HCC4527B
HCF4527B
BCD RATE MULTIPLEXER
.
.
.
.
.
.
.
.
CASCADABLE IN MULTIPLES OF 4-BITS
SET TO 9 INPUT AND 9 DETECT OUTPUT
QUIESCENT CURRENT SPECIFIED TO 20V
FOR HCC DEVICE
STANDARDIZED SYMMETRICAL OUTPUT
CHARACTERISTICS
5V, 10V AND 15V PARAMETRIC RATINGS
INPUT CURRENT OF 100nA AT 18V AND 25
o
C
FOR HCC DEVICE
100% TESTED FOR QUIESCENT CURRENT
MEETS ALL REQUIREMENTS OF JEDEC TEN-
TATIVE STANDARD N. 13A, ” STANDARD
SPECIFICATIONS FOR DESCRIPTION OF B
SERIES CMOS DEVICES ”
EY
(Plastic Package)
F
(Ceramic Package)
C1
(Chip Carrier)
ORDER CODES :
HCC4076BF
HCF4076BEY
HCF4076BC1
PIN CONNECTIONS
DESCRIPTION
The
HCC4527B
(extended temperature range) and
HCF4527B
(intermediate temperature range) are
monolithic integrated circuit, available in 16-lead
dual in line plastic or ceramic package.
The
HCC/HCF4527B
is a low power 4 bit digital rate
multiplier that provides an output pulse rate which is
the clock input pulse rate multiplied by 1/10 times the
BCD input. For example, when the BCD input is 8,
there will be 8 output pulses for every 10 input
pulses. This device may be used to preform arith-
metic operations (add, subtract, divide, raise to a
power), solve algebraic and differential equations,
generate naturel logarithms and trigonometric func-
September 1990
1/13
HCC/HCF4527B
FUNCTIONAL DIAGRAM
ABSOLUTE MAXIMUM RATING
Symbol
V
DD
*
V
i
I
I
P
tot
Parameter
Supply Voltage:
HCC
Types
HCF
Types
Input Voltage
DC Input Current (any one input)
Total Power Dissipation (per package)
Dissipation per Output Transistor
for Top = Full Package Temperature Range
Operating Temperature:
HCC
Types
HCF
Types
Storage Temperature
Value
-0.5 to +20
-0.5 to +18
-0.5 to V
DD
+ 0.5
±
10
200
100
-55 to +125
-40 to +85
-65 to +150
Unit
V
V
V
mA
mW
mW
o
o
T
op
T
stg
C
C
o
C
Stresses above those listed under ”Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress ratingonly and functional
operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure
to absolute maximum rating conditions for external periods may affect device reliability.
* All voltage values are referred to V
SS
pin voltage.
RECOMMENDED OPERATING CONDITIONS
Symbol
V
DD
V
I
T
op
Parameter
Supply Voltage:
HCC
Types
HCF
Types
Input Voltage
Operating Temperature:
HCC
Types
HCF
Types
Value
3 to 18
3 to 15
0 to V
DD
-55 to +125
-40 to +85
Unit
V
V
V
o
o
C
C
2/13
HCC/HCF4527B
TRUTH TABLE
Inputs
Number of Pulsed or Logic Level
(0 = Low; 1 = High; X = Don’t Care)
D
0
0
0
0
0
0
0
0
1
1
1
1
1
1
1
1
X
X
X
1
0
X
C
0
0
0
0
1
1
1
1
0
0
0
0
1
1
1
1
X
X
X
X
X
X
B
0
0
1
1
0
0
1
1
0
0
1
1
0
0
1
1
X
X
X
X
X
X
A
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
X
X
X
X
X
X
CLK
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
INH IN
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1
0
0
0
0
0
STR
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1
0
0
0
0
CAS
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1
0
0
0
CLR
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1
1
0
SET
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1
Outputs
Number of Pulses or Output
Logic Level
(L = LOW; H = High)
OUT
L
1
2
3
4
5
6
7
8
9
8
9
8
9
8
9
s
L
H
10
L
L
OUT
H
1
2
3
4
5
6
7
8
9
8
9
8
9
8
9
s
H
q
10
H
H
INH
OUT
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
H
1
1
H
H
L
”9”
OUT
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
s
1
1
L
L
H
q
Output same as the first 16 lines of this truth table (depending on value of A, B, C, D)
s
Depends on internal state of counter.
4/13
HCC/HCF4527B
STATIC ELECTRICAL CHARACTERISTICS
(over recommended operating conditions)
Test Conditios
Symbol
I
L
Parameter
Quiescent
Current
V
I
(V)
0/5
HCC
Types
0/10
0/15
0/20
HCF
Types
V
OH
Output High
Voltage
Output Low
Voltage
Input High
Voltage
Input Low
Voltage
Output
Drive
Current
0/5
HCC
Types
0/5
0/10
0/15
0/5
HCF
Types
0/5
0/10
0/15
I
OL
Output
Sink
Current
HCC
Types
HCF
Types
I
IH
, I
IL
C
I
o
Value
T
LOW
*
Min. Max.
5
10
20
100
20
40
80
4.95
9.95
14.95
0.05
0.05
0.05
3.5
7
11
1.5
3
4
-2
-0.64
-1.6
-4.2
-1.53
-0.52
-1.3
-3.6
0.64
1.6
4.2
0.53
1.3
3.6
±0.1
±0.3
-1.6
-0.51
-1.3
-3.4
-1.36
-0.44
-1.1
-3.0
0.51
1.3
3.4
0.44
1.1
3.0
-3.2
-1
-2.6
-6.8
-3.2
-1
-2.6
-6.8
1
2.6
6.8
1
2.6
6.8
±10
±10
-5
5
-5
V
O
(V)
|I
O
| V
DD
(µA) (V)
5
10
15
20
5
10
<1
<1
<1
<1
<1
<1
<1
<1
<1
<1
<1
<1
15
5
10
15
5
10
15
5
10
15
5
10
15
5
5
10
15
5
5
10
15
5
10
15
5
10
15
18
15
25
o
C
Min. Typ. Max.
0.04
0.04
0.04
0.08
0.04
0.04
0.04
4.95
9.95
14.95
0.05
0.05
0.05
3.5
7
11
1.5
3
4
5
10
20
100
20
40
80
T
HIGH
*
Min. Max.
150
300
600
3000
150
300
600
4.95
9.95
14.95
0.05
0.05
0.05
3.5
7
11
1.5
3
4
-1.15
-0.36
-0.9
-2.4
-1.1
-0.36
-0.9
-2.4
0.36
0.9
2.4
0.36
0.9
2.4
Unit
µA
0/5
0/10
0/15
0/5
0/10
0/15
5/0
10/0
15/0
0.5/4.5
1/9
1.5/13.5
4.5/0.5
9/1
13.5/1.5
2.5
4.6
9.5
13.5
2.5
4.6
9.5
13.5
0.4
0.5
1.5
0.4
0.5
1.5
Any Input
Any Input
V
V
OL
V
V
IH
V
V
IL
V
I
OH
mA
0/5
0/10
0/15
0/5
0/10
0/15
0/18
0/15
mA
Input Leakage
Current
Input Capacitance
o
±0.1
±0.3
7.5
±1
±1
µA
µA
pF
* T
LOW
= -55 C for
HCC
device: -40 C for
HCF
device.
* T
HIGH
= +125
o
C for
HCC
device: +85
o
C for
HCF
device.
The Noise Margin for both ”1” and ”0” level is: 1V min. with V
DD
= 5 V, 2 V min. with V
DD
= 10 V, 2.5 V min. with V
DD
= 15 V
5/13
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