RALEC
旺詮
1
適用範圍:
RAT
½車用厚膜晶片電阻器
規格標準書(車用等級)
文件編號
版本日期
頁次
IE-SP-070
2018/07/23
1
1.1
本規範適用於RAT系列無鉛、無鹵素符合RoHS條款的厚膜晶片電阻器。
1.2
本產品適用於½車電子應用。
1.3
符合AEC-Q200 ，等級1信賴性要求。
2
型別名稱:
(例)
RAT
02
100
J
TH
型別
尺寸
電阻值
容差
包裝型式(請參閱
IE-SP-054)
½車用
厚膜晶片電阻器
01(0201)
02(0402)
03(0603)
05(0805)
06(1206)
12(1210)
20(2010)
25(2512)
EX.10Ω=100
3-碼
4.7Ω=4R7
JUMPER=000
4-碼
EX. 10.2Ω=10R2
10KΩ=1002
Q1：1 mm Pitch Carrier Tape 20000 pcs
QE：1 mm Pitch Carrier Tape 150000 pcs
TH：2 mm Pitch Carrier Tape 10000 pcs
H0：2 mm Pitch Carrier Tape 15000 pcs
H1：2 mm Pitch Carrier Tape 20000 pcs
H2：2 mm Pitch Carrier Tape 20000 pcs
B =± 0.1%
H3：2 mm Pitch Carrier Tape 30000 pcs
D=± 0.5%
H4：2 mm Pitch Carrier Tape 40000 pcs
H5：2 mm Pitch Carrier Tape 50000 pcs
F=± 1%
H6：2 mm Pitch Carrier Tape 60000 pcs
G=± 2%
TP：4 mm Pitch Carrier Tape 5000 pcs
J=± 5%
P2：4 mm Pitch Carrier Tape 10000 pcs
P3：4 mm Pitch Carrier Tape 15000 pcs
P4：4 mm Pitch Carrier Tape 20000 pcs
TE：4 mm Pitch Carrier Tape 4000 pcs
E6：8 mm Pitch Carrier Tape 2000 pcs
BA：散裝(盒裝)
IE
制訂
審查
核准
會½
QA
備註
發行管制章
DATA Center.
非 發 行 管 制 文 件
自 行 注 意 版 本 更 新
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Series No.
60
RALEC
旺詮
3
規格表:
型別
額定
功率
RAT
½車用厚膜晶片電阻器
規格標準書(車用等級)
最高
額定
電壓
最高
T.C.R
過負荷
(ppm/℃)
電壓 溫度係數
-200
+400
±200
50V
100V
±100
±200
±100
±200
±100
±200
±100
±200
±100
±200
±100
±200
±100
±200
文件編號
版本日期
頁次
IE-SP-070
2018/07/23
2
阻值範圍
B(±0.1%)
E-24、E-96
------
47Ω≦R≦1MΩ
100Ω≦R≦1MΩ
JUMPER
(0Ω)
額定電流
G(±2%)、J(±5%)
E-24
1Ω≦R＜10Ω
10Ω≦R≦10MΩ
10Ω≦R≦22MΩ
1Ω≦R＜10Ω
10Ω≦R≦22MΩ
1Ω≦R＜10Ω
10Ω≦R≦27MΩ
1Ω≦R＜10Ω
10Ω≦R≦27MΩ
1Ω≦R＜10Ω
10Ω≦R≦27MΩ
1Ω≦R＜10Ω
10Ω≦R≦20MΩ
1Ω≦R＜10Ω
10Ω≦R≦20MΩ
1Ω≦R＜10Ω
1A
1.33A
J
(±5%)
0.5A
F
(±1%)
---
JUMPER
(0Ω)
阻值
J
(±5%)
50mΩ
MAX
50mΩ
MAX.
50mΩ
MAX.
50mΩ
MAX.
50mΩ
MAX.
50mΩ
MAX.
50mΩ
MAX.
50mΩ
MAX.
