电子工程世界电子工程世界电子工程世界

关键词

搜索

型号

搜索

FLR016FH

产品描述RF Small Signal Field-Effect Transistor, 1-Element, K Band, Gallium Arsenide, N-Channel, Junction FET, HERMETIC SEALED, METAL CERAMIC, CASE FH, 4 PIN
产品类别分立半导体    晶体管   
文件大小60KB,共4页
制造商FUJITSU(富士通)
官网地址http://edevice.fujitsu.com/fmd/en/index.html
下载文档 详细参数 全文预览

FLR016FH概述

RF Small Signal Field-Effect Transistor, 1-Element, K Band, Gallium Arsenide, N-Channel, Junction FET, HERMETIC SEALED, METAL CERAMIC, CASE FH, 4 PIN

FLR016FH规格参数

参数名称属性值
是否Rohs认证不符合
厂商名称FUJITSU(富士通)
包装说明FLATPACK, S-MQFP-F4
针数4
制造商包装代码CASE FH
Reach Compliance Codeunknown
其他特性HIGH RELIABILITY
外壳连接SOURCE
配置SINGLE
最小漏源击穿电压12 V
FET 技术JUNCTION
最高频带K BAND
JESD-30 代码S-MQFP-F4
JESD-609代码e0
元件数量1
端子数量4
工作模式DEPLETION MODE
最高工作温度175 °C
封装主体材料METAL
封装形状SQUARE
封装形式FLATPACK
极性/信道类型N-CHANNEL
功耗环境最大值1 W
认证状态Not Qualified
表面贴装YES
端子面层Tin/Lead (Sn/Pb)
端子形式FLAT
端子位置QUAD
晶体管元件材料GALLIUM ARSENIDE
Base Number Matches1

文档预览

下载PDF文档
FLR016FH
K-Band Power GaAs FETs
FEATURES
• High Output Power: P1dB = 20.0dBm(Typ.)
• High Gain: G1dB = 8.5dB(Typ.)
N
High
T
h
add = 26%(Typ.)
O
PAE:
• Proven Reliability
REC
OM
DESCRIPTION
MEN
that is designed for
The FLR016FH chip is a power GaAs FET
DED
general purpose applications in the K-Band frequency range as it
provides superior power, gain, and efficiency.
FOR
Fujitsu’s stringent Quality Assurance Program assures the highest
reliability and consistent performance.
NEW
DES
ABSOLUTE MAXIMUM RATING (Ambient Temperature Ta=25¡C)
Item
Drain-Source Voltage
Gate-Source Voltage
Total Power Dissipation
Storage Temperature
Channel Temperature
Symbol
VDS
VGS
PT
Tstg
Tch
Tc = 25¡C
Condition
Rating
12
-4
1.0
-65 to +175
175
IGN
S
Unit
V
V
W
¡C
¡C
Fujitsu recommends the following conditions for the reliable operation of GaAs FETs:
1. The drain-source operating voltage (VDS) should not exceed 10 volts.
2. The forward and reverse gate currents should not exceed 0.25 and -0.05 mA respectively with
gate resistance of 3000W.
ELECTRICAL CHARACTERISTICS (Ambient Temperature Ta=25¡C)
Item
Saturated Drain Current
Transconductance
Pinch-off Voltage
Gate Source Breakdown Voltage
Output Power at 1dB G.C.P.
Power Gain at 1dB G.C.P.
Power-added Efficiency
Thermal Resistance
CASE STYLE:
FH
Symbol
IDSS
gm
Vp
VGSO
P1dB
G1dB
h
add
Rth
Test Conditions
VDS = 5V, VGS = 0V
VDS = 5V, IDS =40mA
VDS = 5V, IDS =3mA
IGS = -3µA
VDS = 8V,
IDS
=
0.6 IDSS (Typ.),
f = 18 GHz
Channel to Case
Min.
-
-
-1.0
-4
19
7.5
-
-
Limit
Typ. Max.
60
30
-2.0
-
20
8.5
26
120
-
-
-3.5
-
-
-
-
150
Unit
mA
mS
V
V
dBm
dB
%
¡C/W
G.C.P.: Gain Compression Point
1998 Microwave Databook
280
Data Sheets

 
EEWorld订阅号

 
EEWorld服务号

 
汽车开发圈

 
机器人开发圈

About Us 关于我们 客户服务 联系方式 器件索引 网站地图 最新更新 手机版

站点相关: 大学堂 TI培训 Datasheet 电子工程 索引文件: 1  1386  21  1634  380  1  7  30  22  47 

器件索引   0 1 2 3 4 5 6 7 8 9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z

北京市海淀区中关村大街18号B座15层1530室 电话:(010)82350740 邮编:100190

电子工程世界版权所有 京B2-20211791 京ICP备10001474号-1 电信业务审批[2006]字第258号函 京公网安备 11010802033920号 Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved