SCOPE：
This specification applies to the Pb Free Ceramic Chip Inductors
for MWCS-100505-SERIES
PRODUCT INDENTIFICATION
MWCS - 100505 - 30N J
①
②
③ ④
①
Product Code
②
Dimensions Code
③
Inductance Code
④
Tolerance Code
(1) SHAPES AND DIMENSIONS(mm)
A: 1.19 mm
B: 0.70 mm
C: 0.66 mm
D: 0.25 mm
E: 0.23 mm
F: 0.56 mm
G: 0.51 mm
Max.
Max.
Max.
Typ.
Typ.
Typ.
Typ.
(2) ELECTRICAL SPECIFICATIONS
SEE TABLE 1
TEST INSTRUMENTS
L,Q : HP 4291B IMPEDANCE ANALYZER (or equivalent)
SRF : ENA E5071B NETWORK ANALYZER (or equivalent)
RDC : CHROMA MODEL 16502 MILLIOHMMETER (or equivalent)
(3) CHARACTERISTICS
(3)-1 Operate temperature range ......
－40℃½＋125℃
(Including self temp. rise)
(3)-2 Storage temperature range ......
－40℃½＋125℃
MAG.LAYERS
MWCS-100505-SERIES
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TABLE 1
MAGLAYERS
PT/NO.
MWCS-100505-1N0□
MWCS-100505-1N2□
MWCS-100505-1N3□
MWCS-100505-1N9□
MWCS-100505-2N0□
MWCS-100505-2N2□
MWCS-100505-2N4□
MWCS-100505-2N5□
MWCS-100505-2N7□
MWCS-100505-3N3□
MWCS-100505-3N6□
MWCS-100505-3N9□
MWCS-100505-4N3□
MWCS-100505-4N7□
MWCS-100505-5N1□
MWCS-100505-5N6□
MWCS-100505-5N8□
MWCS-100505-6N2□
MWCS-100505-6N8□
MWCS-100505-7N3□
MWCS-100505-7N5□
MWCS-100505-8N2□
MWCS-100505-8N7□
MWCS-100505-9N0□
MWCS-100505-9N1□
MWCS-100505-9N5□
MWCS-100505-10N□
MWCS-100505-11N□
MWCS-100505-12N□
MWCS-100505-13N□
MWCS-100505-15N□
MWCS-100505-16N□
MWCS-100505-18N□
MWCS-100505-19N□
MWCS-100505-20N□
MWCS-100505-22N□
MWCS-100505-23N□
MWCS-100505-24N□
MWCS-100505-27N□
MWCS-100505-30N□
MWCS-100505-33N□
MWCS-100505-36N□
MWCS-100505-39N□
MWCS-100505-40N□
MWCS-100505-43N□
MWCS-100505-47N□
MWCS-100505-51N□
MWCS-100505-56N□
MWCS-100505-68N□
MWCS-100505-72N□
MWCS-100505-82N□
MWCS-100505-R10□
MWCS-100505-R18□
MWCS-100505-R22□
Inductance
L(nH)
1.0
1.2
1.3
1.9
2.0
2.2
2.4
2.5
2.7
3.3
3.6
3.9
4.3
4.7
5.1
5.6
5.8
6.2
6.8
7.3
7.5
8.2
8.7
9.0
9.1
9.5
10
11
12
13
15
16
18
19
20
22
23
24
27
30
33
36
39
40
43
47
51
56
68
72
82
100
180
220
Percent
Tolerance
B,J,K
B,J,K
B,K
B,J,K
B,J,K
B,J,K
B,J,K
B,J,K
B,J,K
H,J,K
H,J,K
H,J,K
H,J,K
H,J,K
H,J,K
H,J,K
H,J,K
H,J,K
H,J,K
H,J,K
H,J,K
H,J,K
H,J,K
H,J,K
H,J,K
H,J,K
G,J,K
G,J,K
G,J,K
G,J,K
G,J,K
G,J,K
G,J,K
G,J,K
G,J,K
G,J,K
G,J,K
G,J,K
G,J,K
G,J,K
G,J,K
G,J,K
G,J,K
G,J,K
G,J,K
G,J,K
G,J,K
G,J,K
G,J,K
G,J,K
G,J,K
G,J,K
G,J,K
G,J,K
L / Q Freq.
(MHz)
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
250
100
100
Quality
Min.
16
10
10
16
16
19
15
13
16
19
19
19
18
15
20
20
20
20
20
20
22
22
18
22
22
18
21
24
24
24
24
24
25
24
25
25
22
25
24
25
24
24
25
24
25
20
25
22
22
20
20
20
8
8
SRF
(GHz)Min.
12.70
10.40
10.40
11.30
11.10
10.80
10.50
10.40
10.40
7.00
6.80
6.00
6.00
4.77
4.80
4.80
4.80
4.80
4.80
4.80
4.80
4.40
4.10
4.16
4.16
4.00
3.90
3.68
3.60
3.45
3.28
3.10
3.10
3.04
3.00
2.80
2.72
2.70
2.48
2.35
2.35
2.32
2.10
2.24
2.03
2.10
1.75
1.76
1.62
1.26
1.26
1.16
0.70
0.70
DCR
(Ω) Max.
0.045
0.140
0.140
0.070
0.070
0.070
0.068
0.150
0.120
0.066
0.066
0.066
0.091
0.130
0.083
0.083
0.083
0.083
0.083
0.120
0.100
0.100
0.200
0.100
0.100
0.200
0.200
0.120
0.120
0.210
0.170
0.220
0.230
0.200
0.250
0.300
0.300
0.300
0.300
0.350
0.400
0.440
0.550
0.650
0.810
0.830
0.820
0.970
1.120
2.000
1.550
2.000
2.700
4.000
IDC
(mA) Max.
