Electronics Corp.
Multi-Layer Ceramic Capacitor
C-S2-5-01
X5R, X7R Dielectrics
Features
A monolithic structure ensures high reliability and mechanical strength.
High capacitance density.
A wide range of capacitance values in standard case size.
Suitable for high speed SMT placement on PCBs.
Ni barrier termination highly resistance to migration.
Lead-free termination is in compliance with the requirement of green plan and ROHS.
S2
Applications
General electronic equipment.
Communication equipment.
Custom Application
X5R, X7R Dielectric Characteristics
Capacitance Range
Size (mm)
(EIA inch)
Test Voltage
Test Frequency
Capacitance Tolerance
Operating Temperature Range
100pF to 100uF
0603
(0201)
1005
1608
2012
3216
(1206)
3225
(1210)
(0402) (0603) (0805)
1.0 ± 0.2Vrms
1.0 ± 0.2KHz
± 10%, ± 20% (± 5% available on request)
-55℃ to +85℃ for X5R
-55℃ to +125℃ for X7R
Maximum Capacitance Change
Rated Voltage
Dissipation Factor
± 15 %
6.3, 10, 16, 25, 50, 100 VDC
Pls refer to DF table on page No. 7
Insulation Resistance (+25℃, RVDC) 10,000 MΩ min. or 500Ω-F min., whichever is smaller
Insulation Resistance (Maximum
operating temperature, RVDC)
1,000 MΩ min. or 50Ω-F min., whichever is smaller
Darfon Product Specification
1
Rev.: 4
Electronics Corp.
Multi-Layer Ceramic Capacitor
X5R, X7R Specifications
No.
Item
Specification
1 Operating Temperature Range
-55℃ to 125℃ for X7R
-55℃ to 85℃ for X5R
2 Rated Voltage
6.3VDC, 10VDC, 16VDC, 25VDC, 50VDC,
100VDC
3
4
5
Appearance
Dimensions
Dielectric Strength (Flash)
No defects or abnormalities.
Within the specified dimension.
No defects or abnormalities.
Test Method
-
The rated voltage is defined as the maximum
voltage, which may be applied continuously to the
capacitor.
Visual inspection
Using calipers
No failure shall be observed when 250%of the rated
voltage is applied between the terminations for 1 to
5 seconds, the charge and discharge current is less
than 50mA.
The insulation resistance shall be measured with a
DC voltage not exceeding the rated voltage at 25℃
and 75%RH max, and within 1 minute of charging.
C-S2-5-01
S2
6
Insulation Resistance ( I.R.)
Rated Voltage:
<500V
Rated Voltage:
≧500V
To apply rated
voltage.
To apply 500V.
I.R.
≧10G or
R
i
C
R
≧500Ω-F
(whichever is smaller)
7
8
9
Capacitance
Dissipation Factor ( D.F.)
Capacitance Temperature
Characteristics
Within the specified tolerance at 1,000 hours The capacitance/D.F. shall be measured at 25℃ at
frequency 1.0±0.2KHz and voltage 1.0±0.2Vrms.
See X5R/X7R DF (tan
δ)
table 2
The ranges of capacitance change compared with
Capacitance change within the specified
25℃ value over the temperature ranges shown in
tolerance as following table.
the table should be within the specified ranges.
Reference temperature 25℃.
Char.
Temp. Range
Cap. Change
X7R
-55℃ to 125℃
± 15%
X5R
-55℃ to 85℃
± 15%
Apply a parallel force of 5N to a PCB mounted
sample for 10±1sec. *2N for 0603 (EIA 0201).
Solder the capacitor to the test jig (glass epoxy
boards) shown in Fig. a. using a eutectic solder
then let sit for 48±4 hours. Then apply a force in the
direction shown in Fig. b. The soldering shall be
done with the reflow method and shall be
conducted with care so that the soldering is uniform
and free of defects such as heat shock.
20 50 Pressurizing speed : 1.0mm/sec.
Size
1005
c
a
100
t :1.6mm
40
1608
2012
3216
a
0.4
1.0
1.2
2.2
b
1.5
3.0
4.0
5.0
C
0.5
1.2
1.65
2.0
Capacitance Meter
10 Termination Strength
No removal of the terminations or marking
defect.
11 Deflection (Bending Strength)
Appearance: No cracking or marking
defects.
Capacitance change within ±12.5%.
(Unit in mm)
b
φ
4.5
Pressurize
R230
Flexure : 1mm
45
45
Fig. a.
Fig. b.
12 Solderability of Termination
90% of the terminations is to be soldered
evenly and continuously.
13 Resistance to Appearance
Soldering Heat Cap. Change
D.F.
No marking defects
Within ±7.5%
To satisfy the specified initial value
Immerse the test capacitor into a methanol solution
containing rosin for 3 to 5 seconds, preheat it 150 to
180℃ for 2 to 3 minutes and immerse it into molten
solder of 230 ± 5℃ for 5±1seconds.
Preheat the capacitor at 120 to 150℃ for 1 minute.
Immerse the capacitor in an eutectic solder solution
at 270±5℃ for 10±1 seconds. Let sit at room
temperature for 48±4 hours, then measure.
* Preheat 150 to 200℃ for size≧3216.
Initial measurement : perform a heat treatment at
150+0/-10℃ for one hour and then let sit for 48±4
hours at room temperature. Perform the initial
measurement.
I.R.
I.R.≧10,000MΩ or R
i
C
R
≧500Ω-F.
( whichever is smaller)
Darfon Product Specification
5
Rev.: 4
FPGA/CPLD
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