Thick Film Chip Resistors
CR, CJ Series
FEATURES
• Low Noise
• Nickel Barrier Terminations
APPLICATION
• General Purpose
HOW TO ORDER
CR 05 - 472 J - H
Packaging
T = 7” Reel/Punched Paper Tape
(5,000 pcs/reel) except CR05
H = 7” Reel/Punched Paper Tape
(10,000 pcs/reel, 2mm pitch taping)
CR05 and CR10
D = 10” Reel/Punched Paper Tape
(10,000 pcs/reel) CR32, CR21, CR10
K = 13” Reel/Punched Paper Tape
(20,000 pcs/reel) except CR05
(optional)
STRUCTURE AND MATERIAL
A
B
Resistance Tolerance
C
D
E
D = ±0.5%
F = ±1%
Example:
J = ±5%
Blank = Jumper Chips
Resistance Value
(3 digits or 4 digits)
Material
562 = 56x10
2
= 5600Ω
4021 = 402x10
1
= 4020Ω
Chip Jumper = 000
21 = 0805
32 = 1206
Code
A
B
C
D
E
Structure
Coating
Resistor
Substrate
Termination
Plating
Glass or Epoxy
RuO
2
Resistor
(The same material of
Termination for chip jumper)
96% Alumina
Silver
(Ni, Sn-Pb) Plating
Size (EIA)
05 = 0402
10 = 0603
Series
CR = Resistor CJ = Jumper
DIMENSIONS
L
millimeters (inches)
CR05, CJ05 (0402)
W
W
CR10, CJ10 (0603) CR21, CJ21 (0805)
+0.15
0.80mm
-0.10
(0.031
+0.006
)
-0.004
1.60±0.10
(0.063±0.004)
0.25±0.20
(0.010±0.008)
+0.20
0.20mm
-0.15
+0.008
(0.008mmn)
-0.006
0.50±0.10
(0.020±0.004)
+0.15
1.25mm
-0.10
+0.006
(0.050mmn)
-0.004
2.00±0.10
(0.080±0.004)
0.35±0.20
(0.014±0.008)
0.40±0.20
(0.016±0.008)
0.55±0.10
(0.022±0.004)
CR32, CJ32 (1206)
+0.15
1.55mm
-0.10
+0.006
(0.061mmn)
-0.004
3.10±0.10
(0.122±0.004)
0.45±0.20
(0.018±0.008)
0.45±0.20
(0.018±0.008)
+0.10
0.55mm
-0.05
+0.004
(0.022mmn)
-0.002
L
c
c
C
T
d
T
d
d
0.50±0.05
(0.020±0.002)
1.00±0.05
(0.039±0.002)
0.20±0.15
(0.008±0.006)
0.20±0.10
(0.008±0.004)
0.35±0.05
(0.014±0.002)
SPECIFICATIONS
Series
Rated Power
Max. Working Voltage
Resistance Tolerance
CR05 (0402)
0.0625 (1/16) W
50V
F = ±1%
J = ±5%
10Ω to 1MΩ : F
1.0Ω to 10MΩ : J
-55 to +125°C
CR10 (0603)
0.10 (1/10) W
50V
D = ±0.5%
F = ±1%
J = ±5%
10Ω to 1MΩ : D
10Ω to 1MΩ : F
1.0Ω to 10MΩ : J
-55 to +125°C
CR21 (0805)
0.125 (1/8) W
100V
D = ±0.5%
F = ±1%
J = ±5%
10Ω to 1MΩ : D
10Ω to 1MΩ : F
1.0Ω to 10MΩ : J
-55 to +125°C
CR32 (1206)
0.25 (1/4) W
200V
D = ±0.5%
F = ±1%
J = ±5%
10Ω to 1MΩ : D
10Ω to 1MΩ : F
1.0Ω to 10MΩ : J
-55 to +125°C
Resistance Value Range
Working Temperature
2
Thick Film Chip Resistors
CR, CJ Series
SPECIFICATIONS
CJ Series
Part Number
Rated Current
Resistivity
Working Temperature
CJ05, CJ10, CJ21
(0402, 0603, 0805 Type)
1A (70°C)
50mΩ max.
-55 to +125°C
CJ32
(1206 Type)
2A (70°C)
50mΩ max.
-55 to +125°C
HOW TO CALCULATE RATED VOLTAGE
E=
P•R
E = Rated Voltage (V)
P = Rated Power (W)
R = Standard Resistance Value (Ω)
Rated voltage should be lower than max. working voltage.