1360
640
640
1040
1040
960
790
640
640
840
840
840
700
640
800
760
760
760
680
680
680
680
480
680
680
480
480
640
640
440
560
560
420
480
420
400
400
400
400
400
400
320
200
320
100
150
100
100
100
30
50
30
50
50
※
1.□ Specify the inductance tolerance, B(±0.2nH),G(±2%),H(±3%),J(±5%),K(±10%)
2.IDC:Based on temperature rise(△T:15℃ Typ.)
MAG.LAYERS
MWCS-100505-SERIES
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(4) RELIABILITY TEST METHOD
MECHANICAL
TEST ITEM
Solder ability
SPECIFICATION
The electrodes shall be at least 90% covered
with new solder coating
Refer to J-STD-002
Pre-heating: 150℃, 1min
Solder Composition: Sn/Ag3.0/Cu0.5(Pb-Free)
Solder Temperature: 245±5℃(Pb-Free)
Immersion Time: 4±1sec
Resistance to
Soldering heat
(reflow soldering)
There shall be no damage or problems.
Inductance change shall be within ±10%.
Q change:within±30% of initial value
Refer to MIL-STD-202 Method 210
Temperature profile of reflow soldering
TEST DETAILS
The specimen shall be passed through the reflow oven
with the condition shown in the above profile for 1 time.
The specimen shall be stored at standard atmospheric
eric conditions for 1 hour, after which the measurement
shall be made.
Terminal strength
The terminal electrode and the ferrite must
not damaged.
Refer to AEC-Q200-006
Test device shall be soldered on the substrate
Force 0.5lbs for 60±1 seconds for 0201 series
Force 1lbs for 60±1 seconds for 0402 series
Force 2lbs for 60±1 seconds for 0603 series
Force 1.8Kg for 60±1 seconds for the other series.
Board Flex
The terminal electrode and the ferrite must
not damaged.
Refer to AEC-Q200-005
Test device shall be soldered on the substrate
Substrate Dimension: 100x40x1.6mm
Deflection: 2.0mm
Keeping Time: 60sec
High
temperature
resistance
(Storage)
Appearance:No damage (for microscope
of CASTOR MZ-420X)Inductance change shall
Inductance change shall be within ±10%.
Q change:within±30% of initial value
Refer to MIL-STD-202 Method 108
Temperature: 125±3℃ / Relative Humidity: 0%
Time: 100hrs
Measured after exposure in the room condition for 24hrs
Biased Humidity
Appearance:No damage (for microscope
of CASTOR MZ-420X)Inductance change shall
Inductance change shall be within ±10%.
Q change:within±30% of initial value
Refer to MIL-STD-202 Method 103
Temperature: 85±2℃
Relative Humidity:85% / Time: 100hrs
Measured after exposure in the room condition for 24hrs
MAG.LAYERS
MWCS-100505-SERIES
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(4) RELIABILITY TEST METHOD
MECHANICAL
TEST ITEM
Thermal shock
SPECIFICATION
Appearance:No damage (for microscope
TEST DETAILS
Refer to JESD Method JA-104
of CASTOR MZ-420X)Inductance change shall Total cycles: 100 cycles
Inductance change shall be within ±10%.
Q change:within±30% of initial value
Temperature Cycling Test Conditions : -40 to +125
℃
-40
℃
Soak Mode Condition : 30 minutes
125
℃
Soak Mode Condition : 30 minutes
Measured after exposure in the room condition for 24hrs
Low
temperature
storage
There shall be no damage or problems.
Inductance change shall be within ±10%.
Q change:within±30% of initial value
After the samples shall be soldered onto the test
circuit board,the test shall be done.
Measurement : After placing for 24 hours min.
Temperature : -40±2℃
Testing time : 100 hours
Vibration
There shall be no damage or problems.
Inductance change shall be within ±10%.
Q change:within±30% of initial value
Refer MIL-STD-202 Method 204
Vibration waveform: Sine waveform
Vibration frequency: 10Hz~2000Hz
Vibration acceleration: 5g
Sweep rate: 0.764386otcave/minute
Duration of test: 12 cycles each of 3 orientations,
20 minutes for each cycle
Vibration axes: X, Y & Z
Resistance to Solvent There must be no change in
appearance or obliteration of
marking
Refer to MIL-STD-202 Method 215
Inductors must withstand 6 mimutes of alcohol or water.
Operational Life
No apparent damage
Inductance change shall be within ±10%.
Refer to MIL-STD-202 Method 108
Temperature: 125±3℃
Applied Current : Rated Current
Time: 100hrs
Measured after exposure in the room condition for 24hrs
MAG.LAYERS
MWCS-100505-SERIES
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(5) RECOMMENDED SOLDERING CONDITIONS
(Please use this product by reflow soldering)
(5)-1 RECOMMENDED FOOTPRINT
Unit: mm
A: 1.18
B: 0.66
C: 0.46
Typ.
Typ.
Typ.
(5)-2 RECOMMENED REFLOW PATTERN
Lead-Free(LF)
Item
Temp. scope
Time result
Ramp-up
R.T.~150℃
_
Pre-heating
150℃~200℃
60~180 Sec.
Reflow
225℃
20~60 Sec.
Peak Temp.
260±5℃
5~10 Sec.
Refer to J-STD-020C
Cooling
Peak Temp.~150℃
_
NOTE:
1. Re-flow possibile times:with in 2 times
2. Nitrogen adopted is recommended while in re-flow
MAG.LAYERS
MWCS-100505-SERIES
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