PD-94246E
IRHG567110
RADIATION HARDENED
POWER MOSFET
THRU-HOLE (MO-036AB)
Product Summary
Part Number
IRHG567110
IRHG563110
IRHG567110
IRHG563110
Radiation Level
100 kRads(Si)
300 kRads(Si)
100 kRads(Si)
300 kRads(Si)
RDS(on)
0.29
0.29
0.96
0.96
I
D
1.6A
1.6A
-0.96A
-0.96A
Channel
N
N
P
P
100V, Combination 2N-2P CHANNEL
R
5
TECHNOLOGY
MO-036AB
Description
IR HiRel R5 technology provides high performance power
MOSFETs for space applications. This technology has over
a decade of proven performance and reliability in satellite
applications. These devices have been characterized for
Single Event Effects (SEE). The combination of low R
DS(on)
and low gate charge reduces the power losses in switching
applications such as DC to DC converters and motor control.
These devices retain all of the well established advantages
of MOSFETs such as voltage control, fast switching and
temperature stability of electrical parameters.
Features
Single Event Effect (SEE) Hardened
Low RDS(on)
Low Total Gate Charge
Simple Drive Requirements
Hermetically Sealed
Ceramic Package
Light Weight
ESD Rating: Class 1A per MIL-STD-750, Method 1020
Absolute Maximum Ratings (Per Die)
Symbol
I
D1
@ V
GS
= ±12V, T
C
= 25°C
I
D2
@ V
GS
= ±12V, T
C
= 100°C
I
DM
@T
C
= 25°C
P
D
@T
C
= 25°C
V
GS
E
AS
I
AR
E
AR
dv/dt
T
J
T
STG
Pre-Irradiation
N-Channel
1.6
1.0
6.4
1.4
0.011
± 20
130
1.6
0.14
6.5
Parameter
Continuous Drain Current
Continuous Drain Current
Pulsed Drain Current
Maximum Power Dissipation
Linear Derating Factor
Gate-to-Source Voltage
Single Pulse Avalanche Energy
Avalanche Current
Repetitive Avalanche Energy
Peak Diode Recovery dv/dt
Operating Junction and
Storage Temperature Range
Lead Temperature
Weight
P-Channel
-0.96
-0.6
-3.84
1.4
0.011
± 20
200
-0.96
0.14
7.1
Units
A
W
W/°C
V
mJ
A
mJ
V/ns
°C
g
-55 to +150
300 (0.63in/1.6mm from case for 10s)
1.3 (Typical)
For Footnotes, refer to the page 2 for N Channel and page 3 for P Channel
1
International Rectifier HiRel Products, Inc.
2019-01-15
IRHG567110
Pre-Irradiation
Electrical Characteristics for Each N-Channel Device @ Tj = 25°C
(Unless Otherwise Specified)
Symbol
BV
DSS
BV
DSS
/T
J
R
DS(on)
V
GS(th)
Gfs
I
DSS
I
GSS
Q
G
Q
GS
Q
GD
t
d(on)
tr
t
d(off)
t
f
Ls +L
D
C
iss
C
oss
C
rss
Parameter
Drain-to-Source Breakdown Voltage
Breakdown Voltage Temp. Coefficient
Static Drain-to-Source On-State
Resistance
Gate Threshold Voltage
Forward Transconductance
Zero Gate Voltage Drain Current
Gate-to-Source Leakage Forward
Gate-to-Source Leakage Reverse
Total Gate Charge
Gate-to-Source Charge
Gate-to-Drain (‘Miller’) Charge
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Total Inductance
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Min. Typ. Max. Units
100
–––
–––
2.0
1.0
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
0.14
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
10
370
110
3.4
–––
–––
0.29
4.0
–––
10
25
100
-100
17
4.4
3.9
21
16
50
15
–––
–––
–––
–––
V
V/°C
Test Conditions
V
GS
= 0V, I
D
= 1.0mA
Reference to 25°C, I
D
= 1.0mA
V
GS
= 12V, I
D
= 1.0A
V
S
µA
nA
nC
V
DS
= V
GS
, I
D
= 1.0mA
V
DS
= 15V, I
D2
= 1.0A
V
DS
= 80V, V
