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UT62L1024SC-55LE

产品描述Standard SRAM, 128KX8, 55ns, CMOS, PDSO32
产品类别存储    存储   
文件大小188KB,共12页
制造商UTRON
官网地址http://www.utron.net/
Utron Technologies Corp.成立于1983年,专门设计和制造裸板和电缆测试仪。我们是一家知名的PCB和电缆测试仪制造商和出口商超过14年。
下载文档 详细参数 全文预览

UT62L1024SC-55LE概述

Standard SRAM, 128KX8, 55ns, CMOS, PDSO32

UT62L1024SC-55LE规格参数

参数名称属性值
是否Rohs认证不符合
厂商名称UTRON
包装说明SOP, SOP32,.56
Reach Compliance Codeunknown
最长访问时间55 ns
I/O 类型COMMON
JESD-30 代码R-PDSO-G32
JESD-609代码e0
内存密度1048576 bit
内存集成电路类型STANDARD SRAM
内存宽度8
端子数量32
字数131072 words
字数代码128000
工作模式ASYNCHRONOUS
最高工作温度80 °C
最低工作温度-20 °C
组织128KX8
输出特性3-STATE
封装主体材料PLASTIC/EPOXY
封装代码SOP
封装等效代码SOP32,.56
封装形状RECTANGULAR
封装形式SMALL OUTLINE
并行/串行PARALLEL
电源3/3.3 V
认证状态Not Qualified
最大待机电流0.00004 A
最小待机电流2 V
最大压摆率0.05 mA
表面贴装YES
技术CMOS
温度等级COMMERCIAL EXTENDED
端子面层Tin/Lead (Sn/Pb)
端子形式GULL WING
端子节距1.27 mm
端子位置DUAL

