AEC-Q200
Compliant with AEC-Q200 standard
Miniature and light weight
Suit for reflow and wave flow solder
Stable electrical capability,high reliability
Low assembly cost,suit for automatic SMT equipment
Superior mechanical and frequency characteristics
With good sulfuration-resistant performance
RoHS
Compliant with RoHS directive
Halogen
f
ree
r
equirement
AC
D
03
K
1003
F
T
Product
Code
Rated Power
Code
Type Code
T.C.R Code
Resistance Value Code
(E-24
)
Resistance
Tolerance Code
Packaging
Style Code
Code
Rated
Power
Code Type
Type
Code
C
1/16W
02
0402
D
Thick
Film
Chip
Fixed
Resistor
Automotive
Grade
1/10W
03
0603
E
1/8W
05
0805
0402
0603
0805
1206
1210
2010
2512
K
100
Three digits (E-24
series):The first two
digits are significant
figures and the third
one denotes number of
zeros.
(E-96
)
Code
Code
Packaging
Tolerance
Style
D
F
G
J
K
F
Chip
G
Jump-
er
0.5%
1%
T
L
250
F
1/4W
06
1206
R
1/3W
1210 1210
Chip
No Marking
Jumper
Four digits(E-96
series):The first three
digits are Significant
figures and the four
one denotes number of
zeros.
R
Decimal
point should be
expressed by "R".
Example:
2%
5%
10%
10m
C
Tape
&
Reel
H
3/4W
10
2010
J
1W
12
2512
103 =10K (E-24)
1003=100K (E-96)
1R0 =1.0 (E-24)
000=0
20m
50m
Case
J
1
THICK FILM CHIP FIXED RESISTOR AUTOMOTIVE GRADE
Ceramic Substrate
Bottom Electrode
Top Electrode
Resistor Layer
Primary Overcoat
Secondary Overcoat
Edge Electrode
Barrier Layer
External Electrode
Dimensions (mm)
Type
0402
0603
0805
1206
1210
2010
2512
1.00
1.60
2.00
3.20
3.20
5.00
6.40
L
0.10
0.15
0.20
0.20
0.20
0.20
0.20
W
0.50
0.80
1.25
1.60
2.50
2.50
3.20
0.10
0.15
0.15
0.15
0.20
0.20
0.20
0.35
0.45
0.55
0.55
0.55
0.55
0.55
t
0.10
0.10
0.10
0.10
0.10
0.10
0.10
0.25
0.30
0.30
0.35
0.35
0.40
0.40
a
0.15
0.20
0.20
0.20
0.20
0.20
0.20
b
0.25 0.10
0.30
0.40
0.50
0.50
0.60
0.60
0.20
0.20
0.20
0.20
0.20
0.20
100
75
50
25
-55
70
:
Operating
Temperature
Range:
-55
~
155
Percent Rated Load
0
-75
-50
-25
0
25
50
75
100
125
155
Ambient temperature( )
70
(
)
Note For resistors operated in ambient over 70 ,rated load (rated power or rated current) shall be derated in accordance with the
above figure.
70
Type
70
Rated Power at 70
(W)
1/16
1/10
1/8
1/ 4
1/ 3
3/ 4
1
1
2
Limiting Element
Voltage
Max. Overload
Voltage
(V)
50
50
150
(V)
100
100
Rated Current
for Chip Jumper
at 70
(A)
Max. Overload
Current for
Chip Jumper (A)
0402
0603
0805
1206
1210
2010
2512
1
1
2
2
2
2
2
2
3
5
5
5
5
5
300
400
400
400
400
200
200
200
200
Note
Voltage of DC or AC RMS value.
E=
E=
or Limiting element voltage whichever is lower.
