HCF4077B
QUAD EXCLUSIVE NOR GATE
s
s
s
s
s
s
MEDIUM-SPEED OPERATION
t
PHL
= t
PLH
= 65ns (Typ.) at CL = 50 pF and
V
DD
= 10V
QUIESCENT CURRENT SPECIFIED UP TO
20V
5V, 10V AND 15V PARAMETRIC RATINGS
INPUT LEAKAGE CURRENT
I
I
= 100nA (MAX) AT V
DD
= 18V T
A
= 25°C
100% TESTED FOR QUIESCENT CURRENT
MEETS ALL REQUIREMENTS OF JEDEC
JESD13B " STANDARD SPECIFICATIONS
FOR DESCRIPTION OF B SERIES CMOS
DEVICES"
DIP
ORDER CODES
PACKAGE
DIP
SOP
TUBE
DESCRIPTION
The HCF4077B is a monolithic integrated circuit
fabricated in Metal Oxide Semiconductor
technology available in DIP and SOP packages.
The HCF4077B contains four independent
exclusive NOR gates. This device provides the
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-
system designer with a means for direct
implementation of the exclusive-NOR. For
applications as logical comparators, adders/
subtractors, parity generator and checkers.
so
b
te
le
HCF4077BEY
HCF4077BM1
ro
P
uc
d
SOP
s)
t(
T&R
HCF4077M013TR
PIN CONNECTION
September 2001
1/7
HCF4077B
INPUT EQUIVALENT CIRCUIT
PIN DESCRIPTION
PIN No
1, 5, 8, 12
2, 6, 9, 13
3, 4, 10, 11
7
14
SYMBOL
A, C, E, G
B, D, F, H
J, K, L, M
V
SS
V
DD
NAME AND FUNCTION
Data Inputs
Data inputs
Data Outputs
Negative Supply Voltage
Positive Supply Voltage
TRUTH TABLE
INPUTS
A, C, E, G
B, D, F, H
L
H
L
H
OUTPUT
J, K, L, M
H
L
L
H
LOGIC DIAGRAM
L
L
H
H
ABSOLUTE MAXIMUM RATINGS
Symbol
V
DD
V
I
I
I
b
O
et
l
so
P
D
T
op
T
stg
Supply Voltage
ro
P
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d
s)
t(
O
-
so
b
te
le
ro
P
uc
d
s)
t(
Parameter
Value
-0.5 to +22
-0.5 to V
DD
+ 0.5
±
10
200
100
-55 to +125
-65 to +150
Unit
V
V
mA
mW
mW
°C
°C
DC Input Voltage
DC Input Current
Power Dissipation per Package
Power Dissipation per Output Transistor
Operating Temperature
Storage Temperature
Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is
not implied.
All voltage values are referred to V
SS
pin voltage.
RECOMMENDED OPERATING CONDITIONS
Symbol
V
DD
V
I
T
op
Supply Voltage
Input Voltage
Operating Temperature
Parameter
Value
3 to 20
0 to V
DD
-55 to 125
Unit
V
V
°C
2/7
HCF4077B
DC SPECIFICATIONS
Test Condition
Symbol
Parameter
V
I
(V)
0/5
0/10
0/15
0/20
0/5
0/10
0/15
5/0
10/0
15/0
0.5/4.5
1/9
1.5/13.5
4.5/0.5
9/1
13.5/1.5
2.5
4.6
9.5
13.5
0.4
0.5
1.5
V
O
(V)
|I
O
| V
DD
(µA) (V)
5
10
15
20
5
10
15
5
10
15
5
10
15
5
10
15
5
5
10
15
5
10
15
18
T
A
= 25°C
Min.
Typ.
0.02
0.02
0.02
0.04
4.95
9.95
14.95
0.05
0.05
0.05
3.5
7
11
3.5
7
11
Max.
1
2
4
20
4.95
9.95
14.95
0.05
0.05
0.05
Value
-40 to 85°C
Min.
Max.
30
60
120
600
4.95
9.95
14.95
-55 to 125°C
Min.
Max.
30
60
120
600
Unit
I
L
Quiescent Current
µA
V
OH
High Level Output
Voltage
Low Level Output
Voltage
High Level Input
Voltage
Low Level Input
Voltage
Output Drive
Current
V
OL
V
IH
V
IL
I
OH
I
OL
Output Sink
Current
Input Leakage
Current
Input Capacitance
0/5
0/5
0/10
0/15
0/5
0/10
0/15
0/18
I
I
C
I
The Noise Margin for both "1" and "0" level is: 1V min. with V
DD
=5V, 2V min. with V
DD
=10V, 2.5V min. with V
DD
=15V
DYNAMIC ELECTRICAL CHARACTERISTICS
(T
amb
= 25°C, C
L
= 50pF, R
L
= 200KΩ, t
r
= t
f
= 20 ns)
O
bs
Symbol
et
l
o
ro
P
e
Parameter
uc
d
s)
t(
<1
<1
<1
<1
<1
<1
<1
<1
<1
<1
<1
<1
<1
<1
<1
<1
<1
<1
<1
O
-
-1.36
-0.44
-1.1
-3.0
0.44
1.1
3.0
so
b
te
le
1.5
3
4
r
P
d
o
1.5
3
4
uc
3.5
7
11
s)
t(
0.05
0.05
0.05
1.5
3
4
V
V
V
V
-3.2
-1
-2.6
-6.8
1
2.6
6.8
±0.1
7.5
-1.15
-0.36
-0.9
-2.4
0.36
0.9
2.4
±1
-1.1
-0.36
-0.9
-2.4
0.36
0.9
2.4
±1
mA
mA
µA
pF
Any Input
±10
-5
5
Any Input
Test Condition
V
DD
(V)
5
10
15
5
10
15
Min.
Value (*)
Typ.
140
65
50
100
50
40
Max.
280
130
100
200
100
80
Unit
t
PLH
t
PHL
Propagation Delay Time
ns
t
TLH
t
THL
Output Transition Time
ns
(*) Typical temperature coefficient for all V
DD
value is 0.3 %/°C.
3/7
HCF4077B
TEST CIRCUIT
C
L
= 50pF or equivalent (includes jig and probe capacitance)
R
L
= 200KΩ
R
T
= Z
OUT
of pulse generator (typically 50Ω)
WAVEFORM : PROPAGATION DELAY TIMES
(f=1MHz; 50% duty cycle)
bs
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P
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t(
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t(
4/7
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