CRTM055N03LE
华润微电子(重庆)有限公司
Features
• Uses CRM(CQ) advanced Trench MOS technology
• Extremely low on-resistance R
DS(on)
• Excellent Q
g
xR
DS(on)
product(FOM)
• Qualified according to JEDEC criteria
Applications
• Motor control and drive
• Battery management
• UPS (Uninterrupible Power Supplies)
Trench N-MOSFET 30V, 4mΩ, 54A
Product Summary
V
DS
R
DS(on) typ.
I
D
30V
4mΩ
54A
100% DVDS Tested
100% Avalanche Tested
ESD Protected
Package Marking and Ordering Information
Part #
CRTM055N03LE
Marking
TM055N03LE
Package
DFN5X6
Packing
Reel
Reel Size
N/A
Tape Width
N/A
Qty
5000pcs
Absolute Maximum Ratings
Parameter
Drain-source voltage
Continuous drain current
T
C
= 25°C (Silicon limit)
T
C
= 25°C (Package limit)
T
C
= 100°C (Silicon limit)
Pulsed drain current (T
C
= 25°C, t
p
limited by T
jmax
)
Avalanche energy, single pulse (L=0.5mH, Rg=25Ω)
Gate-Source voltage
ESD
Power dissipation (T
C
= 25°C)
Operating junction and storage temperature
Soldering temperature, wave soldering only allowed at leads
(1.6mm from case for 10s)
I
D pulse
E
AS
V
GS
HBM
P
tot
T
j
,
T
stg
T
sold
I
D
64
54
41
216
38
±20
2.5
39
-55...+150
260
A
mJ
V
KV
W
°C
°C
A
Symbol
V
DS
Value
30
Unit
V
©China Resources Microelectronics (Chongqing) Limited
Page 1
CRTM055N03LE
华润微电子(重庆)有限公司
Thermal Resistance
Parameter
Thermal resistance, junction – case.
Thermal resistance, junction – ambient(min. footprint)
Symbol
R
thJC
R
thJA
*
Typ
2.47
50
Max
3.22
70
Unit
°C/W
Trench N-MOSFET 30V, 4mΩ, 54A
Electrical Characteristic
(at Tj = 25 °C, unless otherwise specified)
Parameter
Symbol
Value
min.
typ.
max.
Unit
Test Condition
Static Characteristic
Drain-source breakdown
voltage
Gate threshold voltage
BV
DSS
V
GS(th )
30
1.3
-
1.8
-
2.4
V
V
V
GS
=0V, I
D
=250uA
V
DS
=V
GS
,I
D
=250uA
V
DS
=30V,V
GS
=0V
Zero gate voltage drain
current
Gate-source leakage
current
I
DSS
-
-
I
GSS
-
0.05
-
±3
1
50
±20
uA
µA
T
j
=25°C
T
j
=150°C
V
GS
=±20V,V
DS
=0V
V
GS
=10V, I
D
=15A,
Drain-source on-state
resistance
R
DS(on)
-
-
-
Transconductance
g
fs
-
4
6.5
5
70
5.5
9.2
6.5
-
S
mΩ
T
j
=25°C
T
j
=150°C
V
GS
=4.5V, I
D
=10A,
V
DS
=5V,I
D
=15A
Dynamic Characteristic
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitance
Gate Total Charge
Gate-Source charge
Gate-Drain charge
Turn-on delay time
Rise time
Turn-off delay time
Fall time
Gate resistance
C
iss
C
oss
C
rss
Q
G
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
R
G
-
-
-
-
-
-
-
-
-
-
-
1940
307
227
44
8
10
9
59
66
69
6.0
3492
553
499
70
12
16
-
-
-
-
10
Ω
V
GS
=0V, V
DS
=0V,
f=1MHz
ns
V
GS
=10V, V
DD
=15V,
R
G_ext
=2.7Ω,ID=15A
nC
V
GS
=10V, V
DS
=15V,
I
D
=15A, f=1MHz
pF
V
GS
=0V, V
DS
=15V,
f=1MHz
©China Resources Microelectronics (Chongqing) Limited
Page 2
CRTM055N03LE
华润微电子(重庆)有限公司
Body Diode Characteristic
Parameter
Body Diode Forward
Voltage
Body Diode Forward
Current
Body Diode Reverse
Recovery Time
Body Diode Reverse
Recovery Charge
Symbol
Trench N-MOSFET 30V, 4mΩ, 54A
Value
min.
