25LC080C 25LC320A
25LC080D 25LC640A
25LC160C 25LC128
25LC160D 25LC256
8K-256K SPI Serial EEPROM High Temp Family Data Sheet
Features:
• Max. Clock 5 MHz
• Low-power CMOS Technology:
- Max. Write Current: 5 mA at 5.5V, 5 MHz
- Read Current: 5 mA at 5.5V, 5 MHz
- Standby Current: 10
μA
at 5.5V
• 1024 x 8 through 32768 x 8-bit Organization
• Byte and Page-level Write Operations
• Self-timed Erase and Write Cycles (6 ms max.)
• Block Write Protection:
- Protect none, 1/4, 1/2 or all of array
• Built-in Write Protection:
- Power-on/off data protection circuitry
- Write enable latch
- Write-protect pin
• Sequential Read
• High Reliability:
- Endurance: >100K erase/write cycles
- Data retention: > 200 years
- ESD protection: > 4000V
• Temperature Range Supported:
- Extended (H):
-40°C to +150°C
• Package is Pb-free and Halogen free
Description:
Microchip Technology Inc. 25LCXXX* devices are Mid-
density 8 through 256 Kbit Serial Electrically Erasable
PROMs (EEPROM). The devices are organized in
blocks of x8-bit memory and support the Serial Periph-
eral Interface (SPI) compatible serial bus architecture.
Byte-level and page-level functions are supported.
The bus signals required are a clock input (SCK) plus
separate data in (SI) and data out (SO) lines. Access to
the device is controlled through a Chip Select (CS)
input.
Communication to the device can be paused via the
hold pin (HOLD). While the device is paused, transi-
tions on its inputs will be ignored, with the exception of
Chip Select, allowing the host to service higher priority
interrupts.
The 25LCXXX is available in a standard 8-lead SOIC
package. The package is Pb-free.
Package Types (not to scale)
SOIC
(SN)
CS
SO
WP
V
SS
1
2
3
4
8
7
6
5
V
CC
HOLD
SCK
SI
Pin Function Table
Name
CS
SO
WP
V
SS
SI
SCK
HOLD
V
CC
Function
Chip Select Input
Serial Data Output
Write-Protect
Ground
Serial Data Input
Serial Clock Input
Hold Input
Supply Voltage
*25LCXXX is used in this document as a generic part number for the 25 series devices.
©
2009 Microchip Technology Inc.
Preliminary
DS22131B-page 1
25LCXXX
1.0
ELECTRICAL CHARACTERISTICS
Absolute Maximum Ratings
(†)
V
CC
.............................................................................................................................................................................6.5V
All inputs and outputs w.r.t. V
SS
..........................................................................................................-0.6V to V
CC
+1.0V
Storage temperature ................................................................................................................................. -65°C to 155°C
Ambient temperature under bias........................................................................................................... -40°C to 150°C
(1)
ESD protection on all pins.......................................................................................................................................... 4 kV
Note 1:
AEC-Q100 reliability testing for devices intended to operate at 150°C is 1,000 hours. Any design in which
the total operating time between 125°C and 150°C will be greater than 1,000 hours is not warranted with-
out prior written approval from Microchip Technology Inc.
†
NOTICE: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the
device. This is a stress rating only and functional operation of the device at those or any other conditions above those
indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for an
extended period of time may affect device reliability.
TABLE 1-1:
DC CHARACTERISTICS
Extended (H):
Min.
.7 V
CC
-0.3
-0.3
—
—
V
CC
-0.5
—
—
—
T
A
= -40°C to +150°C
Max.
V
CC
+1
0.3V
CC
0.2V
CC
0.4
0.2
—
±2
±2
7
Units
V
V
V
V
V
V
μA
μA
pF
V
CC
≥
2.7V
V
CC
< 2.7V
I
OL
= 2.1 mA
I
OL
= 1.0 mA
I
OH
= -400
μA
CS = V
CC
, V
IN
= V
SS OR
V
CC
CS = V
CC
, V
OUT
= V
SS OR
V
CC
T
A
= 25°C, CLK = 1.0 MHz,
V
CC
= 5.0V
(Note)
V
CC
= 5.5V; F
CLK
= 5.0 MHz;
SO = Open
V
CC
= 2.5V; F
CLK
= 3.0 MHz;
SO = Open
V
CC
= 5.5V
V
CC
= 2.5V
CS = V
CC
= 5.5V, Inputs tied to V
CC
or
V
SS
, 150°C
V
CC
= 2.5V to 5.5V
Test Conditions
DC CHARACTERISTICS
Param.
