DATASHEET
ACS374MS
Radiation HardenedOctal D Flip-Flop, Three-State
FN3997
Rev 0.00
April 1995
Features
• 1.25 Micron Radiation Hardened SOS CMOS
• Total Dose 300K RAD (Si)
• Single Event Upset (SEU) Immunity
<1 x 10
-10
Errors/Bit-Day (Typ)
• SEU LET Threshold >80 MEV-cm
2
/mg
• Dose Rate Upset >10
11
Pinouts
20 LEAD CERAMIC DUAL-IN-LINE
MIL-STD-1835 DESIGNATOR CDIP2-T20, LEAD FINISH C
TOP VIEW
OE
Q0
D0
D1
Q1
Q2
D2
D3
Q3
1
2
3
4
5
6
7
8
9
20 VCC
19 Q7
18 D7
17 D6
16 Q6
15 Q5
14 D5
13 D4
12 Q4
11 CP
RAD (Si)/s, 20ns Pulse
• Latch-Up Free Under Any Conditions
• Military Temperature Range: -55
o
C to +125
o
C
• Significant Power Reduction Compared to ALSTTL Logic
• DC Operating Voltage Range: 4.5V to 5.5V
• Input Logic Levels
- VIL = 30% of VCC Max
- VIH = 70% of VCC Min
• Input Current
1A
at VOL, VOH
GND 10
20 LEAD CERAMIC FLATPACK
MIL-STD-1835 DESIGNATOR CDFP4-F20, LEAD FINISH C
TOP VIEW
OE
Q0
D0
D1
Q1
Q2
D2
D3
Q3
GND
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
VCC
Q7
D7
D6
Q6
Q5
D5
D4
Q4
CP
Description
The Intersil ACS374MS is a radiation hardened octal D-type
flip-flop with three-state outputs. The eight edge-triggered flip-
flops enter data into their registers on the low to high transition
of clock (CP). The Output Enable (OEN) controls the three-state
outputs and is independent of the register operation. When the
OEN is high, the outputs will be in the high impedance state.
The ACS374MS utilizes advanced CMOS/SOS technology to
achieve high-speed operation. This device is a member of the
radiation hardened, high-speed, CMOS/SOS Logic Family.
Ordering Information
PART NUMBER
ACS374DMSR
ACS374KMSR
ACS374D/Sample
ACS374K/Sample
ACS374HMSR
TEMPERATURE RANGE
-55 C to +125 C
-55
o
C
o
o
SCREENING LEVEL
Intersil Class S Equivalent
Intersil Class S Equivalent
Sample
Sample
Die
PACKAGE
20 Lead SBDIP
20 Lead Ceramic Flatpack
20 Lead SBDIP
20 Lead Ceramic Flatpack
Die
to
+125
o
C
o
+25 C
+25
o
C
+25 C
o
Truth Table
INPUTS
OE
L
L
L
H
H = High Level
L = Low Level
X = Immaterial
Z = High Imped-
ance
Q0
X
X
CP
Dn
H
L
X
X
OUTPUTS
Qn
H
L
Q0
Z
Functional Diagram
1 OF 8
D
COMMON CONTROLS
CP
FF
D
Q
OE
Q
CP
= Transition from Low to High Level
= the level of Q before the indicated input
conditions were established
OE
FN3997 Rev 0.00
April 1995
Page 1 of 8
ACS374MS
Absolute Maximum Ratings
Supply Voltage (VCC). . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to +6.0V
Input Voltage Range . . . . . . . . . . . . . . . . . . . . . .-0.5V to VCC +0.5V
DC Input Current, Any One Input
10mA
DC Drain Current, Any One Output
50mA
Storage Temperature Range (TSTG) . . . . . . . . . . . -65
o
C to +150
o
C
Lead Temperature (Soldering 10s) . . . . . . . . . . . . . . . . . . . . +265
o
C
Junction Temperature (TJ) . . . . . . . . . . . . . . . . . . . . . . . . . . +175
o
C
ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1
(All Voltages Reference to VSS)
Reliability Information
Thermal Impedance
JA
JC
o
DIP. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
72 C/W
24
o
C/W
o
C/W
Flatpack . . . . . . . . . . . . . . . . . . . . . . . . . . 107
28
o
C/W
o
C
Maximum Package Power Dissipation at +125
DIP. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.7W
Flatpack . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.5W
Maximum Device Power Dissipation. . . . . . . . . . . . . . . . . . .(TBD)W
Gate Count . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42 Gates
CAUTION: As with all semiconductors, stress listed under “Absolute Maximum Ratings” may be applied to devices (one at a time) without resulting in permanent
damage. This is a stress rating only. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. The conditions listed
under “Electrical Performance Characteristics” are the only conditions recommended for satisfactory device operation.