GS
= 0V
V
DS
= 80V,V
GS
= 0V,T
J
=125°C
V
GS
= 20V
V
GS
= -20V
I
D1
= 1.6A
V
DS
= 50V
V
GS
= 12V
V
DD
= 50V
I
D1
= 1.6A
R
G
= 7.5
V
GS
= 12V
Measured from Drain lead (6mm / 0.25 in
from package) to Source lead (6mm/ 0.25 in
from package) with Source wire internally
bonded from Source pin to Drain pad
ns
nH
V
GS
= 0V
pF
V
DS
= 25V
ƒ = 1.0MHz
Source-Drain Diode Ratings and Characteristics for Each N-Channel Device
Symbol
I
S
I
SM
V
SD
t
rr
Q
rr
t
on
Symbol
R
JA
R
JC
R
J-LEAD
R
J-LID
Junction-to-Case *
Junction-to-Lead (Measured at shoulder of the Lead) *
Junction-to-Lid *
Parameter
Continuous Source Current (Body Diode)
Pulsed Source Current (Body Diode)
Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge
Forward Turn-On Time
Min. Typ. Max. Units
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
1.6
6.4
1.2
110
380
A
V
ns
nC
Test Conditions
T
J
= 25°C,I
S
= 1.6A, V
GS
= 0V
T
J
=25°C, I
F
= 1.6A, V
DD
≤
25V
di/dt = 100A/µs
Intrinsic turn-on time is negligible (turn-on is dominated by L
S
+L
D
)
Thermal Resistance for Each N-Channel Device
Parameter
Junction-to-Ambient (Typical socket mount)
Min.
–––
–––
–––
–––
Typ.
–––
7.5
29
17
Max.
90
–––
–––
–––
Units
°C/W
°C/W
°C/W
°C/W
* Values established by Thermal Modeling
Footnotes:
Repetitive Rating; Pulse width limited by maximum junction temperature.
DD
= 25V, starting T
J
= 25°C, L =100mH, Peak I
L
= 1.6A, V
GS
= 12V
V
I
SD
1.6A, di/dt
340A/µs, V
DD
100V, T
J
150°C
Pulse width
300 µs; Duty Cycle
2%
Total Dose Irradiation with V
GS
Bias. 12 volt V
GS
applied and V
DS
= 0 during irradiation per MIL-STD-750, Method 1019, condition A.
Total Dose Irradiation with V
DS
Bias. 80volt V
DS
applied and V
GS
= 0 during irradiation per MlL-STD-750, Method 1019, condition A.
2
International Rectifier HiRel Products, Inc.
2019-01-15
IRHG567110
Pre-Irradiation
Electrical Characteristics for Each P-Channel Device @ Tj = 25°C
(Unless Otherwise Specified)
Parameter
BV
DSS
BV
DSS
/T
J
R
DS(on)
V
GS(th)
Gfs
I
DSS
I
GSS
Q
G
Q
GS
Q
GD
t
d(on)
tr
t
d(off)
t
f
Ls +L
D
C
iss
C
oss
C
rss
Drain-to-Source Breakdown Voltage
Breakdown Voltage Temp. Coefficient
Static Drain-to-Source On-State
Resistance
Gate Threshold Voltage
Forward Transconductance
Zero Gate Voltage Drain Current
Gate-to-Source Leakage Forward
Gate-to-Source Leakage Reverse
Total Gate Charge
Gate-to-Source Charge
Gate-to-Drain (‘Miller’) Charge
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Total Inductance
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Min. Typ. Max. Units
-100 –––
––– -0.14
–––
-2.0
1.1
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
10
390
100
7.0
–––
–––
0.96
-4.0
–––
-10
-25
-100
100
13.4
3.7
3.0
21
17
50
90
–––
–––
–––
–––
V
V/°C
Test Conditions
V
GS
= 0V, I
D
= -1.0mA
Reference to 25°C, I
D
= -1.0mA
V
GS
= -12V, I
D2
= -0.6A
V
S
µA
nA
nC
V
DS
= V
GS
, I
D
= -1.0mA
V
DS
= -15V, I
D2
= -0.6A
V
DS
= -80V, V
GS
= 0V
V
DS
= -80V,V
GS
= 0V,T
J
=125°C
V
GS
= -20V
V
GS
= 20V
I
D1
= -0.96A
V
DS
= -50V
V
GS
= -12V
V
DD
= -50V
I
D1
= -0.96A
R
G
= 7.5
V
GS
= -12V
Measured from Drain lead (6mm / 0.25 in
from package) to Source lead (6mm/ 0.25 in
