QT725S SERIES
VOLTAGE CONTROLLED SPACE QUALIFIED SAW OSCILLATOR
Q-TECH
CORPORATION
3.3 and 5.0Vdc - 400 MHz to 1.3 GHz
The QT725S VCSO is a Class 2 hybrid per MIL-
PRF-55310, hermetically sealed, in a 20-pin Flat-
Pack 0.625” square, and operated at maximum
temperature range for –40°C to +85°C. Absolute Pull
range (APR) is ±20ppm min.
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Features
Made in USA
Hermetically sealed packages
Supply voltages 3.3Vdc and 5.0Vdc
Wide temperature range –40°C to +85°C with
guaranteed APR
Screened to MIL-PRF-55310, Level S or
Modified MIL-PRF-38534, Class K
Sine Wave Output
100k(Si) Radiation Tolerant
Low Phase Noise
Low Vibration sensitivity <2ppb/g
Q-Tech QT725S low noise Voltage Controlled SAW
Oscillators provide superior performance at operating
frequencies from 400 MHz to 1.3GHz. QT725S
delivers low phase noise; -105 dBc/Hz at 1 kHz offset
and –165 dBc/Hz noise floor. Typical vibration
sensitivity is 1ppb/g.
Description
Ordering Information
QT725S
C
Q T7 2 5S CEM - 1. 0 0 0G H z
E
M -
(Sample part number)
1.000GHz
Frequency
400 MHz - 1.3 GHz
1/
Model:
QT725S = Straight leads
QT727S = Lead Formed
Supply Voltage:
C = +5Vdc ±5%
L = +3.3Vdc ±5%
Operating Temperature:
E = -40ºC to +85ºC
F = -20ºC to +70ºC
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BB = BreadBoard Model
Screening and QCI:
M = Flight Model
(Screening and QCI
S = Flight Model
(Screening and QCI
per MIL-PRF-38534 [modified]
See Tables III-IX)
per MIL-PRF-55310, Level S; See
Tables X-Xd)
E = Engineering Model
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Applications
1/
Please
contact Q-Tech for higher frequencies
Phase Lock Loops (PLL)
Satellites
Aerospace
Space Clock Recovery
Low Phase Noise High Frequency
P
ackagingOptions
• Standard ESD packaging
QPDS-0016 Rev.A, Sept 2015
Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-tech .com
1 of 22
QT725S SERIES
VOLTAGE CONTROLLED SPACE QUALIFIED SAW OSCILLATOR
Q-TECH
CORPORATION
3.3 and 5.0Vdc - 400 MHz to 1.3 GHz
1.0
1.1
1.2
1.3
1.4
1.5
1.6
1.7
1.8
1.9
1.9.1
1.9.2
1.10
1.11
Active Elements
a) Visual Inspection of Silicon on Sapphire Microcircuits
Semicircular crack(s) or multiple adjacent cracks, not in the active area, starting and terminating at
the edge of the die are acceptable.
Note: Attached (chip in place) sapphire is nonconductive material and shall not be considered as
foreign material and will be considered as nonconductive material for all inspection criteria.
b) Subgroup 4 – Scanning Electron Microscope (SEM) Inspection
The manufacturer may allow the die distributor, at his option, select two dice from a waffle pack
(containing a maximum quantity of 100 die), visually inspect for the worst case metallization of the
2 dice, and take SEM photographs of the worst case.
c) Subgroup 5 – Radiation Tests
Subgroup 5 radiation tests are not required unless otherwise specified in the detail SCD.
Package Elements
a) Salt Spray
Salt spray testing is not required.
SAW Resonator Material
Unless otherwise specified by the detail SCD, the resonator shall be described per ANSI/IEEE 176-1987.
SAW Resonator Mounting
The package SAW resonator shall be epoxy attached in such a manner as to assure adequate crystal performance
when the oscillator is subjected to the environmental conditions specified herein.
GeneralRequirements
The parts shall comply with the requirements of MIL-PRF-38534, Class K and MIL-PRF-55310,
Level S except as modified or supplemented herein.
ApprovedSourceofSupply
Hybrid crystal oscillators shall be supplied from the manufacturer specified in “Source of Supply” below.
Case Outline and Terminial Connections
The case outline and terminal connections shall be as specified in Figure 1 (A or B) herein.
Maximum Ratings
The maximum ratings shall be as specified in Table I herein.
Electrical Performance Requirements
The electrical performance requirements shall be as specified herein.
Design and Construction
The design and construction of the device shall be as specified herein. As a minimum, the device shall meet the
design and construction requirements of MIL-PRF-55310.
Radiation Hardness
No elements shall be used in the unit that latch-up in a single event upset (SEU) environment. All devices used
in the unit shall be capable of meeting all electrical performance requirements after being subjected to the total
dose level 100kRad.
Element Derating
All active and passive elements shall be derated in accordance with the applicable hybrid microcircuit element
requirements of MIL-STD-975. Elements shall not operate in excess of derated values.
