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器件描述：EMBEDDED TEST-BUS CONTROLLERS IEEE STD 1149.1 (JTAG) TAP MASTERS WITH 8-BIT GENERIC HOST INTERFACES
器件厂商：TI [Texas Instruments]
厂商主页：http://www.ti.com/
文件大小：576.54KB
文件页数：37
PDF阅读：1L8980DWRG4.pdf (点击阅读器件资料)
摘要：
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SCBS676E ? DECEMBER 1996 ? REVISED MARCH 2004
1POST OFFICE BOX 655303 ? DALLAS, TEXAS 75265
C0068 Members of Texas Instruments (TI) Broad
Family of Testability Products Supporting
IEEE Std 1149.1-1990 (JTAG) Test Access
Port (TAP) and Boundary-Scan Architecture
C0068 Provide Built-In Access to IEEE Std 1149.1
Scan-Accessible Test/Maintenance
Facilities at Board and System Levels
C0068 While Powered at 3.3 V, the TAP Interface Is
Fully 5-V Tolerant for Mastering Both 5-V
and/or 3.3-V IEEE Std 1149.1 Targets
C0068 Simple Interface to Low-Cost 3.3-V
Microprocessors/Microcontrollers Via 8-Bit
Asynchronous Read/Write Data Bus
C0068 Easy Programming Via Scan-Level
Command Set and Smart TAP Control
C0068 Transparently Generate Protocols to
Support Multidrop TAP Configurations
Using TI’s Addressable Scan Port
C0068 Flexible TCK Generator Provides
Programmable Division, Gated-TCK, and
Free-Running-TCK Modes
C0068 Discrete TAP Control Mode Supports
Arbitrary TMS/TDI Sequences for
Noncompliant Targets
C0068 Programmable 32-Bit Test Cycle Counter
Allows Virtually Unlimited Scan/Test Length
C0068 Accommodate Target Retiming (Pipeline)
Delays of Up To 15 TCK Cycles
C0068 Test Output Enable (TOE) Allows for
External Control of TAP Signals
C0068 High-Drive Outputs (?32-mA I
OH
, 64-mA I
OL
)
at TAP Support Backplane Interface and/or
High Fanout
C0068 Package Options Include Plastic
Small-Outline (DW) Package, Ceramic Chip
Carriers (FK), and Ceramic 300-mil DIPs (JT)
description
The ’LVT8980 embedded test-bus controllers (eTBC) are members of the TI broad family of testability integrated
circuits. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex
circuit assemblies. Unlike most other devices of this family, the eTBC is not a boundary-scannable device;
rather, its function is to master an IEEE Std 1149.1 (JTAG) test access port (TAP) under the command of an
embedded host microprocessor/microcontroller. Thus, the eTBC enables the practical and effective use of the
IEEE Std 1149.1 test-access infrastructure to support embedded/built-in test, emulation, and
configuration/maintenance facilities at board and system levels.
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SN54LVT8980 ...JT PACKAGE
SN74LVT8980 . . . DW PACKAGE
(TOP VIEW)
5
6
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8
9
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25
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4 3 2 128
RDY
TDO
V
CC
NC
TCK
TMS
TRST
D1
D2
D3
NC
GND
D4
D5
SN54LVT8980 . . . FK PACKAGE
(TOP VIEW)
D0 R/W STRB
TO
E
RST
D7
CLKIN
NC
NC A1 A2A0
D6
TDI
27 26
STRB
R/W
D0
D1
D2
D3
GND
D4
D5
D6
D7
CLKIN
A0
A1
A2
RDY
TDO
V
CC
TCK
TMS
TRST
TDI
RST
TOE
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5
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NC ? No internal connection
Copyright ? 2004, Texas Instruments Incorporated
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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
相关器件：SN54LVT8980 SN54LVT8980_06 SN74LVT8980DWR SN74LVT8980DW SN74LVT8980
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