from package) with Source wire internally
bonded from Source pin to Drain pad
ns
nH
V
GS
= 0V
pF
V
DS
= -25V
ƒ = 1.0MHz
Source-Drain Diode Ratings and Characteristics for Each P-Channel Device
Parameter
I
S
I
SM
V
SD
t
rr
Q
rr
t
on
Continuous Source Current (Body Diode)
Pulsed Source Current (Body Diode)
Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge
Forward Turn-On Time
Min. Typ. Max. Units
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
-0.96
-3.84
-3.5
86
240
A
V
ns
nC
Test Conditions
T
J
=25°C,I
S
= -0.96A, V
GS
=0V
T
J
=25°C, I
F
=0.96A, V
DD
≤
-25V
di/dt = 100A/µs
Intrinsic turn-on time is negligible (turn-on is dominated by L
S
+L
D
)
Thermal Resistance for Each P-Channel Device
Parameter
R
JA
R
JC
R
J-LEAD
R
J-LID
Junction-to-Ambient (Typical socket mount)
Junction-to-Case *
Junction-to-Lead (Measured at shoulder of the Lead) *
Junction-to-Lid *
Min.
–––
–––
–––
–––
Typ.
–––
7.5
29
17
Max.
90
–––
–––
–––
Units
°C/W
°C/W
°C/W
°C/W
* Values established by Thermal Modeling
Footnotes:
Repetitive Rating; Pulse width limited by maximum junction temperature.
DD
= -25V, starting T
J
= 25°C, L = 430mH, Peak I
L
= -0.96A, V
GS
= -12V
V
I
SD
-0.96A, di/dt
-290A/µs, V
DD
-100V, T
J
150°C
Pulse width
300 µs; Duty Cycle
2%
Total Dose Irradiation with V
GS
Bias. -12
volt V
GS
applied and V
DS
= 0 during irradiation per MIL-STD-750, Method 1019, condition A.
Total Dose Irradiation with V
DS
Bias. -80volt
V
DS
applied and V
GS
= 0 during irradiation per MlL-STD-750, Method 1019, condition A.
3
International Rectifier HiRel Products, Inc.
2019-01-15
IRHG567110
Radiation Characteristics
Pre-Irradiation
IR HiRel Radiation Hardened MOSFETs are tested to verify their radiation hardness capability. The hardness assurance
program at IR Hirel is comprised of two radiation environments. Every manufacturing lot is tested for total ionizing dose
(per notes 5 and 6) using the TO-3 package. Both pre- and post-irradiation performance are tested and specified using
the same drive circuitry and test conditions in order to provide a direct comparison.
Table1. Electrical Characteristics for Each N-Ch. Dev.
@ Tj = 25°C
,
Post Total Dose Irradiation
Symbol
BV
DSS
V
GS(th)
I
GSS
I
GSS
I
DSS
R
DS(on)
R
DS(on)
V
SD
Parameter
Drain-to-Source Breakdown Voltage
Gate Threshold Voltage
Gate-to-Source Leakage Forward
Gate-to-Source Leakage Reverse
Zero Gate Voltage Drain Current
Static Drain-to-Source
On-State Resistance (TO-3)
Static Drain-to-Source
On-State Resistance (MO-036AB)
Diode Forward Voltage
Up to 500 kRads (Si)
Min.
100
2.0
–––
–––
–––
–––
–––
–––
Max.
–––
4.0
100
-100
10
0.29
0.29
1.2
1000 kRads (Si)
Min.
100
1.5
–––
–––
–––
–––
–––
–––
Max.
–––
4.0
100
-100
10
0.31
0.31
1.2
V
V
nA
nA
µA
V
V
GS
= 0V, I
D
= 1.0mA
V
DS
= V
GS
, I
D
= 1.0mA
V
GS
= 20V
V
GS
= -20V
V
DS
= 80V, V
GS
= 0V
V
GS
= 12V, I
D2
= 1.0A
V
GS
= 12V, I
D2
= 1.0A
V
GS
= 0V, I
S
= 1.6A
Units
Test Conditions
IR HiRel radiation hardened MOSFETs have been characterized in heavy ion environment for Single Event Effects
(SEE). Single Event Effects characterization is illustrated in Fig. a and Table 2.