RECOMMENDED LAND PATTERN
EIA Size
C
millimeters (inches)
0402
0.50
(0.020)
0.40
(0.016)
0.50
(0.020)
0603
0.80
(0.031)
0.70
(0.028)
0.80
(0.031)
0805
1.00
(0.039)
0.80
(0.031)
1.20
(0.047)
1206
2.00
(0.079)
0.80
(0.031)
1.50
(0.059)
A
B
B
A
B
C
MARKING
Marking available as follows:
Series: CR32, CJ32, CR21, CJ21, CR10, CJ10
3 digit indication
Example: 473=47x10
3
= 47000
Ω
= 47 kΩ
0 = 0
Ω
(Jumper)
100 = 10
Ω
102 = 1 kΩ
105 = 1 MΩ
DERATING CURVE
Rated power should be reduced as below when
temperature become higher.
Under high temperature, power derated as follows:
100
80
Power Ratio(%)
60
40
Series: CR05 and CJ05 - No marking
Note: On CR32 4 digit marking is standard for
±1% and ±0.5% tolerances.
20
125
STANDARD RESISTANCE VALUE
E24
1.0
2.4
5.6
1.1
2.7
6.2
1.2
3.0
6.8
1.3
3.3
7.5
1.5
3.6
8.2
1.6
3.9
9.1
1.8
4.3
2.0
4.7
2.2
5.1
0
-55
70
Ambient Temp (°C)
For ±1% and ±.5% Tolerance
10.0
12.7
16.2
20.5
26.1
33.2
42.2
53.6
68.1
86.6
10.2
13.0
16.5
21.0
26.7
34.0
43.2
54.9
69.8
88.7
10.5
13.3
16.9
21.5
27.4
34.8
44.2
56.2
71.5
90.9
10.7
13.7
17.4
22.1
28.0
35.7
45.3
57.6
73.2
93.1
11.0
14.0
17.8
22.6
28.7
36.5
46.4
59.0
75.0
95.3
11.3
14.3
18.2
23.2
29.4
37.4
47.5
60.4
76.8
97.6
11.5
14.7
18.7
23.7
30.1
38.3
48.7
61.9
78.7
11.8
15.0
19.1
24.3
30.9
39.2
49.9
63.4
80.6
12.1
15.4
19.6
24.9
31.6
40.2
51.1
64.9
82.5
12.4
15.8
20.0
25.5
32.4
41.2
52.3
66.5
84.5
E96
3
Chip Resistor Arrays
CR, CJ, CRA, CRB, CRC Series - Test Conditions
ELECTRICAL CHARACTERISTICS
Item
Resistor
DC Resistance
Within Initial Tolerance
Resistance (Ω)
Temperature
Characteristics
D, F
10≤ R
≤1M
J
R <10
10≤ R
≤1M
1M< R
Standard
Jumper
50mΩ max.
Resistor
Test Conditions
Jumper
Power Condition A
(20°C, 65% RH)
Test Temperature: 25, 125(°C)
R/R=R
2
–R
1
/R
1
x1/T
2
–T
1
x10
6
R/R = Temp. Coefficient
(ppm/°C)
T
1
= 25(°C)
T
2
= 125(°C)
R
1
= T
1
Resistance at (Ω)
R
2
= T
2
Resistance at (Ω)
(1) Apply 2.0 x rated voltage for (1)
5 sec. (2.5 x rated voltage
(2)
for Arrays)
(3)
(2) Wait 30 minutes
(3) Measure resistance
CR05 = 50V max.
CR10 = 100V max.
CR21 = 200V max.
CR32 = 400V max.
CRA, CRB, CRC = 100V max.
TCR (ppm/°C)
–100 to +100
–100 to +600
–200 to +200
–500 to +300
2A for 5 sec.
Wait 30 minutes
Measure
resistance
R/R
Short-time
Overload
±(2.0%+0.10Ω) max.
of the initial value
50mΩ max.
Visual
No evidence of mechanical damage
intermittent overload
(1) Perform 10,000 voltage
(1) Perform 10,000
cycles as follows:
current cycles
ON (2.0 x rated voltage,
as follows:
2.5 x for Arrays)
1 sec. ON (2A)
1 sec.
OFF
25 sec. OFF
25 sec.
(2) Stabilization time 30 min.
(2) Wait 30 minutes
without loading
(3) Measure
(3) Measure resistance
resistance
CR05 = 50V max.
CR10 = 150V max.
CR21 = 200V max.
CR32 = 400V max.
CRA, CRB, CRC = 100V max.
Apply 500 VAC for 1 min. (CR10 300 VAC)
(CR05, CRA, CRB, CRC 300 VAC/1 sec.)
R/R
Intermittent
Overload
±(5%+0.1Ω) max.
of the initial value
50mΩ max.
Visual
Dielectric
Withstanding Voltage
No evidence of mechanical damage
No evidence of mechanical damage
•
•
•
•
•
CR05, CJ05 = 10
8
Ω
min.
CR10, CJ10 = 10
9
Ω
min.
CR21, CJ21 = 10
10
Ω
min.
CR32, CJ32 = 10
12
Ω
min.
CRA, CRB, CRC = 10
9
Ω
min.
.
Insulation Resistance
Apply 500V DC
(CR05, CRA, CRB, CRC 100V DC)
8
Chip Resistor Arrays
CR, CJ, CRA, CRB, CRC Series - Test Conditions
MECHANICAL CHARACTERISTICS
Item
Resistor
R/R
±(1%+0.05Ω) max.
of the initial value
Standard
Jumper
50mΩ max.
Resistor
Test Conditions
Jumper
Apply the load as shown:
Measure resistance during load application
millimeters (inches)
50
20
(0.787) (1.969)
R230
Visual
No evidence of mechanical damage after loading
Bending in
10 seconds
3 (0.118)
Terminal
Strength
±2
(0.079)max
[φ5 (0.197)]
45 (1.772) 45 (1.772)
PC Board = Glass epoxy t = 1.60 (0.063)
Soldering
Heat
Resistance
R/R
Visual
±(1%+0.05Ω) max.
of the initial value
No evidence of leaching
Coverage
≥95%
each termination end
R/R
Visual
R/R
Visual
±(1%+0.1Ω) max.
of the initial value
No evidence of mechanical damage
±(0.5%+0.05Ω) max.
of the initial value
No evidence of mechanical damage
50mΩ max.
Immerse in static state butyl acetate at 20°C to 25°C
for 30±5 sec.
Stabilize component at room temperature for 30 min.
then measure value.
50mΩ max.
50mΩ max.
Immerse into molten solder at 260±5°C for 10±1 sec.
Stabilize component at room temperature for 1 hr.
Measure resistance.
Immerse in Rogin Flux for 2±0.5 sec. and in
SN62 solder at 235±5°C for 2±0.5 sec.
2 hrs. each in X, Y and Z axis. (TTL 6 hrs.) 10 to 55 Hz
sweep in 1 min. at 1.5mm amplitude.
Solderability
Anti-Vibration
Test
Solvent
Resistance
ENVIRONMENTAL CHARACTERISTICS
Item
Resistor
Temperature
Cycle
R/R
Visual
R/R
Visual
R/R
Visual
R/R
Visual
R/R
Life Test
Visual
Loading Life
in Moisture
R/R
Visual
±(1%+0.05Ω) max.
of the initial value
No evidence of mechanical damage
±(2%+0.1Ω) max.
of the initial value
No evidence of mechanical damage
±(3%+0.1Ω) max.
of the initial value
No evidence of mechanical damage
±(3%+0.1Ω) max.
of the initial value
No evidence of mechanical damage
±(3%+0.1Ω) max.
of the initial value
No evidence of mechanical damage
±(3%+0.1Ω) max.
of the initial value
No evidence of mechanical damage
50mΩ max.
50mΩ max.
50mΩ max.
50mΩ max.
50mΩ max.
Standard
Jumper
50mΩ max.
Resistor
Test Conditions
Jumper
(1) Run 5 cycles as follows: -55±3°C for 30 min.
125±3°C for 30 min. Room temp. for 10-15 min.
(2) Stabilize component at room temperature for 1 hr.
then measure value.
(1) Dwell in -55°C chamber without loading for 1000
+48
-0
hrs.
(2) Stabilize component at room temperature for 1 hr.
then measure value.
(1) Dwell in 125°C chamber without loading for 1000
+48
-0
hrs.
(2) Stabilize component at room temperature for 1 hr.
then measure value.
(1) Dwell in temp.: 65°C RH90 to 95% RH chamber
without loading for 1000
+48
hrs.
-0
(2) Stabilize component at room temperature for 1 hr.
then measure value.
(1) Temp.: 70±3°C Voltage: (rated voltage) on 90 min.
off 30 min. Duration: 1000
+48
hrs.
-0
(2) Stabilize component at room temperature for 1 hr.
then measure value.
(1) Temp.: 40±2°C RH: 90-95% Voltage Cycle: on 90
min. (rated voltage) off 30 min. Duration: 1000
+48
hrs.
-0
(2) Stabilize component at room temperature for 1 hr.
then measure value.
Low
Temperature
Storage
High
Temperature
Storage
Moisture
Resistance
9
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