F
(±1%)
---
D(±0.5%)
E-24、E-96
1Ω≦R＜10Ω
10Ω≦R≦10MΩ
10Ω≦R≦1MΩ
------
10Ω≦R≦1MΩ
1Ω≦R＜10Ω
10Ω≦R≦10MΩ
1Ω≦R＜10Ω
10Ω≦R≦10MΩ
1Ω≦R＜10Ω
10Ω≦R≦10MΩ
------
10Ω≦R≦10MΩ
------
10Ω≦R≦10MΩ
F(±1%)
E-24、E-96
1Ω≦R＜10Ω
10Ω≦R≦10MΩ
10Ω≦R≦22MΩ
1Ω≦R＜10Ω
10Ω≦R≦22MΩ
1Ω≦R＜10Ω
10Ω≦R≦27MΩ
1Ω≦R＜10Ω
10Ω≦R≦27MΩ
1Ω≦R＜10Ω
10Ω≦R≦27MΩ
1Ω≦R＜10Ω
10Ω≦R≦20MΩ
1Ω≦R＜10Ω
10Ω≦R≦20MΩ
1Ω≦R＜10Ω
RAT01
(0201)
RAT02
(0402)
RAT03
(0603)
RAT05
(0805)
RAT06
(1206)
RAT12
(1210)
RAT20
(2010)
RAT25
(2512)
1
W
20
1
W
16
1
W
10
1
W
8
1
W
4
1
W
2
3
W
4
1W
25V
50V
------
100Ω≦R≦1MΩ
35mΩ
MAX.
25mΩ
MAX.
20mΩ
MAX.
20mΩ
MAX.
20mΩ
MAX.
20mΩ
MAX.
20mΩ
MAX.
75V
150V
------
100Ω≦R≦1MΩ
1A
2A
150V
300V
------
10Ω≦R≦1MΩ
3Ω≦R＜10Ω
100Ω≦R≦1MΩ
2A
2.5A
200V
400V
2A
3.5A
200V
400V
------
1
00Ω≦R≦1MΩ
------
100Ω≦R≦1MΩ
2A
4A
200V
400V
2A
5A
200V
400V
------
------
2A
7A
½用溫度範圍
-55℃ ~ +155℃
(0201:-55℃ ~ +125℃)
3.1
功率衰減曲線:
型別
½用
溫度
範圍
說明
RAT01 (0201)
－55℃
~
＋125℃
其它
－55℃
~
＋155℃
周圍溫度若超過70℃至125℃之間，功率可照下 周圍溫度若超過70℃至155℃之間，功率可照下
圖曲線予以修定之。
圖曲線予以修定之。
功
率
衰
減
曲
線
圖
備
非 發 行 管 制 文 件
自 行 注 意 版 本 更 新
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發行管制章DATA
Center.
註
Series No.
60
RALEC
旺詮
RAT
½車用厚膜晶片電阻器
規格標準書(車用等級)
文件編號
版本日期
頁次
IE-SP-070
2018/07/23
3
3.2
額定電壓:
額定電壓:對於額定功率之直流或交流(商用週率有效值rms.)電壓。
可用下列公式求得，½求得之值若超過規格表內之最高電壓時，則以最高額定電壓為其
額定電壓。
E
½
4
尺寸:
R×P
E=額定電壓(V)
P=額定功率(W)
R=公稱阻值(Ω)
Unit:mm
Dimension
L
Type
Size Code
W
0.30±0.03
0.50±0.05
0.80±0.10
1.25±0.10
1.55±0.10
2.55±0.10
2.50±0.20
3.20±0.20
H
0.23±0.03
0.30±0.05
0.45±0.10
0.50±0.10
0.50±0.10
0.55±0.10
0.55±0.10
0.55±0.10
L1
0.10±0.05
0.20±0.10
0.30±0.15
0.35±0.20
0.45±0.20
0.50±0.20
0.60±0.20
0.60±0.20
L2
0.15±0.05
0.25±0.10
0.30±0.15
0.35±0.15
0.35±0.15
0.50±0.20
0.60±0.20
0.60±0.20
RAT01
RAT02
RAT03
RAT05
RAT06
RAT12
RAT20
RAT25
0201
0402
0603
0805
1206
1210
2010
2512
0.60±0.03
1.00±0.10
1.60±0.10
2.00±0.10
3.05±0.10
3.05±0.10
5.00±0.20
6.30±0.20
5
結構圖:
1
2
3
4
5
陶瓷基板
背面內部電極
正面內部電極
電阻層
1st
保護層
Ceramic substrate
Bottom inner electrode
Top inner electrode
Resistive layer
1st Protective coating
6
7
8
9
10
2nd
保護層
字碼
側面內部電極
Ni
層電鍍
Sn
層電鍍
2nd Protective coating
Marking
Terminal inner electrode
Ni plating
Sn plating
發行管制章DATA
Center.
備
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註
Series No.
60
RALEC
旺詮
RAT
½車用厚膜晶片電阻器
規格標準書(車用等級)
Conditions
條件
文件編號
版本日期
頁次
IE-SP-070
2018/07/23
4
6
信賴性試驗項目:
Item
項目
High
Temperature
Exposure
(Storage)
Specifications規格
Resistors
Jumper
0.1%、0.5%、1%： R=±1.0% Refer to item 3.
Put the specimens in the chamber with temperature of
2、2%、5%： R=±2.0% general
155±3℃ for 1000 hours. Then take them out to stabilize
specifications
in room temperature for 24±4hr or more, and measure of
its resistance variance rate.