UT62L1024SC-55LE文档预览

UTRON
Rev. 1.1
FEATURES
Access time : 35/55/70ns (max.)
Low power consumption :
Operating : 40/35/30 mA (typical)
Standby : 1.0µA (typical) L-version
0.5µA (typical) LL-version
Power supply range : 2.7V to 3.6V
All inputs and outputs TTL compatible
Fully static operation
Three state outputs
Data retention voltage : 2V (min.)
Extended Temperature : -20
~80
Package : 32-pin 600 mil PDIP
32-pin 450 mil SOP
32-pin 8x20mm TSOP-1
32-pin 8x13.4mm STSOP
UT62L1024(E)
128K X 8 BIT LOW POWER CMOS SRAM
GENERAL DESCRIPTION
The UT62L1024(E) is a 1,048,576-bit low power
CMOS static random access memory organized as
131,072 words by 8 bits. It is fabricated using high
performance, high reliability CMOS technology.
The UT62L1024(E) is designed for low power
application. It is particularly well suited for battery
back-up nonvolatile memory application.
The UT62L1024(E) operates from a single 2.7V ~
3.6V power supply and all inputs and outputs are
fully TTL compatible.
PIN CONFIGURATION
NC
A16
A14
A12
1
2
3
32
31
30
Vcc
A15
CE2
WE
FUNCTIONAL BLOCK DIAGRAM
A16
A15
A13
A14
A12
A7
A6
A5
A4
A8
ROW
DECODER
UT62L1024(E)
4
5
6
7
8
9
10
11
12
13
14
15
16
29
28
27
26
25
24
23
22
21
20
19
18
17
A7
A6
A5
A13
A8
A9
A11
OE
.
MEMORY ARRAY
VCC
A4
A3
A2
A1
A0
.
.
A10
CE1
I/O8
I/O7
I/O6
I/O5
I/O4
1024 ROWS × 1024 COLUMNS
VSS
I/O1
I/O2
I/O3
Vss
.
I/O1
I/O8
.
.
A11
A9
A8
A13
WE
CE2
A15
Vcc
NC
A16
A14
A12
A7
A6
A5
A4
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
PDIP / SOP
.
.
.
.
.
.
I/O
CONTROL
.
.
.
COLUMN I/O
COLUMN DECODER
CE
1
CE2
WE
OE
LOGIC
CONTROL
A10 A11 A9 A3 A2 A1 A0
UT62L1024(E)
PIN DESCRIPTION
SYMBOL
A0 - A16
I/O1 - I/O8
CE
1
,CE2
WE
OE
V
CC
V
SS
NC
DESCRIPTION
Address Inputs
Data Inputs/Outputs
Chip enable 1,2 Inputs
Write Enable Input
Output Enable Input
Power Supply
Ground
No Connection
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
A10
CE
1
OE
I/O8
I/O7
I/O6
I/O5
I/O4
Vss
I/O3
I/O2
I/O1
A0
A1
A2
A3
TSOP-1/STSOP
UTRON TECHNOLOGY INC.
1F, No. 11, R&D Rd. II, Science-Based Industrial Park, Hsinchu, Taiwan, R. O. C.
TEL: 886-3-5777882 FAX: 886-3-5777919
P80053
1
UTRON
Rev. 1.1
ABSOLUTE MAXIMUM RATINGS*
PARAMETER
Terminal Voltage with Respect to Vss
Operating Temperature
Storage Temperature
Power Dissipation
DC Output Current
Soldering Temperature (under 10 sec)
SYMBOL
V
TERM
T
A
T
STG
P
D
I
OUT
T
solder
UT62L1024(E)
128K X 8 BIT LOW POWER CMOS SRAM
RATING
-0.5 to +4.6
-20 to 80
-65 to +150
1
50
260
UNIT
V
W
mA
*Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress
rating only and functional operation of the device or any other conditions above those indicated in the operational sections of this
specification is not implied. Exposure to the absolute maximum rating conditions for extended period may affect device reliability.
TRUTH TABLE
MODE
Standby
Standby
Output Disable
Read
Write
CE
1
H
X
L
L
L
CE2
X
L
H
H
H
OE
X
X
H
L
X
WE
X
X
H
H
L
I/O OPERATION
High - Z
High -Z
High - Z
D
OUT
D
IN
SUPPLY CURRENT
I
SB
,
I
SB1
I
SB
,
I
SB1
I
CC
, I
CC
1
I
CC
, I
CC
1
I
CC
, I
CC
1,
Note: H = V
IH
, L=V
IL
, X = Don't care.
DC ELECTRICAL CHARACTERISTICS
(V
CC
= 2.7V ~ 3.6V, T
A
= -20
~80
)
PARAMETER
SYMBOL TEST CONDITION
Input High Voltage
V
IH
Input Low Voltage
V
IL
Input Leakage Current
I
IL
V
SS
V
IN
V
CC
Output Leakage Current I
OL
V
SS
V
I/O
V
CC
CE
1
=V
IH
or CE2 = V
IL
or
Output High Voltage
Output Low Voltage
Average Operating
Power Supply Courrent
V
OH
V
OL
I
CC
OE = V
IH
or WE = V
IL
I
OH
= - 1mA
I
OL
= 4mA
Cycle time = Min.,100% Duty,
CE
1
=V
IL
, CE2 = V
IH
,
I
I/O
= 0mA
Cycle time = 1µs, 100% Duty,
.
CE
1
0.2V,CE2
V
CC
-0.2V,
I
I/O
= 0Ma
CE
1
=V
IH
or CE2 = V
IL
CE
1
V
CC
-0.2V or
.CE2
0.2V
-L
- LL
*Those parameters are for reference only under 50℃
MIN.
2.0
- 0.5
-1
-1
2.0
-
-
-
-
-
-
-
-
TYP.
-
-
-
-
-
-
40
35
30
-
-
1.0
0.5
MAX.
V
CC
+0.5
0.6
1
1
-
0.4
60
50
40
5
1.0
100
20*
50
10*
UNIT
V
V
µA
µA
V
V
mA
mA
mA
mA
mA
µA
µA
35
55
70
I
CC1
Standby Power
Supply Current
I
SB
I
SB1
UTRON TECHNOLOGY INC.
1F, No. 11, R&D Rd. II, Science-Based Industrial Park, Hsinchu, Taiwan, R. O. C.
TEL: 886-3-5777882 FAX: 886-3-5777919
P80053
2
UTRON
Rev. 1.1
CAPACITANCE
(T
A
=25
, f=1.0MHz)
PARAMETER
