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NT5SV64M4BT-75B

产品描述Synchronous DRAM, 64MX4, 5.4ns, CMOS, PDSO54, 0.400 INCH, PLASTIC, TSOP2-54
产品类别存储    存储   
文件大小3MB,共65页
制造商南亚科技(Nanya)
官网地址http://www.nanya.com/cn
南亚科技股份有限公司以成为最佳DRAM(动态随机存取记忆体)之供应商为目标,强调以服务客户为导向,透过与夥伴们紧密的合作,强化产品的研发与制造,进而提供客户全方位产品及系统解决方案。面对持续成长的利基型DRAM市场,南亚科技除了提供从128Mb到8Gb产品,更持续拓展产品多元化。主要的应用市场包括数位电视、机上盒(STB)、网通、平板电脑等智慧电子系统、车用及工规等产品。同时,为满足大幅成长的行动与穿戴装置市场需求,南亚科技更专注於研发及制造低功耗记忆体产品。近年来,南亚科技积极经营利基型记忆体市场,专注於低功耗与客制化核心产品线的研发。在制程进度上,更导入20奈米制程技术,致力於生产DDR4和LPDDR4产品,期能进一步提升整体竞争力。南亚科技也将持续强化高附加价值利基型记忆体战线与完美的客户服务,强化本业营运绩效,确保所有股东权益,创造企业永续经营之价值。
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NT5SV64M4BT-75B概述

Synchronous DRAM, 64MX4, 5.4ns, CMOS, PDSO54, 0.400 INCH, PLASTIC, TSOP2-54

NT5SV64M4BT-75B规格参数

参数名称属性值
是否无铅含铅
是否Rohs认证不符合
厂商名称南亚科技(Nanya)
零件包装代码TSOP2
包装说明TSOP2, TSOP54,.46,32
针数54
Reach Compliance Codecompliant
ECCN代码EAR99
访问模式FOUR BANK PAGE BURST
最长访问时间5.4 ns
其他特性AUTO/SELF REFRESH
最大时钟频率 (fCLK)133 MHz
I/O 类型COMMON
交错的突发长度1,2,4,8
JESD-30 代码R-PDSO-G54
JESD-609代码e0
长度22.22 mm
内存密度268435456 bit
内存集成电路类型SYNCHRONOUS DRAM
内存宽度4
功能数量1
端口数量1
端子数量54
字数67108864 words
字数代码64000000
工作模式SYNCHRONOUS
最高工作温度70 °C
最低工作温度
组织64MX4
输出特性3-STATE
封装主体材料PLASTIC/EPOXY
封装代码TSOP2
封装等效代码TSOP54,.46,32
封装形状RECTANGULAR
封装形式SMALL OUTLINE, THIN PROFILE
峰值回流温度(摄氏度)NOT SPECIFIED
电源3.3 V
认证状态Not Qualified
刷新周期8192
座面最大高度1.2 mm
自我刷新YES
连续突发长度1,2,4,8
最大待机电流0.002 A
最大压摆率0.18 mA
最大供电电压 (Vsup)3.6 V
最小供电电压 (Vsup)3 V
标称供电电压 (Vsup)3.3 V
表面贴装YES
技术CMOS
温度等级COMMERCIAL
端子面层Tin/Lead (Sn/Pb)
端子形式GULL WING
端子节距0.8 mm
端子位置DUAL
处于峰值回流温度下的最长时间NOT SPECIFIED
宽度10.16 mm

NT5SV64M4BT-75B文档预览

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NT5SV64M4BS / NT5SV64M4BT
NT5SV32M8BS / NT5SV32M8BT
NT5SV16M16BS / NT5SV16M16BT
256Mb Synchronous DRAM
Features
High Performance:
6K/6KI
CL=3
f
CK
Clock Frequency
t
CK
Clock Cycle
t
AC
Clock Access
Time
1
2
75B/75BI
CL=3
133
7.5
5.4
Units
MHz
ns
ns
ns
166
6
5
t
AC
Clock Access Time
1. Terminated load. See AC Characteristics on page 37
2. Unterminated load. See AC Characteristics on page 37
3. t
RP
= t
RCD
= 2 CKs
• Single Pulsed RAS Interface
• Fully Synchronous to Positive Clock Edge
• Four Banks controlled by BA0/BA1 (Bank Select)
Programmable CAS Latency: 2, 3
Programmable Burst Length: 1, 2, 4, 8 or full page
Programmable Wrap: Sequential or Interleave
Multiple Burst Read with Single Write Option
Automatic and Controlled Precharge Command
Data Mask for Read/Write control (x4, x8)
Dual Data Mask for byte control (x16)
Auto Refresh (CBR) and Self Refresh
Suspend Mode and Power Down Mode
Standard Power operation
8192 refresh cycles/64ms
Random Column Address every CK (1-N Rule)
Single 3.3V
±
0.3V Power Supply
LVTTL compatible
Package: 54-pin 400 mil TSOP-Type II
Lead-free & Halogen-free product available
Description
The NT5SV64M4BS, NT5SV64M4BT, NT5SV32M8BS,
NT5SV32M8BT, NT5SV16M16BS, and NT5SV16M16BT are
four-bank Synchronous DRAMs organized as 16Mbit x 4 I/O
x 4 Bank, 8Mbit x 8 I/O x 4 Bank, and 4Mbit x 16 I/O x 4
Bank, respectively. These synchronous devices achieve
high-speed data transfer rates of up to 166MHz by employing
a pipeline chip architecture that synchronizes the output data
to a system clock.
The device is designed to comply with all JEDEC standards
set for synchronous DRAM products, both electrically and
mechanically. All of the control, address, and data input/out-
put (I/O or DQ) circuits are synchronized with the positive
edge of an externally supplied clock.
RAS, CAS, WE, and CS are pulsed signals which are exam-
ined at the positive edge of each externally applied clock
(CK). Internal chip operating modes are defined by combina-
tions of these signals and a command decoder initiates the
necessary timings for each operation. A fifteen bit address
bus accepts address data in the conventional RAS/CAS mul-
tiplexing style. Thirteen row addresses (A0-A12) and two
bank select addresses (BA0, BA1) are strobed with RAS.
Eleven column addresses (A0-A9, A11) plus bank select
addresses and A10 are strobed with CAS. Column address
A11 is dropped on the x8 device, and column addresses A11
and A9 are dropped on the x16 device.
Prior to any access operation, the CAS latency, burst length,
and burst sequence must be programmed into the device by
address inputs A0-A12, BA0, BA1 during a mode register set
cycle. In addition, it is possible to program a multiple burst
sequence with single write cycle for write through cache
operation.
Operating the four memory banks in an interleave fashion
allows random access operation to occur at a higher rate
than is possible with standard DRAMs. A sequential and gap-
less data rate of up to 166MHz is possible depending on
burst length, CAS latency, and speed grade of the device.
Auto Refresh (CBR) and Self Refresh operation are sup-
ported.
REV 1.7
Oct 2008
1
©
NANYA TECHNOLOGY CORPORATION
NANYA reserves the right to change products and specifications without notice.
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