CAT523
Dual Digitally Programmable Potentiometer (DPP™) with
256 Taps and Microwire Interface
FEATURES
Two 8-bit DPPs configured as programmable
voltage sources in DAC-like applications
Common reference inputs
Non-volatile NVRAM memory wiper storage
Output voltage range includes both supply rails
2 independently addressable buffered
output wipers
1 LSB accuracy, high resolution
Serial microwire-like interface
Single supply operation: 2.7V - 5.5V
Setting read-back without effecting outputs
DESCRIPTION
The CAT523 is a dual, 8-bit digitally-programmable
potentiometer (DPP™) configured for programmable
voltage and DAC-like applications. Intended for final
calibration of products such as camcorders, fax
machines and cellular telephones on automated high
volume production lines, it is also well suited for
systems capable of self calibration, and applications
where equipment which is either difficult to access or in a
hazardous environment, requires periodic adjustment.
The two independently programmable DPPs have a
common output voltage range which includes both
supply rails. The wipers are buffered by rail to rail op
amps. Wiper settings, stored in non-volatile NVRAM
memory, are not lost when the device is powered
down and are automatically reinstated when power is
returned. Each wiper can be dithered to test new
output values without effecting the stored settings and
stored settings can be read back without disturbing
the DPP’s output.
Control of the CAT523 is accomplished with a simple
3-wire, Microwire-like serial interface. A Chip Select
pin allows several CAT523's to share a common serial
interface and communication back to the host
controller is via a single serial data line thanks to the
CAT523’s Tri-Stated Data Output pin. A RDY/BSY
¯¯¯¯
output working in concert with an internal low voltage
detector signals proper operation of non-volatile
NVRAM memory Erase/Write cycle.
The CAT523 is available in the 0°C to 70°C
Commercial and -40°C to + 85°C Industrial operating
temperature ranges and offered in 14-pin plastic DIP
and SOIC mount packages.
For Ordering Information details, see page 12.
APPLICATIONS
Automated product calibration.
Remote control adjustment of equipment
Offset, gain and zero adjustments in self-
calibrating and adaptive control systems.
Tamper-proof calibrations.
DAC (with memory) substitute
PIN CONFIGURATION
PDIP 14-Lead (L)
SOIC 14-Lead (W)
V
DD
CLK
RDY/¯¯¯¯
BSY
CS
DI
DO
PROG
1
2
3
14
13
12
V
REFH
V
OUT1
V
OUT2
NC
NC
V
REFL
GND
4
CAT523
11
5
6
7
10
9
8
© Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
1
Doc. No. MD-2005 Rev. G
CAT523
ABSOLUTE MAXIMUM RATINGS
Parameters
Supply Voltage
(1)
V
DD
to GND
Inputs
CLK to GND
CS to GND
DI to GND
¯¯¯¯
RDY/BSY to GND
PROG to GND
V
REFH
to GND
V
REFL
to GND
Ratings
-0.5 to +7
-0.5 to V
DD
+0.5
-0.5 to V
DD
+0.5
-0.5 to V
DD
+0.5
-0.5 to V
DD
+0.5
-0.5 to V
DD
+0.5
-0.5 to V
DD
+0.5
-0.5 to V
DD
+0.5
Units
V
Parameters
Outputs
D
0
to GND
V
OUT
1– 4 to GND
Operating Ambient Temperature
Commercial
(‘C’ or Blank suffix)
Industrial (‘I’ suffix)
Junction Temperature
Storage Temperature
Lead Soldering (10 sec max)
Ratings
-0.5 to V
DD
+0.5
-0.5 to V
DD
+0.5
0 to +70
-40 to +85
+150
-65 to +150
+300
Units
V
V
°C
°C
°C
°C
°C
V
V
V
V
V
V
V
RELIABILITY CHARACTERISTICS
Symbol
V
ZAP(2)
I
LTH(2)(3)
Parameter
ESD Susceptibility
Latch-Up
Test Method
MIL-STD-883, Test Method 3015
JEDEC Standard 17
Min
2000
100
Max
Units
V
mA
POWER SUPPLY
Symbol
I
DD1
I
DD2
V
DD
Parameter
Supply Current (Read)
Supply Current (Write)
Operating Voltage Range
Conditions
Normal Operating
Programming, V
DD
= 5V
V
DD
= 3V
Min
—
—
—
2.7
Typ
400
1600
1000
—
Max
600
2500
1600
5.5
Units
µA
µA
µA
V
LOGIC INPUTS
Symbol
I
IH
I
IL
V
IH
V
IL
Parameter
Input Leakage Current
Input Leakage Current
High Level Input Voltage
Low Level Input Voltage
Conditions
V
IN
= V
DD
V
IN
= 0V
Min
—
—
2
0
Typ
—
—
—
—
Max
10
-10
V
DD
0.8
Units
µA
µA
V
V
LOGIC OUTPUTS
Symbol
V
OH
V
IL
Parameter
High Level Output Voltage
Low Level Output Voltage
Conditions
I
OH
= -40µA
I
OL
= 1mA, V
DD
= +5V
I
OL
= 0.4mA, V
DD
= +3V
Min
V
DD
-0.3
—
—
Typ
—
—
—
Max
—
0.4
0.4
Units
V
V
V
Notes:
(1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this
specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability.