Element Evaluation
All piece parts shall be derived from lots that meet the element evaluation requirements of MIL-PRF-38534,
Class K, except for the following exceptions:
REQUIREMENTS
Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-tech .com
QPDS-0016 Rev.A, Sept 2015
2 of 22
QT725S SERIES
VOLTAGE CONTROLLED SPACE QUALIFIED SAW OSCILLATOR
Q-TECH
CORPORATION
3.3 and 5.0Vdc - 400 MHz to 1.3 GHz
1.12
1.13
1.14
1.15
1.16
1.17
1.18
1.19
1.20
1.21
1.22
1.23
1.24
Thick Film Hybrid Technology
When possible, all piece part electronic elements (except the quartz crystal resonator) shall be mounted on the
surface of thick film substrates. All lead attachment shall have appropriate strain relief. There shall be no solder
allowed internally.
Package Material and Finish
The package material and finish shall be in accordance with MIL-PRF-38534 and as specified.
Lead Material and Finish
The lead material and finish shall be in accordance with MIL-PRF-38534 and as specified herein.
Maximum Allowable Leak Rate
The maximum allowable leakage rate shall be as specified by MIL-STD-883, Method 1014 based on the internal
cavity volume. The hermetic seal (fine and gross leak) tests shall be in accordance with MIL-STD-883, Method
1014.
Weight
The weight of the crystal oscillator shall be 6 ounces maximum.
Electrical Performance Limits and Conditions
Unless otherwise specified, the electrical performance limits and conditions shall be as specified in Table II
herein.
Spurious Output Frequencies
The oscillator shall not break into other (unwanted) modes of oscillations.
Delta Criteria
The crystal oscillator shall meet the parameter delta criteria of Table II herein. The change in the parameter
(delta) shall be calculated between the initial measurement and the present (interim or final) measurement.
Marking
Each unit shall be permanently marked with the manufacturer's name or symbol, part number, lot date code num-
ber, and serial number. The unit shall be marked with the outline of an equilateral triangle near pin 1 to show
that it contains devices which are sensitive to electrostatic discharge.
Traceability
Material, element, and process traceability requirements shall be as specified by MIL-PRF-38534 for Class K hy-
brid microcircuits.
Rework Provisions
Rework shall be in accordance with the provisions of MIL-PRF-38534 except rebonding to microcircuit ele-
ments shall be as specified by MIL-PRF-38535 and transistor elements shall be as specified by MIL-PRF-19500.
Prototype Oscillators
The requirements for the prototype oscillators shall be as follows:
a) Prototype oscillators need only meet the form, fit, and function of the flight units.
Engineering Model (EM) Oscillators
The requirements for engineering model oscillators shall be as follows:
a) Design and manufacturing processes shall be identical to flight units.
b) Finished units shall be functional over the operating temperature range.
c) Screening test and/or Quality Conformance Inspection is not required.
d) Engineering model oscillators shall be suitably identified.
Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-tech .com
QPDS-0016 Rev.A, Sept 2015
3 of 22
QT725S SERIES
VOLTAGE CONTROLLED SPACE QUALIFIED SAW OSCILLATOR
Q-TECH
CORPORATION
3.3 and 5.0Vdc - 400 MHz to 1.3 GHz
2.0
2.1
2.2
2.2.1
2.2.2
2.2.3
2.2.4
2.2.5
2.2.6
2.2.7
QUALITY ASSURANCE PROVISIONS
Responsibility for Tests and Inspections
Unless otherwise specified in the contract or purchase order, the supplier shall be responsible for the perform-
ance of all inspection requirements as specified. Except as otherwise specified in the contract or purchase
order, the supplier may use their own or any other facilities suitable for the performance of the inspection re-
quirements specified herein, unless disapproved by the Customer. The Customer reserves the right to perform
any of the inspections set forth in the specification where such inspections are deemed necessary to assure sup-
plies and services conform to prescribed requirements, and to return any product failing to meet the specified
requirements.
Screening
Hybrid crystal oscillators shall have been subjected to and successfully passed all screening tests as specified in
Table IV or Table X herein in order to be acceptable for delivery. All variable data shall be read and recorded.
Devices which fail any test criteria in the screening sequence shall be removed from the lot at the time of obser-
vation or immediately at the conclusion of the test in which the failure was observed. Once rejected and veri-
fied as a device failure, rework and subsequent rescreening in accordance with the rework provisions may be
performed.
Nondestructive Wire Bond Pull
Except for the wires connecting the crystal to the circuit (if applicable), 100% nondestructive wire bond pull
shall be performed on each hybrid crystal oscillator in accordance with MIL-STD-883, Method 2023. The total
number of failed wires and the total number of devices failed shall be recorded. The lot shall have a percent de-
fective allowable (PDA) of 2% or less based on the total number of wires pulled in the production lot.