E
Rated voltage(V)
P
Rated power(W)
R
Normal resistance( )
2
T.C.R (ppm/ )
Type
0402
0603
0805
1206
1210
2010
2512
Resistance Range
0.5%
1
10
R 10
R 1M
/
1%
250
Resistance Tolerance
2%
250
5%
250
10%
250
100
/
100
250
100
250
100
250
100
250
1M
R 10M
Specifications
Item
Resistor
Jumper
Test Methods
High
Temperature
Exposure
(Storage)
No mechanical damage
No mechanical
AEC-Q200 Test 3/MIL-STD-202 Method 108
damage
0.5% 1%
1000
@ T=125 ,
R 100 m (J )
R
(1.0%R 0.05 )
1000 h @ T=125 , Unpowered
R 40 m (G )
2% 5% 10%
R
(2.0%R 0.05 )
R 20 m (F )
No mechanical damage
No mechanical
damage
0.5% 1%
R 100 m (J )
R
(0.5%R 0.05 )
R 40 m (G )
2% 5% 10%
R 20 m (F )
R
(1.0%R 0.05 )
Temperature
Cycling
AEC-Q200 Test 4/JESD22 Method JA-104
-55 (30
)
( 1
) 125 (30
) 1000
-55 (30min) normal temperature( 1min)
125 (30min),1000 cycles;
AEC-Q200 Test 7/ MIL-STD-202 Method 103
;
Biased Humidity
No mechanical damage
R
(3.0%R 0.05 )
No mechanical
85
85%
10%
(
)
damage
1000
R 100 m (J )
85 /85%RH. 1000 hours, Apply 10% of operating power
R 40 m (G )
R 20 m (F )
(current) or limiting element voltage whichever is lower.
No mechanical damage
No mechanical
125
2
1000
(
)
(
)
damage
0.5% 1%
1.5
/ 0.5
Operational Life
R 100 m (J )
R
(1.0%R 0.05 )
125
2
1000h rated voltage
(current)
or limiting element
R 40 m (G )
2% 5% 10%
R
(3.0%R 0.05 )
R 20 m (F )
voltage whichever is lower for 1.5h ON/0.5h OFF.
AEC-Q200 Test 8/ MIL-STD-202 Method 108
AEC-Q200 Test 12/ MIL-STD-202 Method 215
3min
10
3
Resistance to
Solvents
Clearly marked
No mechanical damage
Immersed in three solvents after 3min immersion, brush wipe
10 times, a total of 3 times, washing with washing and cleaning
agent, room temperature on the surface of the ventilation drying.
Mechanical
Shock
AEC-Q200 Test 13/ MIL-STD-202 Method 213
100
g s
6ms
No mechanical
damage
3
18
No mechanical damage
R 50 m (J )
Positive half wave, peak acceleration: 100
g s
, pulse
R
(1.0%R 0.05 )
R 20 m (G )
duration: 6ms, three axis six to each 3 times, a total
R 10 m (F )
of 18 times.
AEC-Q200 Test 14/ MIL-STD-202 Method 204
No mechanical
5g s
10Hz~2000Hz,
20min
damage
Z
12
36
R 50 m (J )
R 20 m (G )
R 10 m (F )
X Y
Vibration
No mechanical damage
R
(1.0%R 0.05 )
Frequency: 10Hz ~ 2000Hz, acceleration: 5 g s , a loop
20min, X, Y, Z three directions, each direction 12 cycles,
36 cycles.
Resistance to
Soldering Heat
No mechanical damage
0.5% 1%
R
(0.5%R 0.05 )
2% 5% 10%
R
(1.0%R 0.05 )
No mechanical
AEC-Q200 Test 15/ MIL-STD-202 Method 210
damage
270
5
10s 1s
R 50 m (J )
Lead-free solder bath at 270
5 for 10s 1s.
R 20 m (G )
R 10 m (F )
3
THICK FILM CHIP FIXED RESISTOR AUTOMOTIVE GRADE
Continue
Specifications
Item
Resistor
Jumper
Test Methods
AEC-Q200 Test 16/MIL-STD-202 Method 107
-55 (15
)
( 20
)
155 (15
) 300
1206 -55 (15min) normal temperature( 20s)
155 (15min) 300 cycles.