-
typ.
0.8
max.
1.3
54
-
-
25
16
38
24
Unit
V
A
ns
nC
Test Condition
V
GS
=0V,I
SD
=15A
T
C
= 25°C
V
SD
I
S
t
rr
Q
rr
I
F
=40A, dI/dt=100A/µ
s
*The value of R
thJA
is measured by placing the device in a still air box which is one cubic foot.
©China Resources Microelectronics (Chongqing) Limited
Page 3
CRTM055N03LE
华润微电子(重庆)有限公司
Trench N-MOSFET 30V, 4mΩ, 54A
Typical Performance Characteristics
Fig 1: Output Characteristics
150
150
Fig 2: Transfer Characteristics
10V
120
4.0V
T
j
=25°C
120
V
DS
=5V
3.5V
I
D
(A)
I
D
(A)
90
90
60
60
3.0V
30
30
150°C
25°C
0
5
Vgs=2.5V
0
0
1
2
3
4
1
2
3
4
5
V
DS
(V)
V
GS
(V)
10
Fig 3: Rds(on) vs Drain Current and
Gate Voltage
9
8
7
6
5
Fig 4: Rds(on) vs Gate Voltage
18
T
j
=25°C
14
I
D
=15A
R
DS(on)
(mΩ)
R
DS(on)
(mΩ)
V
GS
=4.5V
10
150°C
6
V
GS
=10V
4
3
0
30
60
90
120
150
25°C
2
2
3
4
5
6
7
8
9
10
I
D
(A)
V
GS
(V)
Fig 5: Rds(on) vs. Temperature
1.8
1.6
Fig 6: Capacitance Characteristics
10000
R
DS(on)
_Normalized
1.4
1.2
1.0
0.8
0.6
0.4
-50
-25
0
25
50
75
100
125
150
C - Capacitance (PF)
V
GS
=10V
I
D
=15A
Ciss
1000
Coss
V
GS
=0V
f=1MHz
100
0
6
12
18
24
30
Crss
Tj - Junction Temperature (°C)
V
DS
(V)
©China Resources Microelectronics (Chongqing) Limited
Page 4
CRTM055N03LE
华润微电子(重庆)有限公司
Trench N-MOSFET 30V, 4mΩ, 54A
Fig 8: Body-diode Forward
Characteristics
Fig 7: Gate Charge Characteristics
10
1000
8
I
S
- Diode Current(A)
100
V
GS
(V)
6
V
DS
=15V
I
D
=15A
150˚C
10
25˚C
4
1
2
0
0
10
20
30
40
50
0.1
0.4
0.6
0.8
1
1.2
1.4
1.6
Qg (nC)
V
SD
- Diode Forward Voltage(V)
Fig 9: Power Dissipation
45
40
Fig 10: Drain Current Derating
60
50
35
30
40
P
tot
(W)
25
20
15
10
I
D
(A)
30
20
V
GS
≥10V
10
5
0
0
25
50
75
100
125
150
0
0
25
50
75
100
125
150
175
Tc - Case Temperature (°C)
Tc - Case Temperature (°C)
Fig 11: Safe Operating Area
1000
100
Limited by
Rds(on)
1us
10us
I
D
(A)
100us
10
1ms
10ms
1
Single pulse
Tc=25˚C
0.1
0.1
1
10
DC
V
DS
(V)
100
©China Resources Microelectronics (Chongqing) Limited
Page 5
传感器
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