Operating Conditions
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +4.5V to +5.5V
Input Rise and Fall Times at 4.5V VCC (TR, TF) . . . . . . 10ns/V Max
Operating Temperature Range (T
A
) . . . . . . . . . . . . -55
o
C to +125
o
C
Input High Voltage (VIH) . . . . . . . . . . . . . . . . . . VCC to 70% of VCC
Input Low Voltage (VIL). . . . . . . . . . . . . . . . . . . . .0V to 30% of VCC
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
GROUP
A SUB-
GROUPS
1
2, 3
1
2, 3
1
2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1
2, 3
1
2, 3
7, 8A, 8B
LIMITS
TEMPERATURE
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C, +125
o
C, -55
o
C
+25
o
C, +125
o
C, -55
o
C
+25
o
C, +125
o
C, -55
o
C
+25
o
C, +125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C, +125
o
C, -55
o
C
MIN
-
-
-12
-8
12
8
VCC -0.1
VCC -0.1
-
-
-
-
-
-
-
MAX
20
400
-
-
-
-
-
-
0.1
0.1
0.5
1.0
1
35
-
UNITS
A
A
mA
mA
mA
mA
V
V
V
V
A
A
A
A
V
PARAMETER
Supply Current
SYMBOL
ICC
(NOTE 1)
CONDITIONS
VCC = 5.5V,
VIN = VCC or GND
VCC = VIH = 4.5V,
VOUT = VCC -0.4V,
VIL = 0V, (Note 2)
VCC = VIH = 4.5V,
VOUT = 0.4V,
VIL = 0V, (Note 2)
VCC = 5.5V, VIH = 3.85V
VIL = 1.65V, IOH = -50A
VCC = 4.5V, VIH = 3.15V,
VIL = 1.35V, IOH = -50A
Output Current
(Source)
Output Current
(Sink)
Output Voltage High
IOH
IOL
VOH
Output Voltage Low
VOL
VCC = 5.5V, VIH = 3.85V
VIL = 1.65V, IOH = 50A
VCC = 4.5V, VIH = 3.15V,
VIL = 1.35V, IOH = 50A
Input Leakage
Current
Three-State Output
Leakage Current
Noise Immunity
Functional Test
NOTES:
IIN
VCC = 5.5V,
VIN = VCC or GND
VCC = 5.5V,
Force Voltage = 0V or VCC
VCC = 4.5V, VIH = 3.15V,
VIL = 1.35V, (Note 3)
IOZ
FN
1. All voltages referenced to device GND.
2. Force/measure functions may be interchanged.
3. For functional tests, VO
4.0V
is recognized as a logic “1”, and VO
0.5V
is recognized as a logic “0”.
FN3997 Rev 0.00
April 1995
Page 2 of 8
ACS374MS
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS
GROUP
A SUB-
GROUPS
9
10, 11
9
10, 11
9
10, 11
9
10, 11
9
10, 11
9
10, 11
LIMITS
TEMPERATURE
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
MIN
2
2
2
2
2
2
2
2
2
2
2
2
MAX
14
17
16
20
15
19
16
20
15
19
15
19
UNITS
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
PARAMETER
Propagation Delay
SYMBOL
TPHL1
(NOTES 1, 2)
CONDITIONS
VCC = 4.5V, VIH = 4.5V,
VIL = 0V
VCC = 4.5V, VIH = 4.5V,
VIL = 0V
VCC = 4.5V, VIH = 4.5V,
VIL = 0V
VCC = 4.5V, VIH = 4.5V,
VIL = 0V
VCC = 4.5V, VIH = 4.5V,
VIL = 0V
VCC = 4.5V, VIH = 4.5V,
VIL = 0V
TPLH1
TPZL1
TPZH1
TPLZ1
TPHZ1
NOTES:
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500, CL = 50pF, Input TR = TF = 3ns.
