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322-HCS5P2-640

器件型号:322-HCS5P2-640
器件类别:连接器    插座   
厂商名称:TE Connectivity(泰科)
厂商官网:http://www.te.com
标准:
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器件描述

DIP40, IC SOCKET

参数
参数名称属性值
是否无铅不含铅
是否Rohs认证符合
厂商名称TE Connectivity(泰科)
Reach Compliance Codeunknown
ECCN代码EAR99
Is SamacsysN
联系完成配合GOLD
联系完成终止GOLD
触点材料BERYLLIUM COPPER
设备插槽类型IC SOCKET
使用的设备类型DIP40
JESD-609代码e4
制造商序列号HOLTITE
触点数40
Base Number Matches1

文档预览

Product
Specification
AUGAT* HOLTITE* Sockets
1.
1.1.
SCOPE
Content
108-1979
11Mar11 Rev B
This specification covers performance, tests and quality requirements for the TE Connectivity (TE)
AUGAT* HOLTITE* Sockets. These sockets are designed to be press-fit into a plated through hole of a
printed circuit board. This unique design allows the plated through hole to become a component socket.
The sockets are designed to accept a .016 to .021 inch round lead (5P), .011 X .018 inch rectangular
lead (5P), .020 to .030 inch round lead (6P), .025 to .035 inch round lead (8P) and .035 to .045 inch
round lead (12P).
1.2.
Qualification
When tests are performed on the subject product line, procedures specified in Figure 1 shall be used.
All inspections shall be performed using the applicable inspection plan and product drawing.
1.3.
Qualification Test Results
Successful qualification testing on the subject product line has been completed. The Qualification Test
Report number for this testing is 501-500. This documentation is on file at and available from
Engineering Practices and Standards (EPS).
2.
APPLICABLE DOCUMENTS
The following documents form a part of this specification to the extent specified herein. Unless
otherwise specified, the latest edition of the document applies. In the event of conflict between the
requirements of this specification and the product drawing, the product drawing shall take precedence.
In the event of conflict between the requirements of this specification and the referenced documents,
this specification shall take precedence.
2.1.
TE Documents
!
!
2.2.
109-197: TE Test Specifications vs EIA and IEC Test Methods
501-500: Qualification Test Report
Commercial Standard
EIA-364: Electrical Connector/Socket Test Procedures Including Environmental Classifications
3.
3.1.
REQUIREMENTS
Design and Construction
Product shall be of the design, construction and physical dimensions specified on the applicable product
drawing.
3.2.
Materials
Materials used in the construction of this product shall be as specified on the applicable product
drawing.
©2011 Tyco Electronics Corporation, | Indicates change
a TE Connectivity Ltd. Company
*Trademark
All Rights Reserved
TE logo is a trademark.
For latest revision, visit our website at www.te.com/documents.
For Regional Customer Service, visit our website at www.te.com
Other products, logos, and company names might be trademarks of their respective owners.
1 of 5
LOC B
108-1979
3.3.
Ratings
!
!
Current: 5 amperes using an .062 inch thick glass epoxy, Type FR4, with 2 ounce copper, plated,
with electroplated (.001 inch minimum) copper and electroplated tin/lead (.0003 inch minimum)
plated through holes.
Temperature:
Gold contacts: -55 to 125°
C
Tin/lead contacts: -55 to 105°
C
3.4.
Performance and Test Description
Product is designed to meet the electrical, mechanical and environmental performance requirements
specified in Figure 1. Unless otherwise specified, all tests shall be performed at ambient environmental
conditions per EIA-364.
3.5.
Test Requirements and Procedures Summary
Test Description
Requirement
Meets visual requirements.
ELECTRICAL
Procedure
EIA-364-18.
Visual inspection.
Examination of product.
Low level contact resistance.
10 milliohms maximum initial for
recessed contacts
11 milliohms maximum initial for
flush contacts.
15 milliohms maximum final.
1,000 megohms minimum.
EIA-364-23.
Subject specimens to 100
milliamperes maximum and 20
millivolts maximum open circuit
voltage.
See Figure 3.
EIA-364-21.
Test between adjacent contacts on
.100 inch centerlines.
Insulation resistance.