Input Capacitance
Input/Output Capacitance
SYMBOL
C
IN
C
I/O
MIN.
UT62L1024(E)
128K X 8 BIT LOW POWER CMOS SRAM
-
-
MAX.
6
8
UNIT
pF
pF
Note : These parameters are guaranteed by device characterization, but not production tested.
AC TEST CONDITIONS
Input Pulse Levels
Input Rise and Fall Times
Input and Output Timing Reference Levels
Output Load
0.4V to 2.4V
5ns
1.5V
C
L
=50pF, I
OH
/I
OL
=-1mA/2mA
AC ELECTRICAL CHARACTERISTICS
(V
CC
= 2.7V ~ 3.6V , T
A
= -20
~80
)
(1) READ CYCLE
PARAMETER
SYMBOL
UT62L1024(E)-35 UT62L1024(E)-55 UT62L1024(E)-70 UNIT
MIN.
MAX.
MIN.
MAX.
MIN.
MAX.
Read Cycle Time
t
RC
35
-
55
-
70
-
ns
Address Access Time
t
AA
-
35
-
55
-
70
ns
Chip Enable Access Time
t
ACE1
, t
ACE2
-
35
-
55
-
70
ns
Output Enable Access Time
t
OE
-
25
-
30
-
35
ns
Chip Enable to Output in Low-Z
t
CLZ1
*, t
CLZ2
*
10
-
10
-
10
-
ns
Output Enable to Output in Low-Z t
OLZ
*
5
-
5
-
5
-
ns
Chip Disable to Output in High-Z
t
CHZ1
*, t
CHZ2
*
-
25
-
30
-
35
ns
Output Disable to Output in High-Z t
OHZ
*
-
25
-
30
-
35
ns
Output Hold from Address Change t
OH
5
-
5
-
5
-
ns
(2) WRITE CYCLE
PARAMETER
Write Cycle Time
Address Valid to End of Write
Chip Enable to End of Write
Address Set-up Time
Write Pulse Width
Write Recovery Time
Data to Write Time Overlap
Data Hold from End of Write-Time
Output Active from End of Write
Write to Output in High-Z
SYMBOL
t
WC
t
AW
t
CW1
, t
CW2
t
AS
t
WP
t
WR
t
DW
t
DH
t
OW
*
t
WHZ
*
UT62L1024(E)-35 UT62L1024(E)-55 UT62L1024(E)-70
UNIT
MIN.
35
30
30
0
25
0
20
0
5
-
MAX.
-
-
-
-
-
-
-
-
-
15
MIN.
55
50
50
0
40
0
25
0
5
-
MAX.
-
-
-
-
-
-
-
-
-
20
MIN.
70
60
60
0
45
0
30
0
5
-
MAX.
-
-
-
-
-
-
-
-
-
25
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
*These parameters are guaranteed by device characterization, but not production tested.
UTRON TECHNOLOGY INC.
1F, No. 11, R&D Rd. II, Science-Based Industrial Park, Hsinchu, Taiwan, R. O. C.
TEL: 886-3-5777882 FAX: 886-3-5777919
P80053
3
UTRON
Rev. 1.1
TIMING WAVEFORMS
READ CYCLE 1 (Address Controlled)
(1,2,4)
t
RC
UT62L1024(E)
128K X 8 BIT LOW POWER CMOS SRAM
Address
t
AA
t
OH
t
OH
DOUT
Data Valid
READ CYCLE 2
(
CE
1
, CE2 and
OE
Controlled)
(1,3,5,6)
t
RC
Address
CE1
t
ACE1
t
AA
CE2
t
ACE2
OE
t
CLZ1
t
CLZ2
Dout
HIGH-Z
t
OE
t
OLZ
t
OH
t
OHZ
t
CHZ1
t
CHZ2
HIGH-Z
Data Valid
Notes :
1.
WE
is HIGH for a read cycle.
2. Device is continuously selected OE
,
CE
1
=V
IL
and CE2=V
IH.
3. Address must be valid prior to or coincident with CE
1
4.
OE is low.
low
and CE2 high transition; otherwise t
AA
is the limiting parameter.
5. t
CLZ1
, t
CLZ2
, t
OLZ
, t
CHZ1
, t
CHZ2
and t
OHZ
are specified with C
L
=5pF. Transition is measured
±
500mV from steady state.
6. At any given temperature and voltage condition, t
CHZ1
is less than t
CLZ1
, t
CHZ2
is less than t
CLZ2
, t
OHZ
is less than t
OLZ.
UTRON TECHNOLOGY INC.
1F, No. 11, R&D Rd. II, Science-Based Industrial Park, Hsinchu, Taiwan, R. O. C.
TEL: 886-3-5777882 FAX: 886-3-5777919
P80053
4
UTRON
Rev. 1.1
WRITE CYCLE 1
( WE Controlled)
(1,2,3,5)
t
WC
Address
t
AW
CE1
t
CW1
CE2
t
CW2
UT62L1024(E)
128K X 8 BIT LOW POWER CMOS SRAM
t
AS
WE
t
WHZ
Dout
Din
(4)
t
WP
t
WR
t
OW
High-Z
t
DW
Data Valid
t
DH
(4)
WRITE CYCLE 2
( CE
1
and CE2 Controlled)
(1,2,5)
t
WC
Address
t
AW
CE1
t
AS
t
CW1
t
CW2
t
WR
CE2
WE
t
WP
t
WHZ
Dout
High-Z
t
DW
Din
Data Valid
t
DH
Notes :
1.
WE
or CE
1
must be HIGH or CE2 must be LOW during all address transitions.
2. A write occurs during the overlap of a low CE
1
, a high CE2 and a low
WE
.
3. During a
WE
controlled with write cycle with OE LOW, t
WP
must be greater than t
WHZ
+t
DW
to allow the I/O drivers to turn
off and data to be placed on the bus.
4. During this period, I/O pins are in the output state, and input singals must not be applied.
4. If the CE
1
LOW transition occurs simultaneously with or after
WE
LOW transition, the outputs remain in a high Impedance state.
6. t
OW
and t
WHZ
are specified with C
L
=5pF. Transition is measured
±
500mV from steady state.
UTRON TECHNOLOGY INC.
1F, No. 11, R&D Rd. II, Science-Based Industrial Park, Hsinchu, Taiwan, R. O. C.
TEL: 886-3-5777882 FAX: 886-3-5777919
P80053
5
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