No.
D001
D002
D003
D004
D005
D006
D007
D008
D009
Sym.
V
IH1
V
IL1
V
IL2
V
OL1
V
OL2
V
OH
I
LI
I
LO
C
INT
Characteristic
High-level input
voltage
Low-level input
voltage
Low-level output
voltage
High-level output
voltage
Input leakage current
Output leakage
current
Internal Capacitance
(all inputs and
outputs)
D010
I
CC
Read
Operating Current
—
—
5
2.5
mA
mA
mA
mA
μA
D011
D012
Note:
I
CC
Write
I
CCS
Standby Current
—
—
—
5
3
10
This parameter is periodically sampled and not 100% tested.
©
2009 Microchip Technology Inc.
Preliminary
DS22131B-page 3
25LCXXX
TABLE 1-2:
AC CHARACTERISTICS
Extended (H):
Min.
—
—
100
150
200
250
50
20
30
40
50
—
—
100
150
100
150
50
50
—
—
0
—
—
40
80
40
80
60
160
60
160
—
100K
T
A
= -40°C to +150°C
Max.
5
3
—
—
—
—
—
—
—
—
—
2
2
—
—
—
—
—
—
100
160
—
80
160
—
—
—
—
—
—
—
—
6
—
Units
MHz
MHz
ns
ns
ns
ns
ns
ns
ns
ns
ns
μs
μs
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ms
V
CC
= 2.5V to 5.5V
Test Conditions
4.5V
≤
Vcc
≤
5.5V
2.5V
≤
Vcc
<
4.5V
4.5V
≤
Vcc
≤
5.5V
2.5V
≤
Vcc
<
4.5V
4.5V
≤
Vcc
≤
5.5V
2.5V
≤
Vcc
<
4.5V
—
4.5V
≤
Vcc
≤
5.5V
2.5V
≤
Vcc
<
4.5V
4.5V
≤
Vcc
≤
5.5V
2.5V
≤
Vcc
<
4.5V
(Note 1)
(Note 1)
4.5V
≤
Vcc
≤
5.5V
2.5V
≤
Vcc
<
4.5V
4.5V
≤
Vcc
≤
5.5V
2.5V
≤
Vcc
<
4.5V
—
—
4.5V
≤
Vcc
≤
5.5V
2.5V
≤
Vcc
<
4.5V
(Note 1)
4.5V
≤
Vcc
≤
5.5V(Note
1)
2.5V
≤
Vcc
≤
4.5V(Note
1)
4.5V
≤
Vcc
≤
5.5V
2.5V
≤
Vcc
<
4.5V
4.5V
≤
Vcc
≤
5.5V
2.5V
≤
Vcc
<
4.5V
4.5V
≤
Vcc
≤
5.5V(Note
1)
2.5V
≤
Vcc
<
4.5V(Note
1)
4.5V
≤
Vcc
≤
5.5V
2.5V
≤
Vcc
<
4.5V
(Note 2)
AC CHARACTERISTICS
Param.
Sym.
No.
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
F
CLK
T
CSS
T
CSH
T
CSD
Tsu
T
HD
T
R
T
F
T
HI
T
LO
T
CLD
T
CLE
T
V
T
HO
T
DIS
T
HS
T
HH
T
HZ
T
HV
T
WC
—
Characteristic
Clock Frequency
CS Setup Time
CS Hold Time
CS Disable Time
Data Setup Time
Data Hold Time
CLK Rise Time
CLK Fall Time
Clock High Time
Clock Low Time
Clock Delay Time
Clock Enable Time
Output Valid from Clock
Low
Output Hold Time
Output Disable Time
HOLD Setup Time
HOLD Hold Time
HOLD Low to Output
High-Z
HOLD High to Output
Valid
Internal Write Cycle Time
Endurance
E/W
(Note 3)
Cycles
Note 1:
This parameter is periodically sampled and not 100% tested.
2:
T
WC
begins on the rising edge of CS after a valid write sequence and ends when the internal write cycle is
complete.
3:
This parameter is not tested but ensured by characterization. For endurance estimates in a specific
application, please consult the Total Endurance™ Model which can be obtained from our web site:
www.microchip.com.
DS22131B-page 4
Preliminary
©
2009 Microchip Technology Inc.
汽车电子
京公网安备 11010802033920号
Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved
电子工程世界