Temperature rise vs current.
30EC maximum temperature rise at EIA-364-70,
specified current.
Method 1.
Stabilize at a single current level
until 3 readings at 5 minute
intervals are within 1EC.
MECHANICAL
Vibration, sinusoidal.
No discontinuities of 1 microsecond EIA-364-28,
or longer duration.
Test Condition IV.
Subject mated specimens to 10-
See Note.
2000-10 Hz traversed in 20 minutes
with 1.5 mm [.06 in] maximum total
excursion or 20 G’s, whichever is
less. 4 hours in each of 3 mutually
perpendicular planes.
See Note.
EIA-364-9.
Insert and withdraw a .020 inch
diameter polished steel test pin 50
times at a maximum rate of 500
cycles per hour.
Durability.
Figure 1 (continued)
Rev B
2 of 5
108-1979
Test Description
Insertion force.
Requirement
330 grams maximum.
Procedure
EIA-364-13.
Measure the force necessary to
insert a .020 inch diameter polished
steel test pin at a maximum rate of
12.7 mm [.5 in] per minute.
EIA-364-13.
Measure force necessary to
withdraw a .016 inch diameter
polished steel test pin at a
maximum rate of 12.7 mm [.5 in]
per minute.
EIA-364-13.
Measure force necessary to push a
contact out of an .039 inch diameter
plated through hole.
Withdrawal force.
16 grams minimum.
Contact retention.
2,267 grams minimum.
ENVIRONMENTAL
Thermal shock.
See Note.
EIA-364-32, Test Condition IV.
Subject specimens to 5 cycles
between -65 and 150°
C.
EIA-364-31, Method III.
Subject specimens to 10 cycles (10
days) between 25 and 65° at 80 to
C
100% RH.
EIA-364-26, Test Condition B.
Subject specimens to a 5% salt fog
mist for 48 hours.
EIA-364-32, Test Condition VII.
Except: Subject specimens to 100
cycles between -40 and 120°
C,
dwell time and transition time shall
be 30 minutes (120 minute cycle).
Humidity-temperature cycling.
See Note.
Salt spray.
See Note.
Temperature cycling.
See Note.
NOTE
Shall meet visual requirements, show no physical damage, and meet requirements of additional
tests as specified in the Product Qualification and Requalification Test Sequence shown in Figure
2.
Figure 1 (end)
Rev B
3 of 5
108-1979
3.6.
Product Qualification and Requalification Test Sequence
Test Group (a)
Test or Examination
1
2
3
4
5
Test Sequence (b)
Examination of product
Low level contact resistance
Insulation resistance
Temperature rise vs current
Vibration
Durability
Insertion force
Withdrawal force
Contact retention
Thermal shock
Humidity-temperature cycling
Salt spray
Temperature cycling
NOTE
(a)
(b)
2
2
7
1
2
5
2
1
3
3
4,6
4
1,3
1
4
1,3
See paragraph 4.1.A.
Numbers indicate sequence in which tests are performed.
Figure 2
Rev B
4 of 5
108-1979
4.
4.1.
QUALITY ASSURANCE PROVISIONS
Qualification Testing
A.
Specimen Selection
Specimens shall be prepared in accordance with applicable Instruction Sheets and shall be
selected at random from current production. All test groups shall each consist of a minimum of 32
specimens.
B.
Test Sequence
Qualification inspection shall be verified by testing specimens as specified in Figure 2.
4.2.
Requalification Testing
If changes significantly affecting form, fit or function are made to the product or manufacturing process,
product assurance shall coordinate requalification testing, consisting of all or part of the original testing
sequence as determined by development/product, quality and reliability engineering.
4.3.
Acceptance
Acceptance is based on verification that the product meets the requirements of Figure 1. Failures
attributed to equipment, test setup or operator deficiencies shall not disqualify the product. If product
failure occurs, corrective action shall be taken and specimens resubmitted for qualification. Testing to
confirm corrective action is required before resubmittal.
4.4.
Quality Conformance Inspection
The applicable quality inspection plan shall specify the sampling acceptable quality level to be used.
Dimensional and functional requirements shall be in accordance with the applicable product drawing
and this specification.
Figure 3
Low level Contact Resistance Measurement Points
Rev B
5 of 5

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