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
LIMITS
PARAMETER
Capacitance Power
Dissipation
Input Capacitance
SYMBOL
CPD
CONDITIONS
VCC = 5.0V, VIH = 5.0V,
VIL = 0V, f = 1MHz
VCC = 5.0V, VIH = 5.0V,
VIL = 0V, f = 1MHz
VCC = 5.0V, VIH = 5.0V,
VIL = 0V, f = 1MHz
VCC = 4.5V, VIH = 4.5V,
VIL = 0V
VCC = 4.5V, VIH = 4.5V,
VIL = 0V
VCC = 4.5V, VIH = 4.5V,
VIL = 0V
VCC = 4.5V, VIH = 4.5V,
VIL = 0V
NOTE
1
TEMP
+25
o
C
+125
o
C
1
+25
o
C
+125
o
C
1
+25
o
C
+125
o
C
1
+25
o
C
+125
o
C
1
+25
o
C
+125
o
C
1
+25
o
C
+125
o
C
1
+25
o
C
+125
o
C
MIN
-
-
-
-
-
-
4.5
5
3.5
4
3.5
4
0
0
TYP
25
30
-
-
-
-
-
-
-
-
-
-
-
-
MAX
-
-
10
10
20
20
-
-
-
-
-
-
100
100
UNITS
pF
pF
pF
pF
pF
pF
ns
ns
ns
ns
ns
ns
MHz
MHz
CIN
Output Capacitance
COUT
Pulse Width Time
TW
Setup Time
TSU
Hold Time
TH
Maximum Frequency
CP
NOTE:
FMAX
1. The parameters listed in Table 3 are controlled via design or process parameters. Min and Max Limits are guaranteed but not directly
tested. These parameters are characterized upon initial design release and upon design changes which affect these characteristics.
FN3997 Rev 0.00
April 1995
Page 3 of 8
ACS374MS
TABLE 4. POST IRRADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
RAD LIMITS
PARAMETER
Supply Current
Output Current (Source)
SYMBOL
ICC
IOH
(NOTE 1)
CONDITIONS
VCC = 5.5V, VIN = VCC or GND
VCC = VIH = 4.5V,
VOUT = VCC -0.4V, VIL = 0
VCC = VIH = 4.5V, VOUT = 0.4V,
VIL = 0
VCC = 5.5V, VIH = 3.85V,
VIL = 1.65V, IOH = -50A
VCC = 4.5V, VIH = 3.15V,
VIL = 1.35V, IOH = -50A
Output Voltage Low
VOL
VCC = 5.5V, VIH = 3.85V,
VIL = 1.65V, IOH = 50A
VCC = 4.5V, VIH = 3.15V,
VIL = 1.35V, IOH = 50A
Input Leakage Current
Three-State Output
Leakage Current
Noise Immunity
Functional Test
Propagation Delay
IIN
IOZ
VCC = 5.5V, VIN = VCC or GND
VCC = 5.5V,
Force Voltage = 0V or VCC
VCC = 4.5V, VIH = 3.15V,
VIL = 1.35V, (Note 2)
VCC = 4.5V, VIH = 4.5V, VIL = 0V
VCC = 4.5V, VIH = 4.5V, VIL = 0V
VCC = 4.5V, VIH = 4.5V, VIL = 0V
VCC = 4.5V, VIH = 4.5V, VIL = 0V
VCC = 4.5V, VIH = 4.5V, VIL = 0V
VCC = 4.5V, VIH = 4.5V, VIL = 0V
TEMP
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
MIN
-
-8
MAX
400
-
UNITS
A
mA
Output Current (Sink)
IOL
8
-
mA
Output Voltage High
VOH
VCC -0.1
-
V
VCC -0.1
-
V
-
0.1
V
-
0.1
V
-
-
1
35
A
A
FN
-
-
V
TPHL1
TPLH1
TPZL1
TPZH1
TPLZ1
TPHZ1
2
2
2
2
2
2
17
20
19
20
19
19
ns
ns
ns
ns
ns
ns
NOTES:
1. All voltages referenced to device GND.
2. For functional tests, VO
4.0V
is recognized as a logic “1”, and VO
0.5V
is recognized as a logic “0”.
TABLE 5. DELTA PARAMETERS (+25
o
C)
(NOTE1)
DELTA LIMIT
4.0
200
15
PARAMETER
Supply Current
Three-State Leakage Current
Output Current
NOTE:
ICC
IOZ
IOL/IOH
SYMBOL
UNITS
A
nA
%
1. All delta calculations are referenced to 0 hour readings or pre-life readings.
FN3997 Rev 0.00
April 1995
Page 4 of 8
ACS374MS
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUP
Initial Test (Preburn-In)
Interim Test 1 (Postburn-In)
Interim Test 2 (Postburn-In)
PDA
Interim Test 3 (Postburn-In)
PDA
Final Test
Group A (Note 1)
Group B
Subgroup B-5
Subgroup B-6
Group D
NOTE:
1. Alternate Group A testing may be exercised in accordance with MIL-STD-883, Method 5005.
METHOD
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
Sample/5005
Sample/5005
Sample/5005
Sample/5005
GROUP A SUBGROUPS
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9, Deltas
1, 7, 9
1, 7, 9, Deltas
2, 3, 8A, 8B, 10, 11
1, 2, 3, 7, 8A, 8B, 9, 10, 11
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
1, 7, 9
1, 7, 9
Subgroups 1, 2, 3, 9, 10, 11
ICC, IOL/H, IOZL/H
READ AND RECORD
ICC, IOL/H, IOZL/H
ICC, IOL/H, IOZL/H
ICC, IOL/H, IOZL/H
TABLE 7. TOTAL DOSE IRRADIATION
TEST
CONFORMANCE GROUP
Group E Subgroup 2
NOTE:
1. Except FN test which will be performed 100% Go/No-Go.
METHOD
5005
PRE RAD
1, 7, 9
POST RAD
Table 4
READ AND RECORD
PRE RAD
1, 9
POST RAD
Table 4 (Note 1)
TABLE 8. BURN-IN TEST CONNECTIONS (+125
o
C < TA < 139
o
C)
OSCILLATOR
OPEN
STATIC BURN-IN 1 (Note 1)
-
STATIC BURN-IN 2 (Note 1)
-
DYNAMIC BURN-IN (Note 1)
-
NOTE:
1. Each pin except VCC and GND will have a series resistor of 500
5%.
1, 10
2, 5, 6, 9, 12, 15, 16, 19
20
11
3, 4, 7, 8, 13,
14, 17, 18
10
2, 5, 6, 9, 12, 15, 16, 19
1, 3, 4, 7, 8, 11, 13,
14, 17, 18, 20
-
-
1, 3, 4, 7, 8, 10, 11,
13, 14, 17, 18
2, 5, 6, 9, 12, 15, 16, 19
20
-
-
GROUND
1/2 VCC = 3V
0.5V
VCC = 6V
0.5V
50kHz
25kHz
TABLE 9. IRRADIATION TEST CONNECTIONS (TA = +25
o
C,
5
o
C)
FUNCTION
Irradiation Circuit (Note 1)
NOTE:
1. Each pin except VCC and GND will have a series resistor of 47k
5%.
Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures.
OPEN
2, 5, 6, 9, 12, 15, 16, 19
GROUND
10
VCC = 5V
0.5V
1, 3, 4, 7, 8, 11, 13, 14, 17, 18, 20
FN3997 Rev 0.00
April 1995
Page 5 of 8
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