(2) This parameter is tested initially and after a design or process change that affects the parameter.
(3) Latch-up protection is provided for stresses up to 100mA on address and data pins from –1V to V
CC
+ 1V.
© Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
3
Doc. No. MD-2005 Rev. G
CAT523
POTENTIOMETER CHARACTERISTICS
V
DD
= +2.7V to +5.5V, V
REFH
= V
DD
, V
REFL
= 0V, unless otherwise specified
Symbol
R
POT
Parameter
Potentiometer Resistance
R
POT
to RPOT Match
Pot Resistance Tolerance
Voltage on V
REFH
pin
Voltage on V
REFL
pin
Resolution
INL
DNL
R
OUT
I
OUT
TC
RPOT
C
H
/C
L
Integral Linearity Error
Differential Linearity Error
Buffer Output Resistance
Buffer Output Current
TC of Pot Resistance
Potentiometer Capacitances
300
8/8
2.7
0
0.4
0.5
0.25
1
0.5
10
3
Conditions
See note 3
—
Min
Typ
24
±0.5
±1
±20
V
DD
V
DD
- 2.7
Max
Units
kΩ
%
%
V
V
%
LSB
LSB
Ω
mA
ppm/ºC
pF
AC ELECTRICAL CHARACTERISTICS
V
DD
= +2.7V to +5.5V, V
REFH
= V
DD
, V
REFL
= 0V, unless otherwise specified
Symbol
Digital
t
CSMIN
t
CSS
t
CSH
t
DIS
t
DIH
t
DO1
t
DO0
t
HZ
t
LZ
t
BUSY
t
PS
t
PROG
t
CLK
H
t
CLK
L
f
C
Analog
t
DS
DPP Settling Time to 1 LSB
C
LOAD
= 10pF, V
DD
= +5V
C
LOAD
= 10pF, V
DD
= +3V
—
—
3
6
10
10
µs
µs
Minimum CS Low Time
CS Setup Time
CS Hold Time
DI Setup Time
DI Hold Time
Output Delay to 1
Output Delay to 0
Output Delay to High-Z
Output Delay to Low-Z
Erase/Write Cycle Time
PROG Setup Time
Minimum Pulse Width
Minimum CLK High Time
Minimum CLK Low Time
Clock Frequency
C
L
= 100pF
(1)
150
100
0
50
50
—
—
—
—
—
150
700
500
300
DC
—
—
—
—
—
—
—
400
400
4
—
—
—
—
—
—
—
—
—
—
150
150
—
—
5
—
—
—
—
1
ns
ns
ns
ns
ns
ns
ns
ns
ns
ms
ns
ns
ns
ns
MHz
Parameter
Conditions
Min
Typ
Max
Units
Notes:
(1) All timing measurements are defined at the point of signal crossing V
DD
/ 2.
(2) These parameters are periodically sampled and are not 100% tested.
(3) The 24kΩ +20% resistors are configured as 4 resistors in parallel which would provide a measured value between V
REFH
and V
REFL
of 6kΩ
+20%. The individual 24kΩ resistors are not measurable but guaranteed by design and verification of the 6kΩ +20% value.
Doc. No. MD-2005 Rev. G
4
© Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
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