Table 2. Typical Single Event Effect Safe Operating Area for Each N-Channel Device
LET
(MeV/(mg/cm
2
))
38 ± 5%
61 ± 5%
84 ± 5%
Energy
(MeV)
300 ± 7.5%
330 ± 7.5%
350 ± 10%
Range
(µm)
38 ± 7.5%
31 ± 10%
28 ± 7.5%
V
DS
(V)
@V
GS
=0V
100
100
100
@V
GS
=-5V
100
100
100
@V
GS
=-10V @V
GS
=-15V
100
100
80
100
35
25
@V
GS
=-20V
100
25
–––
120
100
80
60
40
20
0
0
-5
-10
Bias VGS (V)
-15
-20
Bias VDS (V)
LET=38 ± 5%
LET=61 ± 5%
LET=84 ± 5%
Fig a.
Typical Single Event Effect, Safe Operating Area
For Footnotes, refer to the page 2.
4
International Rectifier HiRel Products, Inc.
2019-01-15
IRHG567110
Radiation Characteristics
Pre-Irradiation
IR HiRel Radiation Hardened MOSFETs are tested to verify their radiation hardness capability. The hardness assurance
program at IR Hirel is comprised of two radiation environments. Every manufacturing lot is tested for total ionizing dose
(per notes 5 and 6) using the TO-3 package. Both pre- and post-irradiation performance are tested and specified using
the same drive circuitry and test conditions in order to provide a direct comparison.
Table1. Electrical Characteristics for Each P-Ch. Dev.
@ Tj = 25°C, Post Total Dose Irradiation
Parameter
BV
DSS
V
GS(th)
I
GSS
I
GSS
I
DSS
R
DS(on)
R
DS(on)
V
SD
Drain-to-Source Breakdown Voltage
Gate Threshold Voltage
Gate-to-Source Leakage Forward
Gate-to-Source Leakage Reverse
Zero Gate Voltage Drain Current
Static Drain-to-Source
On-State Resistance (TO-3)
Static Drain-to-Source
On-State Resistance (MO-036AB)
Diode Forward Voltage
100 kRads (Si)
1
Min.
-100
2.0
–––
–––
–––
–––
–––
–––
Max.
–––
4.0
-100
100
-10
0.916
0.96
-3.5
300 kRads (Si)
2
Min.
-100
2.0
–––
–––
–––
–––
–––
–––
Max.
–––
4.0
-100
100
-10
0.936
0.98
-3.5
V
V
nA
nA
µA
V
V
GS
= 0V, I
D
= -1.0mA
V
DS
= V
GS
, I
D
= -1.0mA
V
GS
= -20V
V
GS
= 20V
V
DS
= -80V, V
GS
= 0V
V
GS
= -12V, I
D2
= -0.6A
V
GS
= -12V, I
D2
= -0.6A
V
GS
= 0V, I
D
= -0.96A
Units
Test Conditions
1. Part number IRHG567110
2. Part number IRHG563110
IR HiRel radiation hardened MOSFETs have been characterized in heavy ion environment for Single Event Effects
(SEE). Single Event Effects characterization is illustrated in Fig. a and Table 2.
Table 2. Typical Single Event Effect Safe Operating Area for Each P-Channel Device
LET
(MeV/(mg/cm
2
))
38 ± 5%
61 ± 5%
84 ± 5%
Energy
(MeV)
270 ± 7.5%
330 ± 7.5%
350 ± 7.5%
Range
(µm)
35 ± 7.5%
30 ± 7.5%
28 ± 7.5%
V
DS
(V)
@V
GS
=0V
-100
-100
-100
@V
GS
=5V
-100
-100
-100
@V
GS
=10V
-100
-100
-100
@V
GS
=15V
-100
-100
-30
@V
GS
=20V
-100
-25
–––
-120
-100
-80
-60
-40
-20
0
0
5
10
Bias VGS (V)
15
20
Bias VDS (V)
LET=38 ± 5%
LET=61 ± 5%
LET=84 ± 5%
Fig a.
Typical Single Event Effect, Safe Operating Area
For Footnotes, refer to the page 3.
5
International Rectifier HiRel Products, Inc.
2019-01-15
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