Temperature
Cycling
Experiment evidence: AEC-Q200
Put the specimens in the High & low temperature test
chamber with temperature varies from -55℃ to 125℃
for 5 minutes and total 1000 cycles. Then take them out
to stabilize in room temperature for 24±4hr or more, and
measure of its resistance variance rate.
Experiment evidence: AEC-Q200
Applied 2.5 times rated voltage for 5 seconds and
release the load for about 30 minutes, then measure its
resistance variance ate.
(Rated voltage refer to item 3. general specifications)
Refer to JIS-C5201-1 4.13
R=±2.0%
Refer to item 3.
general
specification
Short Time
Overload
0.1%、0.5%、1%： R=±1.0% Refer to item 3.
2、2%、5%： R=±2.0% general
specification
Solder the specimens on the test PCB and put them into
0.1%、0.5%、1%： R=±2.0% Refer to item 3.
2%、5%： R=±3.0% general
the constant temperature humidity chamber with 85±2℃
specification
and 85±5%RH. Then apply the test voltage that
calculates based on the 10% of rated power for 1000hrs.
Biased Humidity Then take them out to stabilize in room temperature for
24±4hr or more, and measure of its resistance variance
rate.
Experiment evidence: AEC-Q200
Solder the specimens on the test PCB and Put them in
0.1%、0.5%、1%： R=±2.0% Refer to item 3.
2%、5%： R=±3.0% general
the chamber with temperature of 125±3℃ and load the
specification
voltage for 1000 hours. Then take them out to stabilize in
room temperature for 24±4hr or more, and measure of its
resistance variance rate.
Note: The input voltage shall refer to the power de-rating
curve (referring to page 2,No.3.1)
Refer to item 3.
general
specification.
Operational
Life
Experiment evidence: AEC-Q200
The specimens are fully immersed into the Pb-free solder
R=±1.0%
pot, then take them out to stabilize for 1 hour or more and
measure of its resistance variance rate.
Resistance to Temp of solder pot：260±5℃
Soldering Heat
Soldering duration：10±1sec.
Experiment evidence AEC-Q200
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發行管制章DATA
Center.
註
Series No.
60
RALEC
旺詮
Item
項目
RAT
½車用厚膜晶片電阻器
規格標準書(車用等級)
Conditions
條件
R=±3.0%
Put the specimens on the test fixture and two
(2)discharges (2KVDC) shall be applied to each PUT,
one (1) with a positive polarity and one (1) with a
negative polarity. Afterwards, the specimens stabilize for
30min or more and measure of its resistance variance
rate. The test is performed with direct contact and regular
discharge mode. The resistor and capacitor used on the
spearhead is 2000Ω and 150pF respectively.
文件編號
版本日期
頁次
IE-SP-070
2018/07/23
5
Specifications規格
Resistors
Jumper
Refer to item 3.
general
specification
ESD
Solderability
Experiment evidence AEC-Q200
1.Soldering coverage over 95%
Test method:
2.At the edge of terminal, the object underneath
Test item 1 (solder pot test):
Method B
(e.g. white ceramic) shall not expose.
Precondition:
The specimens are subjected to 155℃ dry bake for
4hrs±15min.
The specimens are immersed into the flux first, then fully
immersed into the solder pot, at a temperature of
235± 5℃ for 5+0/-0.5 sec. Then rinse with water and
observe the soldering coverage under the microscope.
Test item 2 (Leaching test): Method D
The specimens are immersed into the flux first, then fully
immersed into the solder pot, at a temperature of
260±5℃ for 30+0/-0.5 sec. Then rinse with water and
observe the soldering coverage under the microscope.
Experiment evidence AEC-Q200
（
R2－ R1）
TCR（ppm /
℃）＝
R1（ T2－ T1）
×10
R1: Resistance at room temperature (Ω)
R2: Resistance at -55℃or +125℃(Ω)
Electrical
Characterization T1: Room temperature (℃)
T2: Temperature -55℃ or +125℃
6
Refer to item 3. general
specifications
NA
Experiment evidence: AEC-Q200
Refer to item 3.
Solder the specimens on the test PCB and put the PCBA
R=±1.0%
general
onto the Bending Tester. Add force at the central part of
specification
PCB, and the duration of the applied forces shall be
60 (+ 5) Sec. Measure of its resistance variance rate in
No mechanical damage, peel-off of side end or
Board Flex
chip crack.
load.
(Bending Test)
Bending depth
(D)=5mm
Experiment evidence: AEC-Q200
備
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自 行 注 意 版 本 更 新
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發行管制章DATA
Center.
註
Series No.
60
PCB设计
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