Power Inductors
Specification for Approval
Customer:
Customer P/N:
Product Name：
Coilank P/N:
Power Inductors
APW12A80 Series
立创
[
New Released,
Approved by
Revised]
Checked by
Prepared by
Jean.lin
Bruce.lan
Coilank Technology Co.,Ltd
ADD: No.39，Chingao Rd.,(305)Hsinpu，Hs inchu Hsien Taiwan，R.O.C
TEL : 00886-3-5894523 FAX : 00886-3-5894415
ADD: Unit D, 16/F Cheuk Nang Plaze 250 Hennessy Road, Wanchai HongKong
TEL : 00852-31135161 FAX : 00852-31121631
SZ Office TEL : 0755-29452870/3 FAX : 0755-61658369
HTTP : www.coilank.com
E-mail :
sales@coilank.com
【For
Customer approval Only】
Qualification Status:
Full
Date:
Restricted
Rejected
Approved By
Verified By
Checked By
Comments:
Http://www.coilank.com
E-mail:sales@coilank.com
Power Inductors
Change Note
Version
1
2
Comtent
New Design
Upgrade the Coilank P/N：APW-B to
APW-A
Draw
Lijun.lan
Bruce.lan
Check
Emie.luo
Jean.lin
Approval
Date
Coding
S02
S153
James.huang 2018.10.31
Jean.lin
2019.03.29
Http://www.coilank.com
E-mail:sales@coilank.com
Power Inductors
1.
External Dimensions (Unit:m/m)
TYPE
APW12A80
A
12.5Max
B
12.5Max
C
8.0Max
D
5.0Ref
E
7.6Ref
F
12.6Ref
G
5.4Ref
H
7.0Ref
Q’TY/Reel
500
2.
Part Number Code
APW
A
A:
B:
C:
D:
E:
F:
12
B
A
C
80
D
M
E
1R5
F
Series Name
Dimensions(mm)
Materials
Thickness(mm)
Tolerance
Inductance
Power Inductors
12：12.5x12.5 Max
NO use
80：8.0 Max
M：±
20%
1R5=1.5uH
3.
Electrical Characteristics
Part Number
APW12A80M1R5
APW12A80M2R2
APW12A80M3R3
APW12A80M4R7
APW12A80M6R8
APW12A80M100
APW12A80M150
APW12A80M220
APW12A80M330
APW12A80M470
APW12A80M101
Inductance
(uH)
1.5
2.2
3.3
4.7
6.8
10.0
15.0
22.0
33.0
47.0
100.0
Test Frequency
(KHz)
100KHz/0.25V
100KHz/0.25V
100KHz/0.25V
100KHz/0.25V
100KHz/0.25V
100KHz/0.25V
100KHz/0.25V
100KHz/0.25V
100KHz/0.25V
100KHz/0.25V
100KHz/0.25V
DC Resistance
(mΩ)Max.
10.0
11.5
15.0
10.45
24.0
30.0
27.0
43.0
68.4
85.0
150.0
Saturation Current
(A)Max.
15.0
8.0
7.5
6.8
6.0
8.0
7.5
3.6
5.0
4.3
2.8
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Power Inductors
Notes:
1）AEC-Q200 qualified.
2）All test data is referenced to 25℃ ambient.
3）Operating temperature range -40℃ to +125℃.
4）Isat: DC current(A) that will cause lo to drop approximately 35%.
5）The part temperature(ambient + temp rise)should not exceed 125℃ under worst case operating
conditions. circuit design,component placement, PWB trace size and thickness,airflow and other
cooling provisions all affect the part temperature,part temperature should be verified in the end
application.
4.
Test Data
ELECTRICAL CHARCTERISTIC
SPEC
TOL
NO
1
2
3
4
5
6
7
8
9
10
L(uH)
1.5
±
20%
1.53
1.52
1.49
1.53
1.56
1.49
1.48
1.52
1.47
1.52
DCR(mΩ)
10.0
Max
5.26
5.35
5.56
5.52
5.46
5.36
5.46
5.46
5.46
5.62
Isat(uH)
15.0A
(L0A-L15.0A)
/L0A≤35%
1.43
1.42
1.39
1.42
1.45
1.38
1.38
1.46
1.37
1.43
A(mm)
12.5
Max
12.01
11.93
11.96
12.03
12.02
11.95
11.95
12.01
11.99
12.03
MECHANICAL DIMENSIONS
B(mm)
12.5
Max
11.96
12.03
12.02
11.95
12.02
12.03
11.94
12.02
11.95
11.94
C(mm)
8.0
Max
7.53
7.59
7.58
7.55
7.52
7.59
7.58
7.53
7.51
7.54
D(mm)
5.0
Ref
OK
OK
OK
OK
OK
OK
OK
OK
OK
OK
Test Equipmets: IM3536,VR126,VR7210,Calipers
5.
Test and Measurement Procedures
5.1 Test Conditions
5.1.1 Unless otherwise specified, the standard atmospheric conditions for measurement/test as:
a. Ambient Temperature: 20±
15℃
b. Relative Humidity: 65%±
20%
c. Air Pressure: 86KPa to 106KPa
5.1.2 If any doubt on the results, measurements/tests should be made within the following limits:
a. Ambient Temperature: 20±
2℃
b. Relative Humidity: 65%±
5%
c. Air Pressure: 86KPa to 106Kpa
5.2 Visual Examination
a. Inspection Equipment: 10X magnifier
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Power Inductors
5.3 Electrical Test
5.3.1 Inductance (L)
a. Refer to the third item.
b. Test equipment: IM3536 LCR meter or equivalent.
c. Test Frequency and Voltage: Refer to the third item.
5.3.2 Direct Current Resistance (DCR)
a. Refer to the third item.
b. Test equipment: VR126 or equivalent.
5.3.3 Current
a. Refer to the third item.
b. Test equipment (see Fig.5.3.3-1): Electric Power, Electric current meter, Thermometer.
c. Measurement method (see Fig. 5.3.3-1):
1. Set test current to be 0 mA.
2. Measure initial temperature of chip surface.
3. Gradually increase voltage and measure chip temperature for corresponding current.
d. Definition of Temperature rise current: DC current that causes the temperature rise (△T
=40°
C)from 20° ambient (see Fig. 5.3.3-2).
C
Fig.5.3.3-1
Fig.5.3.3-2
5.4 Reliability Test
Item
Specifications
Test conditions
Temperature: 125±2℃.
Duration:1000hrs.
Measured at room temperature after
placing for 24± hrs.
4
5.4.1
High temperature storage
test
No visible mechanical damage.
Inductance change: Within ±
10%.
5.4.2
Temperature cycling test
No visible mechanical damage.
Inductance change: Within ±
10%.
Condition for 1 cycle.
Step1：-40±2℃ 30min Min.
Step2：125±2℃, transition time 1min Max.
Step3：125±2℃ 30min Min.
Step4：Low temp, transition time 1min Max.
Number of cycles：1000.
Measured at room temperature after placing for 24±
4
hrs.
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