SCOPE：
This specification applies to the Pb Free high current type SMD coupled inductors for
MSI-271108CP-R050M-H-VT
“This device is licensed for use only when incorporated within a voltage
regulator or converter employing power regulating devices manufactured or
designed by Volterra Semiconductor Corp. No license is granted expressly or
by implication to use this device with power regulating devices manufactured
or designed by any company other than Volterra."
PRODUCT INDENTIFICATION
MSI - 271108CP - R050 M - H - VT
①
②
③
④
⑤
①
Product Code
②
Dimensions Code
③
Inductance Code
④
Tolerance Code
⑤
Inner Control Code
(1) SHAPES AND DIMENSIONS
NOTE:Pin overlap is 2.1mm
A : 27.0 ± 0.5
B : 11.0 ± 0.5
C : 8.00 Max.
D : 2.45 ± 0.10
E1: 9.00 ± 0.25
E2: 18.0 ± 0.25
F1: 6.0 Typ.
F2: 3.0 Typ.
G : 10.5 ± 0.20
H : 3.6 ± 0.10
mm
mm
mm
mm
mm
mm
mm
mm
mm
mm
(2) ELECTRICAL SPECIFICATIONS
SEE TABLE 1
TEST INSTRUMENTS
L : HP 4285A PRECISION LCR METER (or equivalent)
RDC : CHROMA MODEL 16502 MILLIOHMMETER (or equivalent)
(3) CHARACTERISTICS
(3)-1 Operate temperature range ......
－40℃½＋125℃
(Including self temp. rise)
(3)-2 Storage temperature range ......
－40℃½＋125℃
MAG.LAYERS
MSI-271108CP-R050M-H-VT
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TABLE
MAGLAYERS PT/NO :
Current (A)
0A
OCL (nH)
15A
20A
23A
25A
LK (nH)
RDC(mΩ)
Irms
50A
0A
110A
0.29±10%
Based on temperature rise (△T： 40℃ TYP.)
200 Min.
_
150 Min.
@ 25℃
MSI-271108CP-R050M-H-VT
@ 85℃
200 Min.
200 Min.
190 Min.
_
120 Min.
50±20%
40 Min.
180 Min.
100 Min.
_
@ 105℃
*Open Circuit Inductance(OCL)
*Test Frequency : 1MHz/0.1Vrms, 0.0Adc
*The specs (Lk at 0A, and OCL at 0A and 25A) are guaranteed at room temp
as tested in production and other parameters are guaranteed by design.
RDC TEST POINT
RDC TEST
SCHEMATIC
MAG.LAYERS
MSI-271108CP-R050M-H-VT
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(4) RELIABILITY TEST METHOD
ELECTRICAL
TEST ITEM
Temperature
characteristics
SPECIFICATION
△L/L20℃≦±10%
0½2000 ppm/℃
TEST DETAILS
The test shall be performed after the sample has stabilized in
an ambient temperature of -20 to +85℃,and the value
calculated based on the value applicable in a normal
temperature and narmal humidity shall be
△L/L20℃≦±10%.
MECHANICAL
TEST ITEM
Substrate bending
SPECIFICATION
△L/Lo≦±5%
TEST DETAILS
The sample shall be soldered onto the printed circuit board
in figure 1 and a load applied unitil the figure in the arrow
There shall be
no mechanical
damage or elec-
trical damage.
direction is made approximately 3mm.(keep time 30 seconds)
PCB dimension shall the page 7/9
F(Pressurization)
Ivy
PRESSURE ROD
figure-1
MAG.LAYERS
MSI-271108CP-R050M-H-VT
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MECHANICAL
TEST ITEM
Vibration
△L/Lo≦±5%
SPECIFICATION
The sample shall be soldered onto the printed circuit board
and when a vibration having an amplitude of 1.52mm
There shall be
no mechanical
damage.
and a frequency of from 10 to 55Hz/1 minute repeated should
be applied to the 3 directions (X,Y,Z) for 2 hours each.
(A total of 6 hours)
Solderability
New solder
More than 90%
Flux (rosin, isopropyl alcohol{JIS-K-1522}) shall be coated
over the whole of the sample before hard, the sample shall
then be preheated for about 2 minutes in a temperature of
130½150℃ and after it has been immersed to a depth 0.5mm
below for 3±0.2 seconds fully in molten solder M705 with
a temperature of 245±5℃.
More than 90% of the electrode sections shall be couered
with new solder smoothly when the sample is taken out of
the solder bath.
Resistance to
Soldering heat
(reflow soldering)
There shall be
Sodering temperature (℃)
Temperature profile of reflow soldering
300
250
200
150
100
150 ~ 180℃
Pre-heating
30 sec Min
(230
+0
℃
)
no damage or
problems.
soldering
(Peak temperature 260±3℃ 10 sec)
50
Slow cooling
(Stored at room
temperature)
2 min
10
sec.
2 min. or more
The specimen shall be passed through the reflow oven with the
condition shown in the above profile for 1 time.
The specimen shall be stored at standard atmospheric conditions
for 1 hour, after which the measurement shall be made.
MAG.LAYERS
MSI-271108CP-R050M-H-VT
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ENVIROMENT CHARACTERISTICS
TEST ITEM
High temperature
storage
There shall be
no mechanical
damage.
△L/Lo≦±5%
SPECIFICATION
The sample shall be left for 96±4 hours in an atmospere with
a temperature of 125℃ and a normal humidity.
Upon completion of the measurement shall be made after the
sample has been left in a normal temperature and normal
humidity for 1 hour.
Low temperature
storage
△L/Lo≦±5%
The sample shall be left for 96±4 hours in an atmosphere with
a temperature of -40±3℃.
There shall be
no mechanical
damage.
Change of
temperature
There shall be
no other dama-
ge of problems
△L/Lo≦±5%
Upon completion of the test, the measurement shall be made
after the sample has been left in a normal temperature and
normal humidity for 1 hour.
The sample shall be subject to 5 continuos cycles, such as shown
in the table 2 below and then it shall be subjected to standard
stmospheric conditions for 1 hour, after which measurement
shall be made.
table 2
Temperature
1
-40±3℃
(Themostat No.1)
2
Standard
atmospheric
3
125±2℃
(Themostat No.2)
4
Standard
atmospheric
Moisture storage
△L/Lo≦±5%
The sample shall be left for 96±4 hours in a temperature of
40±2℃ and a humidity(RH) of 90½95%.
There shall be
no mechanical
damage.
Test conditions：
The sample shall be reflow soldered onto the printed circuit board in every test.
Upon completion of the test, the measurement shall be made
after the sample has been left in a normal temperature and
normal humidity more than 1 hour.
No.2→No.1
30 min.
No.1→No.2
Duration
30 min.
MAG.LAYERS
MSI-271108CP-R050M-H-VT
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