibility of runt
pulses or be able to tolerate them in down stream circuitry.
3. It is recommended that the outputs be disabled before entering power-down mode. It is also recommended that the outputs remain disabled until the device completes power-
up after asserting PD.
4. The user must take precautions with any differential input interface standard being used in order to prevent instability when there is no input signal.
IDT
™
/ ICS
™
LVDS CLOCK BUFFER TERABUFFER™ II
3
IDT5T9306 REV. B
October 21,
2008
IDT5T9306
2.5V LVDS 1:6 CLOCK BUFFER TERABUFFER™ II
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE FOR LVTTL
(1)
Symbol
Parameter
Input Characteristics
I
IH
Input HIGH Current
I
IL
Input LOW Current
V
IK
Clamp Diode Voltage
V
IN
DC Input Voltage
V
IH
DC Input HIGH
V
IL
DC Input LOW
V
THI
DC Input Threshold Crossing Voltage
Single-Ended Reference Voltage
(3)
V
REF
Test Conditions
V
DD
= 2.7V
V
DD
= 2.7V
V
DD
= 2.3V, I
IN
= -18mA
Min.
—
—
—
- 0.3
1.7
—
—
—
—
Typ.
(2)
—
—
- 0.7
—
—
—
V
DD
/2
1.65
1.25
Max
±5
±5
- 1.2
+3.6
—
0.7
—
—
—
Unit
μA
V
V
V
V
V
V
3.3V LVTTL
2.5V LVTTL
NOTES:
1. See RECOMMENDED OPERATING RANGE table.
2. Typical values are at V
DD
= 2.5V, +25°C ambient.
3. For A
[1:2]
single-ended operation, A
[1:2]
is tied to a DC reference voltage.
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE FOR
DIFFERENTIAL INPUTS
(1)
Symbol
Parameter
Input Characteristics
I
IH
Input HIGH Current
I
IL
Input LOW Current
V
IK
Clamp Diode Voltage
V
IN
DC Input Voltage
V
DIF
DC Differential Voltage
(3)
V
CM
DC Common Mode Input Voltage
(4)
Test Conditions
V
DD
= 2.7V
V
DD
= 2.7V
V
DD
= 2.3V, I
IN
= -18mA
Min.
—
—
—
- 0.3
0.1
0.05
Typ.
(2)
—
—
- 0.7
—
—
—
Max
±5
±5
- 1.2
+3.6
—
V
DD
Unit
μA
V
V
V
V
NOTES:
1. See RECOMMENDED OPERATING RANGE table.
2. Typical values are at V
DD
= 2.5V, +25°C ambient.
3. V
DIF
specifies the minimum input differential voltage (V
TR
- V
CP
) required for switching where V
TR
is the "true" input level and V
CP
is the "complement" input level. The DC differential
voltage must be maintained to guarantee retaining the existing HIGH or LOW input. The AC differential voltage must be achieved to guarantee switching to a new state.
4. V
CM
specifies the maximum allowable range of (V
TR
+ V
CP
) /2.
DC ELECTRICAL CHARACTERISTICS OVER RECOMMENDED OPERATING
RANGE FOR LVDS
(1)
Symbol
Parameter
Output Characteristics
V
OT
(+)
Differential Output Voltage for the True Binary State
V
OT
(-)
Differential Output Voltage for the False Binary State
ΔV
OT
Change in V
OT
Between Complementary Output States
V
OS
Output Common Mode Voltage (Offset Voltage)
ΔV
OS
Change in V
OS
Between Complementary Output States
I
OS
Outputs Short Circuit Current
Differential Outputs Short Circuit Current
I
OSD
NOTES:
1. See RECOMMENDED OPERATING RANGE table.
2. Typical values are at V
DD
= 2.5V, T
A
= +25°C ambient.
Test Conditions
Min.
247
247
—
1.125
—
—
—
Typ.
(2)
—
—
—
1.2
—
12
6
Max
454
454
50
1.375
50
24
12
Unit
mV
mV
mV
V
mV
mA
mA
V
OUT
+ and V
OUT
- = 0V
V
OUT
+ = V
OUT
-
IDT
™
/ ICS
™
LVDS CLOCK BUFFER TERABUFFER™ II
4
IDT5T9306 REV. B
October 21,
2008
IDT5T9306
2.5V LVDS 1:6 CLOCK BUFFER TERABUFFER™ II
DIFFERENTIAL INPUT AC TEST CONDITIONS FOR HSTL
Symbol
V
DIF
V
X
D
H
V
THI
t
R
, t
F
Parameter
Input Signal Swing
(1)
Differential Input Signal Crossing Point
(2)
Duty Cycle
Input Timing Measurement Reference Level
(3)
Input Signal Edge Rate
(4)
Value
1
750
50
Crossing Point
2
Units
V
mV
%
V
V/ns
NOTES:
1. The 1V peak-to-peak input pulse level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the V
DIF
(AC)
specification under actual use conditions.
2. A 750mV crossing point level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the V
X
specification under
actual use conditions.
3. In all cases, input waveform timing is marked at the differential cross-point of the input signals.
4. The input signal edge rate of 2V/ns or greater is to be maintained in the 20% to 80% range of the input waveform.
DIFFERENTIAL INPUT AC TEST CONDITIONS FOR eHSTL
Symbol
V
DIF
V
X
D
H
V
THI
t
R
, t
F
Parameter
Input Signal Swing
(1)
Differential Input Signal Crossing Point
Duty Cycle
Input Timing Measurement Reference Level
(3)
Input Signal Edge Rate
(4)
(2)
Value
1
900
50
Crossing Point
2
Units
V
mV
%
V
V/ns
NOTES:
1. The 1V peak-to-peak input pulse level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the V
DIF
(AC)
specification under actual use conditions.
2. A 900mV crossing point level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the V
X
specification under
actual use conditions.
3. In all cases, input waveform timing is marked at the differential cross-point of the input signals.
4. The input signal edge rate of 2V/ns or greater is to be maintained in the 20% to 80% range of the input waveform.
DIFFERENTIAL INPUT AC TEST CONDITIONS FOR LVEPECL (2.5V) AND
LVPECL (3.3V)
Symbol
V
DIF
V
X
D
H
V
THI
t
R
, t
F
Parameter
Input Signal Swing
(1)
Differential Input Signal Crossing Point
Duty Cycle
Input Timing Measurement Reference Level
(3)
Input Signal Edge Rate
(4)
(2)
Value
732
LVEPECL
LVPECL
1082
1880
50
Crossing Point
2
Units
mV
mV
%
V
V/ns
NOTES:
1. The 732mV peak-to-peak input pulse level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the V
DIF
(AC)
specification under actual use conditions.
2. 1082mV LVEPECL (2.5V) and 1880mV LVPECL (3.3V) crossing point levels are specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment.
This device meets the V
X
specification under actual use conditions.
3. In all cases, input waveform timing is marked at the differential cross-point of the input signals.
4. The input signal edge rate of 2V/ns or greater is to be maintained in the 20% to 80% range of the input waveform.
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