Internal Visual Inspection
Internal visual inspection shall be in accordance with the Condition K (Class S) requirements of MIL-STD-883,
Methods 2017 and 2032. During the time interval between final internal visual inspection and preparation for
sealing, hybrid crystal oscillators shall be stored in a dry, controlled environment as defined in MIL-STD-883,
Method 2017, or in a vacuum bake oven. The following details shall apply:
a) The final internal visual inspection shall occur after crystal resonator installation and prior
to cover seal.
b) Hybrid crystal oscillator inspection and preparation for sealing shall be in a class 100
environment as defined in Federal Standard 209 (ISO Standard 14644).
c) Hybrid crystal oscillators shall be in a covered container when transferred from one controlled
environment to another.
Stabilization Bake
Stabilization bake shall be performed prior to package seal. Stabilization bake shall be performed in a vacuum
environment.
Temperature Cycling
Unless otherwise specified, temperature cycling shall be in accordance with Table IV or Table X herein.
Constant Acceleration
Constant acceleration shall be performed in the Y1 orientation.
Particle Impact Noise Detection (PIND) Test
PIND testing shall be performed in accordance with MIL-STD-883, Method 2020, Condition B. The PIND test
shall be performed using five independent passes and all failures found at the end of each pass are rejected.
The survivors of the last pass are acceptable. The cumulative number of defective devices shall not exceed
25%.
Pre Burn-In Electrical Characteristics Test
Unless otherwise specified, pre burn-in electrical testing shall consist of the tests listed in Table IX or Table Xd.
Electrical performance limits shall be in accordance with Table III herein.
Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-tech .com
QPDS-0016 Rev.A, Sept 2015
4 of 22
QT725S SERIES
VOLTAGE CONTROLLED SPACE QUALIFIED SAW OSCILLATOR
Q-TECH
CORPORATION
3.3 and 5.0Vdc - 400 MHz to 1.3 GHz
2.2.8
2.2.9
2.2.10
2.2.10.1
2.2.10.2
2.2.11
2.2.12
2.2.13
2.2.13.1
2.2.13.2
2.2.14
2.3
2.3.1
2.3.2
Burn-In
The burn-in period shall be 320 hours minimum. The 320 hour burn-in period shall be divided into two suc-
cessive 160-hour minimum burn-in periods. Electrical testing shall be performed after the first burn-in period
to select acceptable devices for the second burn-in period.
Interim Electrical Testing
Unless otherwise specified, interim electrical testing shall consist of the tests listed in Table IX or Table Xd.
Electrical performance limits shall be in accordance with Table III herein.
Final Electrical Testing
Unless otherwise specified, final electrical testing shall consist of the tests listed in Table IX or Table Xd. Elec-
trical performance limits shall be in accordance with Table III herein.
Delta Limits Review
Unless otherwise specified, delta limits shall be in accordance with Table II herein.
Percent Defective Allowable (PDA)
The percent defective allowable shall be 2% or one device, whichever is greater. PDA accountability shall be
based on failures occurring during the second period of burn-in only. PDA shall be applicable to the +25°C
supply current only.
Seal Test
Seal test may be performed in any sequence between the final electrical test and the external visual but it shall
be performed after all shearing and forming operations on the terminals. All hybrid crystal oscillators having
any physical processing steps (e.g. solder dipping to the glass seal) performed following seal or external visual
shall be retested for hermeticity and visual defects.
Radiographic Inspection
Radiographic inspection shall be performed in accordance with MIL-STD-883, Method 2012, views X-, Y-,
and Z-axis.
Frequency Aging
The energized hybrid crystal oscillator(s) shall be maintained at a temperature of 70 ± 3 °C for a continuous pe-
riod of 30 days. Unless otherwise specified, the frequency of the oscillator shall be measured in accordance
with MIL-PRF-55310. The measuring instrument's accuracy shall be commensurate with the required accu-
racy of the oscillator. The same measuring instruments shall be used throughout the aging test. If any condi-
tion develops that will change the temperature of the oscillator from the aging temperature for a time interval
of more than one hour, no measurement shall be made until 24 hours after the temperature restoration and the
specified test period shall be lengthened by the length of time that the temperature failed.
When performing screening in accordance with Table IV, Aging tests may be terminated after 15 days if the
drift does not exceed one-half of the specified Aging rate.
External Visual
The final external visual screen shall be conducted in accordance with MIL-STD-883, Method 2009 after all
other 100% screens have been performed to determine that no damage to, or contamination of the package ex-
terior has occurred.
Quality Conformance Inspection (QCI)
Quality conformance inspection shall be as specified herein. All records shall be traceable to the lot number
and unit serial number. Samples used for Group A that pass all tests may be delivered on contract.
Oscillator Group A Inspection
Group A inspection shall be conducted in accordance with Table V or Table Xa herein. Group A inspection
shall be performed on units that have passed the screening tests. All electrical performance tests shall be
performed during Group A with the exception of any tests performed as part of final electrical testing during
100% screening.
Oscillator Group B Inspection
Group B inspection shall be conducted in accordance with Table VI or Table Xb herein. The screening test
Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-tech .com
QPDS-0016 Rev.A, Sept 2015
5 of 22
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