Thermal Shock
No mechanical damage
No mechanical
damage
0.5% 1%
R
(0.5%R 0.05 )
R 50 m (J )
2% 5% 10%
R 20 m (G )
R
(1.0%R 0.05 )
R 10 m (F )
ESD
Electrostatic
Discharge
(ESD)
No mechanical
AEC-Q200 Test 17/AEC-Q200-002
damage
No mechanical damage
R 50 m (J )
Human body model, 1pos + 1neg dischargs.
R
(3.0%R 0.05 )
R 20 m (G )
0402/0603 1KV
0805 2KV 1206
3KV
R 10 m (F )
Solderability
No mechanical damage
95%
95% Cover Min
Within specified T.C.R
AEC-Q200 Test 18/IEC 60115-1 4.17
245
5
3s 0.3s.
Lead-free solder bath at 245
5 for 3s 0.3s.
AEC-Q200 Test 19/IEC 60115-1 4.8
+20 /-55 /+20 /+125 /+20
T.C.R
Flammability
No ignition of the tissue paper or
scorching or the pinewood board.
AEC-Q200 Test 20/UL-94
V-0 V-1
V-0 or V-1 are acceptable. Electrical test not required.
AEC-Q200 Test 21/AEC-Q200-005
Substrate
Bending Test
No mechanical damage
No mechanical
(Bending distance)
0.5% 1%
damage
0402 0603 0805 5mm
1206
R
(0.5%R 0.05 )
R 50 m (J )
2010 2512:2mm
2% 5% 10%
R 20 m (G )
(Duration) 60s 5s
R
(1.0%R 0.05 )
R 10 m (F )
1210:4mm;
Terminal
Strength
No mechanical damage
No mechanical
AEC-Q200 Test 22/AEC-Q200-006
damage
0.5% 1%
: 17.7N
60 1
R
(0.5%R 0.05 )
R 50 m (J )
Appling force 17.7N for 60s 1s
.
2% 5% 10%
R 20 m (G )
R
(1.0%R 0.05 )
R 10 m (F )
Flame
Retardance
AEC-Q200 Test 24/AEC-Q200-001
9Vdc
32Vdc
500A
1
No flame
1.0Vdc
Subjected to voltage from 9.0 to 32.0 VDC(current clamped up
to 500A), and each voltage level shall be increased in 1.0 VDC
for one hour minimum.
IEC 60115-1 4.6
100V
Insulation
Resistance
15V
1
1000M
Min
Apply DC 100V 15V between substrate and terminations for
1min, then check insulation resistance.
IEC 60115-1 4.7
Voltage Proof
No breakdown or flashover
100V/s
60s 5s.
Apply max. overload voltage of AC RMS at a rate of approximately
100V/s between substrate and terminations for 60s 5s.
Short Time
Overload
No mechanical damage
0.5% 1%
R
(1.0%R 0.05 )
2% 5% 10%
R
(2.0%R 0.05 )
No mechanical damage
0.5% 1%
R
(1.0%R 0.05 )
2% 5% 10%
R
(2.0%R 0.05 )
No mechanical
damage
R 50 m (J )
R 20 m (G )
R 10 m (F )
IEC 60115-1 4.13
2.5
/
(
)
5
2.5 times rated voltage or max. overload voltage(current)
whichever is lower for 5s.
IEC 60115-1 4.36
Operation at
Low
Temperature
No mechanical
-55
5
1
(
)
(
damage
)45
15
R 50 m (J )
-55
5 , 1h without load rated voltage(current) or limiting
R 20 m (G )
element voltage whichever is lower for 45min, 15min without
R 10 m (F )
load.
4
Continue
Specifications
Item
Resistor
Jumper
Test Methods
Sulfuration
Resistant
105
3
500
No mechanical
No mechanical damage
Cutting oil: sulphur power, constant temperature:
damage
R
(5.0%R 0.05 )
R 100 m (J )
105
3 ,for 500hrs.
R 40 m (G )
R 20 m (F )
1
9
Packaging see the appendix 1-9 Page .
5
微控制器 MCU
京公网安备 11010802033920号
Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved
电子工程世界
